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Author:
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ISBN: 9789082276909
Category :
Languages : en
Pages : 0
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Book Description
Author:
Publisher:
ISBN: 9789082276909
Category :
Languages : en
Pages : 0
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Book Description
Author: K.F.J. Heinrich
Publisher: Springer Science & Business Media
ISBN: 1489926178
Category : Science
Languages : en
Pages : 397
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Book Description
In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Author: Frédéric Christien
Publisher:
ISBN:
Category : Technology
Languages : en
Pages :
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Book Description
The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science.
Author: Lawrence Kobren
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 36
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Book Description
The electron probe microanalyzer, a versatile tool for the analysis of areas as small as one micron in diameter, has been used at Goddard Space Flight Center in applications ranging from materials research to analysis of failures in mechanical parts. Methods of using the probe and representative results obtained are illustrated by several examples that include bonding of thermoelectric materials, alloy development, and analysis of materials failure.
Author: Daniele Benoit
Publisher: Springer Science & Business Media
ISBN: 3709165555
Category : Science
Languages : en
Pages : 628
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Book Description
The European Microanalysis Society held its Fourth Workshop in Saint Malo in May 1995. This volume includes the revised presentations, 10 tutorial chapters and 50 brief articles, from leading experts in electron probe microanalysis, secondary mass spectroscopy, analytical electron microscopy, and related fields.
Author: Karl Zierold
Publisher: Springer Science & Business Media
ISBN: 364274477X
Category : Science
Languages : en
Pages : 331
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Book Description
The aim of electron probe microanalysis of biological systems is to identify, localize, and quantify elements, mass, and water in cells and tissues. The method is based on the idea that all electrons and photons emerging from an electron beam irradiated specimen contain information on its structure and composition. In particular, energy spectroscopy of X-rays and electrons after interaction of the electron beam with the specimen is used for this purpose. However, the application of this method in biology and medicine has to overcome three specific problems: 1. The principle constituent of most cell samples is water. Since liquid water is not compatible with vacuum conditions in the electron microscope, specimens have to be prepared without disturbing the other components, in parti cular diffusible ions (elements). 2. Electron probe microanaly sis provides physical data on either dry specimens or fully hydrated, frozen specimens. This data usually has to be con verted into quantitative data meaningful to the cell biologist or physiologist. 3. Cells and tissues are not static but dynamic systems. Thus, for example, microanalysis of physiolo gical processes requires sampling techniques which are adapted to address specific biological or medical questions. During recent years, remarkable progress has been made to overcome these problems. Cryopreparation, image analysis, and electron energy loss spectroscopy are key areas which have solved some problems and offer promise for future improvements.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
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Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: A. J. Tousimis
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 472
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Book Description
Author: Kurt F. J. Heinrich
Publisher:
ISBN:
Category : Analytical chemistry
Languages : en
Pages : 24
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Book Description
Although the foundations for a procedure of data reduction in quantitative electron probe analysis have not been changed for several years, there has been progress in the choice of expressions, parameters, and constants. A brief account of recommended expressions and procedures is given. Reference is made to the Standard Reference Materials of Au-Ag and Au-Cu alloys issued for electron probe microanalysis.These are especially useful for investigating the application of correction procedures.
Author: A. J. Tousimis
Publisher: Elsevier
ISBN: 1483284638
Category : Science
Languages : en
Pages : 463
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Book Description
Electron Probe Microanalysis presents a collection of reviews on various aspects of electron probe microanalysis. This book discusses the model for quantitative electron probe analysis. Organized into 14 chapters, this book begins with an overview of the various kinds of microanalysis followed by a discussion of the advantages that can be derived from using the electron probe method. This text then examines the various applications of backscattered electron and specimen current methods for quantitative analysis. Other chapters consider the fundamental concepts for quantitative electron probe microanalysis utilizing pure elements as standards. This book discusses as well the absolute method of quantitative chemical analysis by emission X-ray spectroscopy. The final chapter deals with the main advantage of the Kossel technique in the study of the thermodynamic and mechanical characteristics of crystals. This book is a valuable resource for scientists and research workers. Non-specialists who need information on this excellent analytical tool will also find this book useful.
