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Author:
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 836
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Book Description
Author:
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 836
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Book Description
Author:
Publisher: Academic Press
ISBN: 0123813174
Category : Technology & Engineering
Languages : en
Pages : 299
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
Author: Zhigang Li
Publisher: CRC Press
ISBN: 0824745760
Category : Science
Languages : en
Pages : 640
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Book Description
Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.
Author: Jens Rittscher
Publisher: Artech House
ISBN: 1596932376
Category : Medical
Languages : en
Pages : 533
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Book Description
Here's a first-of-its-kind book that bridges the gap between biomedical imaging and the bioscience community. This unique resource gives you a detailed understanding of imaging platforms, fluorescence imaging, and fundamental image processing algorithms. Further, it guides you through application of advanced image analysis methods and techniques to specific biological problems. The book presents applications that span a wide range of scales, from the detection of signaling events in sub-cellular structures, to the automated analysis of tissue structures. Other critical areas discussed include the dynamics of cell populations and in vivo microscopy. This cutting-edge volume is supported with over 160 illustrations that support key topics throughout the book. CD-ROM Included! Contains full-color images and videos that further illustrate topics discussed in the book.
Author: Ludwig Reimer
Publisher: Springer Science & Business Media
ISBN: 0387400931
Category : Science
Languages : en
Pages : 602
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Book Description
The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
Author: L. M. Peng
Publisher: Oxford University Press
ISBN: 0191004782
Category : Science
Languages : en
Pages : 558
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Book Description
This book provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.
Author:
Publisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 976
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Book Description
Author: Sidney Ray
Publisher: CRC Press
ISBN: 1136094385
Category : Photography
Languages : en
Pages : 559
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Book Description
WINNER OF THE 2001 KRASZNA-KRAUSZ PHOTOGRAPHY BOOK AWARD (Technical Photography category) The only definitive book to fully encompass the use of photography and imaging as tools in science, technology and medicine. It describes in one single volume the basic theory, techniques, materials, special equipment and applications for a wide variety of uses of photography, including: close up photography and photomacrography to spectral recording, surveillance systems, radiography and micro-imaging. This extensively illustrated photography 'bible' contains all the information you need, whether you are a scientist wishing to use photography for a specialist application, a professional needing to extend technical expertise, or a student wanting to broaden your knowledge of the applications of photography. The contents are arranged in three sections: · General Section, detailing the elements of the image capture process · Major Applications, describing the major applications of imaging · Specialist Applications, presenting an eclectic selection of more specialised but increasingly important applications Each subject is introduced with an outline of its development and contemporary importance, followed by explanations of essential theory and an overview of techniques and equipment. Mathematics is only used where necessary. Numerous applications and case studies are described. Comprehensive bibliographies and references are provided for further study.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 804
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Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: Jeffrey P. Simmons
Publisher: CRC Press
ISBN: 1498738214
Category : Science
Languages : en
Pages : 537
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Book Description
Data analytics has become an integral part of materials science. This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling. Additionally, the analysis and applications section addresses compressed sensing methods, stochastic models, extreme estimation, and approaches to pattern detection.
