Author: S. J. B. Reed
Publisher: Cambridge University Press
ISBN: 113944638X
Category : Science
Languages : en
Pages : 232
Book Description
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Author: S. J. B. Reed
Publisher: Cambridge University Press
ISBN: 113944638X
Category : Science
Languages : en
Pages : 232
Book Description
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Publisher: Cambridge University Press
ISBN: 113944638X
Category : Science
Languages : en
Pages : 232
Book Description
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Energy Dispersive Spectrometry of Common Rock Forming Minerals
Author: Kenneth P. Severin
Publisher: Springer Science & Business Media
ISBN: 1402028415
Category : Science
Languages : en
Pages : 228
Book Description
This book provides a very basic introduction to electron microscopy and energy dispersive spectrometry (EDS). It has the largest compiled collection of EDS spectra ever published and covers most common rock forming minerals. In addition, it provides a key to help the novice wade through the large number of spectra.
Publisher: Springer Science & Business Media
ISBN: 1402028415
Category : Science
Languages : en
Pages : 228
Book Description
This book provides a very basic introduction to electron microscopy and energy dispersive spectrometry (EDS). It has the largest compiled collection of EDS spectra ever published and covers most common rock forming minerals. In addition, it provides a key to help the novice wade through the large number of spectra.
A Beginners' Guide to Scanning Electron Microscopy
Author: Anwar Ul-Hamid
Publisher: Springer
ISBN: 3319984829
Category : Technology & Engineering
Languages : en
Pages : 422
Book Description
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Publisher: Springer
ISBN: 3319984829
Category : Technology & Engineering
Languages : en
Pages : 422
Book Description
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Electron Microscopy in Mineralogy
Author: P.E. Champness
Publisher: Springer Science & Business Media
ISBN: 3642661963
Category : Science
Languages : en
Pages : 574
Book Description
During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.
Publisher: Springer Science & Business Media
ISBN: 3642661963
Category : Science
Languages : en
Pages : 574
Book Description
During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
Author: David H. Krinsley
Publisher: Cambridge University Press
ISBN: 9780521019743
Category : Science
Languages : en
Pages : 204
Book Description
Backscattered scanning electron microscopy (BSE) reveals the minerals, textures, and fabrics of sediments and rocks in much greater detail than is possible with conventional optical microscopy. Backscattered Scanning Electron Microscopy provides a concise summary of the BSE technique. This comprehensive guide uses abundant images to illustrate the type of information BSE yields and the application of the technique to the study of sediments and sedimentary rocks. The authors review the use of this petrographic technique on all the major sedimentary rock types, including sediment grains, sandstones, shales, carbonate rocks, rock varnish, and glauconite. They also describe image analysis techniques that allow quantification of backscattered scanning electron microscope images. Heavily illustrated and lucidly written, this book will provide researchers and graduate students with the most current research on this important geological tool.
Publisher: Cambridge University Press
ISBN: 9780521019743
Category : Science
Languages : en
Pages : 204
Book Description
Backscattered scanning electron microscopy (BSE) reveals the minerals, textures, and fabrics of sediments and rocks in much greater detail than is possible with conventional optical microscopy. Backscattered Scanning Electron Microscopy provides a concise summary of the BSE technique. This comprehensive guide uses abundant images to illustrate the type of information BSE yields and the application of the technique to the study of sediments and sedimentary rocks. The authors review the use of this petrographic technique on all the major sedimentary rock types, including sediment grains, sandstones, shales, carbonate rocks, rock varnish, and glauconite. They also describe image analysis techniques that allow quantification of backscattered scanning electron microscope images. Heavily illustrated and lucidly written, this book will provide researchers and graduate students with the most current research on this important geological tool.
SEM Petrology Atlas
Author: Joann E. Welton
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 272
Book Description
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 272
Book Description
Dead Sea Transform Fault System: Reviews
Author: Zvi Garfunkel
Publisher: Springer
ISBN: 9401788723
Category : Science
Languages : en
Pages : 365
Book Description
The Dead Sea transform is an active plate boundary connecting the Red Sea seafloor spreading system to the Arabian-Eurasian continental collision zone. Its geology and geophysics provide a natural laboratory for investigation of the surficial, crustal and mantle processes occurring along transtensional and transpressional transform fault domains on a lithospheric scale and related to continental breakup. There have been many detailed and disciplinary studies of the Dead Sea transform fault zone during the last 20 years and this book brings them together. This book is an updated comprehensive coverage of the knowledge, based on recent studies of the tectonics, structure, geophysics, volcanism, active tectonics, sedimentology and paleo and modern climate of the Dead Sea transform fault zone. It puts together all this new information and knowledge in a coherent fashion.
Publisher: Springer
ISBN: 9401788723
Category : Science
Languages : en
Pages : 365
Book Description
The Dead Sea transform is an active plate boundary connecting the Red Sea seafloor spreading system to the Arabian-Eurasian continental collision zone. Its geology and geophysics provide a natural laboratory for investigation of the surficial, crustal and mantle processes occurring along transtensional and transpressional transform fault domains on a lithospheric scale and related to continental breakup. There have been many detailed and disciplinary studies of the Dead Sea transform fault zone during the last 20 years and this book brings them together. This book is an updated comprehensive coverage of the knowledge, based on recent studies of the tectonics, structure, geophysics, volcanism, active tectonics, sedimentology and paleo and modern climate of the Dead Sea transform fault zone. It puts together all this new information and knowledge in a coherent fashion.
High-Resolution Electron Microscopy
Author: John C. H. Spence
Publisher: Oxford University Press
ISBN: 0199552754
Category : Science
Languages : en
Pages : 425
Book Description
This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.
Publisher: Oxford University Press
ISBN: 0199552754
Category : Science
Languages : en
Pages : 425
Book Description
This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.
Scanning Electron Microscopy and X-Ray Microanalysis
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Microstructural Geochronology
Author: Desmond E. Moser
Publisher: John Wiley & Sons
ISBN: 1119227240
Category : Science
Languages : en
Pages : 347
Book Description
Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive parent and daughter atoms themselves, to generate a microstructural geochronology from some of the most resilient materials in the solar system. First compilation of research focusing on the crystal structure, material properties, and chemical zoning of the geochronology mineral archive down to nanoscale Novel comparisons of mineral time archives from different rocky planets and asteroids and their shock metamorphic histories Fundamentals on how to reconstruct and date radiogenic isotope distributions using atom probe tomography Microstructural Geochronology will be a valuable resource for graduate students, academics, and researchers in the fields of petrology, geochronology, mineralogy, geochemistry, planetary geology, astrobiology, chemistry, and material science. It will also appeal to philosophers and historians of science from other disciplines.
Publisher: John Wiley & Sons
ISBN: 1119227240
Category : Science
Languages : en
Pages : 347
Book Description
Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive parent and daughter atoms themselves, to generate a microstructural geochronology from some of the most resilient materials in the solar system. First compilation of research focusing on the crystal structure, material properties, and chemical zoning of the geochronology mineral archive down to nanoscale Novel comparisons of mineral time archives from different rocky planets and asteroids and their shock metamorphic histories Fundamentals on how to reconstruct and date radiogenic isotope distributions using atom probe tomography Microstructural Geochronology will be a valuable resource for graduate students, academics, and researchers in the fields of petrology, geochronology, mineralogy, geochemistry, planetary geology, astrobiology, chemistry, and material science. It will also appeal to philosophers and historians of science from other disciplines.