Special Issue on Diverse Helium Ion Microscopy

Special Issue on Diverse Helium Ion Microscopy PDF Author: David C. Bell
Publisher:
ISBN:
Category :
Languages : en
Pages : 55

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Special Issue on Diverse Helium Ion Microscopy

Special Issue on Diverse Helium Ion Microscopy PDF Author: David C. Bell
Publisher:
ISBN:
Category :
Languages : en
Pages : 55

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Helium Ion Microscopy

Helium Ion Microscopy PDF Author: David C. Joy
Publisher: Springer Science & Business Media
ISBN: 1461486602
Category : Technology & Engineering
Languages : en
Pages : 63

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Book Description
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive database of iSE yields for many elements and compounds as a function of incident ion species and its energy is included. Beam damage and charging are frequently outcomes of ion beam irradiation, and techniques to minimize such problems are presented. In addition to imaging, ions beams can be used for the controlled deposition, or removal, of selected materials with nanometer precision. The techniques and conditions required for nanofabrication are discussed and demonstrated. Finally, the problem of performing chemical microanalysis with ion beams is considered. Low energy ions cannot generate X-ray emissions, so alternative techniques such as Rutherford Backscatter Imaging (RBI) or Secondary Ion Mass Spectrometry (SIMS) are examined.

Helium Ion Microscopy

Helium Ion Microscopy PDF Author: Gregor Hlawacek
Publisher: Springer
ISBN: 3319419900
Category : Science
Languages : en
Pages : 536

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Book Description
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.

Radiation Damage in Materials

Radiation Damage in Materials PDF Author: Yongqiang Wang
Publisher: MDPI
ISBN: 303936362X
Category : Science
Languages : en
Pages : 196

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Book Description
The complexity of radiation damage effects in materials that are used in various irradiation environments stems from the fundamental particle–solid interactions and the subsequent damage recovery dynamics after the collision cascades, which involves multiple length and time scales. Adding to this complexity are the transmuted impurities that are unavoidable from accompanying nuclear processes. Helium is one such impurity that plays an important and unique role in controlling the microstructure and properties of materials used in fast fission reactors, plasma-facing and structural materials in fusion devices, spallation neutron target designs, actinides, tritium-containing materials, and nuclear waste. Their ultra-low solubility in virtually all solids forces He atoms to self-precipitate into small bubbles that become nucleation sites for further void growth under radiation-induced vacancy supersaturations, resulting in material swelling and high-temperature He embrittlement, as well as surface blistering under low-energy and high-flux He bombardment. This Special Issue, “Radiation Damage in Materials—Helium Effects”, contains review articles and full-length papers on new irradiation material research activities and novel material ideas using experimental and/or modeling approaches. These studies elucidate the interactions of helium with various extreme environments and tailored nanostructures, as well as their impact on microstructural evolution and material properties.

NBS Special Publication

NBS Special Publication PDF Author:
Publisher:
ISBN:
Category : Low temperatures
Languages : en
Pages : 668

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Special Issue Ions and Atoms in Superfluid Helium

Special Issue Ions and Atoms in Superfluid Helium PDF Author: Harald Günther
Publisher:
ISBN:
Category :
Languages : en
Pages : 5

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Issues in Extreme Conditions Technology Research and Application: 2011 Edition

Issues in Extreme Conditions Technology Research and Application: 2011 Edition PDF Author:
Publisher: ScholarlyEditions
ISBN: 1464965692
Category : Technology & Engineering
Languages : en
Pages : 1038

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Book Description
Issues in Extreme Conditions Technology Research and Application: 2011 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Extreme Conditions Technology Research and Application. The editors have built Issues in Extreme Conditions Technology Research and Application: 2011 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Extreme Conditions Technology Research and Application in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Extreme Conditions Technology Research and Application: 2011 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

Special Issue: Digital Optical Microscopy

Special Issue: Digital Optical Microscopy PDF Author: Anne Sentenac
Publisher:
ISBN:
Category :
Languages : en
Pages : 141

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Noble Gases: Advances in Research and Application: 2011 Edition

Noble Gases: Advances in Research and Application: 2011 Edition PDF Author:
Publisher: ScholarlyEditions
ISBN: 1464924619
Category : Science
Languages : en
Pages : 189

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Book Description
Noble Gases: Advances in Research and Application: 2011 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Noble Gases. The editors have built Noble Gases: Advances in Research and Application: 2011 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Noble Gases in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Noble Gases: Advances in Research and Application: 2011 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

Physics Briefs

Physics Briefs PDF Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 1358

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Book Description