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Author: Alfred Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642827241
Category : Science
Languages : en
Pages : 578
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Book Description
This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
Author: Alfred Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642827241
Category : Science
Languages : en
Pages : 578
Get Book Here
Book Description
This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
Author: Lucille A. Giannuzzi
Publisher: Springer Science & Business Media
ISBN: 038723313X
Category : Science
Languages : en
Pages : 362
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Book Description
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Author: J. C. Vickerman
Publisher: IM Publications
ISBN: 1906715173
Category : Mass spectrometry
Languages : en
Pages : 742
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Book Description
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Author: Freddy Adams
Publisher: Elsevier
ISBN: 0444634509
Category : Science
Languages : en
Pages : 493
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Book Description
Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed – or adapted from existing techniques – and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques. - Provides comprehensive coverage of analytical techniques used in chemical imaging analysis - Explores a variety of specialized techniques - Provides a general overview of imaging techniques in diverse fields
Author: Sarah Fearn
Publisher: Morgan & Claypool Publishers
ISBN: 1681740885
Category : Technology & Engineering
Languages : en
Pages : 67
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Book Description
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Author: K. L. Mittal
Publisher: John Wiley & Sons
ISBN: 1119654823
Category : Technology & Engineering
Languages : en
Pages : 720
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Book Description
Activity in the arena of surface chemistry and adhesion aspects in cosmetics is substantial, but the information is scattered in many diverse publications media and no book exists which discusses surface chemistry and adhesion in cosmetics in unified manner. This book containing 15 chapters written by eminent researchers from academia and industry is divided into three parts: Part 1: General Topics; Part 2: Surface Chemistry Aspects; and Part 3: Wetting and Adhesion Aspects. The topics covered include: Lip biophysical properties and characterization; use of advanced silicone materials in long-lasting cosmetics; non-aqueous dispersions of acrylate copolymers in lipsticks; cosmetic oils in Lipstick structure; chemical structure of the hair surface, surface forces and interactions; AFM for hair surface characterization; application of AFM in characterizing hair, skin and cosmetic deposition; SIMS as a surface analysis method for hair, skin and cosmetics; surface tensiometry approach to characterize cosmetic products; spreading of hairsprays on hair; color transfer from long-wear face foundation products; interaction of polyelectrolytes and surfactants on hair surfaces; cosmetic adhesion to facial skin; and adhesion aspects in semi-permanent mascara; lipstick adhesion measurement.
Author: Daniele Benoit
Publisher: Springer Science & Business Media
ISBN: 9783211828748
Category : Science
Languages : en
Pages : 670
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Book Description
The European Microanalysis Society held its Fourth Workshop in Saint Malo in May 1995. This volume includes the revised presentations, 10 tutorial chapters and 50 brief articles, from leading experts in electron probe microanalysis, secondary mass spectroscopy, analytical electron microscopy, and related fields.
Author: A. Benninghoven
Publisher: John Wiley & Sons
ISBN: 9780471918325
Category : Science
Languages : en
Pages : 1118
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Book Description
The SIMS conference is recognized worldwide as a distinguished forum for those involved in the study and use of SIMS techniques, bringing together scientists working in fundamental research and instrument development, researchers using the SIMS method of analysis, service companies and instrument manufacturers.
Author: Michael F. L'Annunziata
Publisher: Elsevier
ISBN: 0323137881
Category : Science
Languages : en
Pages : 810
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Book Description
Handbook of Radioactivity Analysis is written by experts in the measurement of radioactivity. The book describes the broad scope of analytical methods available and instructs the reader on how to select the proper technique. It is intended as a practical manual for research which requires the accurate measurement of radioactivity at all levels, from the low levels encountered in the environment to the high levels measured in radioisotope research. This book contains sample preparation procedures, recommendations on steps to follow, necessary calculations, computer controlled analysis, and high sample throughput techniques. Each chapter includes practical techniques for application to nuclear safety, nuclear safeguards, environmental analysis, weapons disarmament, and assays required for research in biomedicine and agriculture. The fundamentals of radioactivity properties, radionuclide decay, and methods of detection are included to provide the basis for a thorough understanding of the analytical procedures described in the book. Therefore, the Handbook can also be used as a teaching text. - Includes sample preparation techniques for matrices such as soil, air, plant, water, animal tissue, and surface swipes - Provides procedures and guidelines for the analysis of commonly encountered na
Author: D.C. Creagh
Publisher: Elsevier
ISBN: 0080540198
Category : Social Science
Languages : en
Pages : 519
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Book Description
/inca/publications/misc/creaghcov.htmAbout the coverThis book contains twenty chapters covering a wide range of research in the fields of scientific conservation of art and archaeometry. The common thread is the use of radiation in these analyses. The term "radiation" is used in the widest possible sense. The book encompasses the use of electromagnetic radiation in its microwave, infrared, visible, ultraviolet, x ray and &ggr; ray forms and the use of particulate forms such as electrons, neutrons and charged particles for which the Planck's Law relation applies. In many cases there is an interplay between the two forms: for example, proton induced x ray emission (PIXE), secondary ion mass spectrometry (SIMS). As far as possible the chapters have been arranged in order of ascending particle energy. Thus it commences with the use of microwaves and finishes with the use of &ggr; rays. The authors were chosen on the basis of their expertise as practitioners of their particular field of study. This means that, for example, the mature fields of study such as the IR and UV study of paintings have been written by senior researchers, whereas for the emerging fields of synchrotron and neutron techniques the chapters have been written by talented researchers at the commencement of their careers.
