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Author: Raimund Ubar
Publisher: Birkhäuser
ISBN: 9783031447334
Category : Computers
Languages : en
Pages : 0
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Book Description
This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research. The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems. Topics and features: Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs Provides numerous working examples that illustrate the key points of the text Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses. Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.
Author: Raimund Ubar
Publisher: Birkhäuser
ISBN: 9783031447334
Category : Computers
Languages : en
Pages : 0
Get Book Here
Book Description
This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research. The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems. Topics and features: Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs Provides numerous working examples that illustrate the key points of the text Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses. Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.
Author: Svetlana N. Yanushkevich
Publisher: CRC Press
ISBN: 1420037587
Category : Technology & Engineering
Languages : en
Pages : 952
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Book Description
Decision diagram (DD) techniques are very popular in the electronic design automation (EDA) of integrated circuits, and for good reason. They can accurately simulate logic design, can show where to make reductions in complexity, and can be easily modified to model different scenarios. Presenting DD techniques from an applied perspective, Decision Diagram Techniques for Micro- and Nanoelectronic Design Handbook provides a comprehensive, up-to-date collection of DD techniques. Experts with more than forty years of combined experience in both industrial and academic settings demonstrate how to apply the techniques to full advantage with more than 400 examples and illustrations. Beginning with the fundamental theory, data structures, and logic underlying DD techniques, they explore a breadth of topics from arithmetic and word-level representations to spectral techniques and event-driven analysis. The book also includes abundant references to more detailed information and additional applications. Decision Diagram Techniques for Micro- and Nanoelectronic Design Handbook collects the theory, methods, and practical knowledge necessary to design more advanced circuits and places it at your fingertips in a single, concise reference.
Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022
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Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 550
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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author: Matteo Sonza Reorda
Publisher: Springer Science & Business Media
ISBN: 1846281458
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Author: Luca Gaetano Amaru
Publisher: Springer
ISBN: 3319431749
Category : Technology & Engineering
Languages : en
Pages : 162
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Book Description
This book introduces new logic primitives for electronic design automation tools. The author approaches fundamental EDA problems from a different, unconventional perspective, in order to demonstrate the key role of rethinking EDA solutions in overcoming technological limitations of present and future technologies. The author discusses techniques that improve the efficiency of logic representation, manipulation and optimization tasks by taking advantage of majority and biconditional logic primitives. Readers will be enabled to accelerate formal methods by studying core properties of logic circuits and developing new frameworks for logic reasoning engines.
Author: Management Association, Information Resources
Publisher: IGI Global
ISBN: 1466620390
Category : Technology & Engineering
Languages : en
Pages : 2281
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Book Description
Developments in technologies have evolved in a much wider use of technology throughout science, government, and business; resulting in the expansion of geographic information systems. GIS is the academic study and practice of presenting geographical data through a system designed to capture, store, analyze, and manage geographic information. Geographic Information Systems: Concepts, Methodologies, Tools, and Applications is a collection of knowledge on the latest advancements and research of geographic information systems. This book aims to be useful for academics and practitioners involved in geographical data.
Author: Jon T. Butler
Publisher: Springer Nature
ISBN: 3031798708
Category : Technology & Engineering
Languages : en
Pages : 106
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Book Description
A zero-suppressed decision diagram (ZDD) is a data structure to represent objects that typically contain many zeros. Applications include combinatorial problems, such as graphs, circuits, faults, and data mining. This book consists of four chapters on the applications of ZDDs. The first chapter by Alan Mishchenko introduces the ZDD. It compares ZDDs to BDDs, showing why a more compact representation is usually achieved in a ZDD. The focus is on sets of subsets and on sum-of-products (SOP) expressions. Methods to generate all the prime implicants (PIs), and to generate irredundant SOPs are shown. A list of papers on the applications of ZDDs is also presented. In the appendix, ZDD procedures in the CUDD package are described. The second chapter by Tsutomu Sasao shows methods to generate PIs and irredundant SOPs using a divide and conquer method. This chapter helps the reader to understand the methods presented in the first chapter. The third chapter by Shin-Ichi Minato introduces the ""frontier-based"" method that efficiently enumerates certain subsets of a graph. The final chapter by Shinobu Nagayama shows a method to match strings of characters. This is important in routers, for example, where one must match the address information of an internet packet to the proprer output port. It shows that ZDDs are more compact than BDDs in solving this important problem. Each chapter contains exercises, and the appendix contains their solutions. Table of Contents: Preface / Acknowledgments / Introduction to Zero-Suppressed Decision Diagrams / Efficient Generation of Prime Implicants and Irredundant Sum-of-Products Expressions / The Power of Enumeration--BDD/ZDD-Based Algorithms for Tackling Combinatorial Explosion / Regular Expression Matching Using Zero-Suppressed Decision Diagrams / Authors' and Editors' Biographies / Index
Author: Vlad P. Shmerko
Publisher: CRC Press
ISBN: 1420066234
Category : Technology & Engineering
Languages : en
Pages : 780
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Book Description
Emphasizes the Basic Principles of Computational Arithmetic and Computational Structure Design Taking an interdisciplinary approach to the nanoscale generation of computer devices and systems, Computer Arithmetics for Nanoelectronics develops a consensus between computational properties provided by data structures and phenomenological properties of nano and molecular technology. Covers All Stages of the Design Cycle, from Task Formulation to Molecular-Based Implementation The book introduces the theoretical base and properties of various data structures, along with techniques for their manipulation, optimization, and implementation. It also assigns the computational properties of logic design data structures to 3D structures, furnishes information-theoretical measures and design aspects, and discusses the testability problem. The last chapter presents a nanoscale prospect for natural computing based on assorted computing paradigms from nature. Balanced Coverage of State-of-the-Art Concepts, Techniques, and Practices Up-to-date, comprehensive, and pragmatic in its approach, this text provides a unified overview of the relationship between the fundamentals of digital system design, computer architectures, and micro- and nanoelectronics.
Author: Vassilis Paliouras
Publisher: Springer
ISBN: 3540320806
Category : Computers
Languages : en
Pages : 767
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Book Description
Welcome to the proceedings of PATMOS 2005, the 15th in a series of international workshops.PATMOS2005wasorganizedbyIMECwithtechnicalco-sponsorshipfrom the IEEE Circuits and Systems Society. Over the years, PATMOS has evolved into an important European event, where - searchers from both industry and academia discuss and investigate the emerging ch- lenges in future and contemporary applications, design methodologies, and tools - quired for the developmentof upcominggenerationsof integrated circuits and systems. The technical program of PATMOS 2005 contained state-of-the-art technical contri- tions, three invited talks, a special session on hearing-aid design, and an embedded - torial. The technical program focused on timing, performance and power consumption, as well as architectural aspects with particular emphasis on modeling, design, char- terization, analysis and optimization in the nanometer era. The Technical Program Committee, with the assistance of additional expert revi- ers, selected the 74 papers to be presented at PATMOS. The papers were divided into 11 technical sessions and 3 poster sessions. As is always the case with the PATMOS workshops, the review process was anonymous, full papers were required, and several reviews were carried out per paper. Beyond the presentations of the papers, the PATMOS technical program was - riched by a series of speeches offered by world class experts, on important emerging research issues of industrial relevance. Prof. Jan Rabaey, Berkeley, USA, gave a talk on “Traveling the Wild Frontier of Ulta Low-Power Design”, Dr. Sung Bae Park, S- sung, gave a presentation on “DVL (Deep Low Voltage): Circuits and Devices”, Prof.
