Spectral and Total Emissivity PDF Download
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Author: Maynard P. Bauleke
Publisher:
ISBN:
Category : Emission spectroscopy
Languages : en
Pages : 44
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Book Description
Author: Maynard P. Bauleke
Publisher:
ISBN:
Category : Emission spectroscopy
Languages : en
Pages : 44
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Book Description
Author: Clyde C. Shaw
Publisher:
ISBN:
Category : Scientific apparatus and instruments
Languages : en
Pages : 1
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Book Description
Three methods of measuring the normal spectral, total normal and total hemispherical emissivity of opaque solid materials are described. Spectral emissivity measurements are performed at approximately ambient temperature and encompass the wavelength interval .4 to 25 microns. Total hemispherical emissivity measurements cover the temperature range 0 C to 600 C. Results of the emissivity measurements, of various materials, as performed with each of the systems, are presented. (Author).
Author: R. L. Seifert
Publisher:
ISBN:
Category : Beryllium oxide
Languages : en
Pages : 32
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 89
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Book Description
The emissometer is an extension of the multiproperty apparatus which is a powerful and unique tool for simultaneously measuring ten thermophysical properties on the same sample of an electrically-conducting solid and of studying its behavior under various environmental conditions. The apparatus features rapid time-to-temperature and data acquisition under minicomputer control yielding state-of-the-art accuracy. Performance evaluation tests of the emissometer are presented. These tests deal with veiling glare, blackbody cavity quality, and temperature distribution in the heating tube and sample. In addition spectral emissivity measurements to at least 10 micrometers have been made on tantalum (reference material), SiC, Si3N4, graphite and carbon-carbon composites from 1500 to 2400 K or their respective degradation temperatures. The new data on the ceramics provides some understanding on their high temperature behavior including the effect of fabrication process and impurities.
Author: Robert Siegel
Publisher:
ISBN:
Category : Heat
Languages : en
Pages : 210
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Book Description
Author: Jerry D. Plunkett
Publisher:
ISBN:
Category :
Languages : en
Pages : 472
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Book Description
Author: Gordon Wilbert Autio
Publisher:
ISBN:
Category : Anisotropy
Languages : en
Pages : 306
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Book Description
Author: George Kimball Burgess
Publisher:
ISBN:
Category : Emissivity
Languages : en
Pages : 24
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Book Description
Author: Louis Possner
Publisher:
ISBN:
Category : Radiometers
Languages : en
Pages : 68
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Book Description
Author: N.M. Ravindra
Publisher: Morgan & Claypool Publishers
ISBN: 1681741768
Category : Science
Languages : en
Pages : 160
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Book Description
Optical properties, particularly in the infrared range of wavelengths, continue to be of enormous interest to both material scientists and device engineers. The need for the development of standards for data of optical properties in the infrared range of wavelengths is very timely considering the on-going transition of nano-technology from fundamental R&D to manufacturing. Radiative properties play a critical role in the processing, process control and manufacturing of semiconductor materials, devices, circuits and systems. The design and implementation of real-time process control methods in manufacturing requires the knowledge of the radiative properties of materials. Sensors and imagers operate on the basis of the radiative properties of materials. This book reviews the optical properties of various semiconductors in the infrared range of wavelengths. Theoretical and experimental studies of the radiative properties of semiconductors are presented. Previous studies, potential applications and future developments are outlined. In Chapter 1, an introduction to the radiative properties is presented. Examples of instrumentation for measurements of the radiative properties is described in Chapter 2. In Chapters 3-11, case studies of the radiative properties of several semiconductors are elucidated. The modeling and applications of these properties are explained in Chapters 12 and 13, respectively. In Chapter 14, examples of the global infrastructure for these measurements are illustrated.
