Design Sensitivity Analysis and Optimization of Electromagnetic Systems

Design Sensitivity Analysis and Optimization of Electromagnetic Systems PDF Author: Il Han Park
Publisher: Springer
ISBN: 9811302308
Category : Technology & Engineering
Languages : en
Pages : 376

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Book Description
This book presents a comprehensive introduction to design sensitivity analysis theory as applied to electromagnetic systems. It treats the subject in a unified manner, providing numerical methods and design examples. The specific focus is on continuum design sensitivity analysis, which offers significant advantages over discrete design sensitivity methods. Continuum design sensitivity formulas are derived from the material derivative in continuum mechanics and the variational form of the governing equation. Continuum sensitivity analysis is applied to Maxwell equations of electrostatic, magnetostatic and eddy-current systems, and then the sensitivity formulas for each system are derived in a closed form; an integration along the design interface. The book also introduces the recent breakthrough of the topology optimization method, which is accomplished by coupling the level set method and continuum design sensitivity. This topology optimization method enhances the possibility of the global minimum with minimised computational time, and in addition the evolving shapes during the iterative design process are easily captured in the level set equation. Moreover, since the optimization algorithm is transformed into a well-known transient analysis algorithm for differential equations, its numerical implementation becomes very simple and convenient. Despite the complex derivation processes and mathematical expressions, the obtained sensitivity formulas are very straightforward for numerical implementation. This book provides detailed explanation of the background theory and the derivation process, which will help readers understand the design method and will set the foundation for advanced research in the future.

Design Sensitivity Analysis and Optimization of Electromagnetic Systems

Design Sensitivity Analysis and Optimization of Electromagnetic Systems PDF Author: Il Han Park
Publisher: Springer
ISBN: 9811302308
Category : Technology & Engineering
Languages : en
Pages : 376

Get Book Here

Book Description
This book presents a comprehensive introduction to design sensitivity analysis theory as applied to electromagnetic systems. It treats the subject in a unified manner, providing numerical methods and design examples. The specific focus is on continuum design sensitivity analysis, which offers significant advantages over discrete design sensitivity methods. Continuum design sensitivity formulas are derived from the material derivative in continuum mechanics and the variational form of the governing equation. Continuum sensitivity analysis is applied to Maxwell equations of electrostatic, magnetostatic and eddy-current systems, and then the sensitivity formulas for each system are derived in a closed form; an integration along the design interface. The book also introduces the recent breakthrough of the topology optimization method, which is accomplished by coupling the level set method and continuum design sensitivity. This topology optimization method enhances the possibility of the global minimum with minimised computational time, and in addition the evolving shapes during the iterative design process are easily captured in the level set equation. Moreover, since the optimization algorithm is transformed into a well-known transient analysis algorithm for differential equations, its numerical implementation becomes very simple and convenient. Despite the complex derivation processes and mathematical expressions, the obtained sensitivity formulas are very straightforward for numerical implementation. This book provides detailed explanation of the background theory and the derivation process, which will help readers understand the design method and will set the foundation for advanced research in the future.

Proceedings of the Tenth International Symposium on Applied Electromagnetic and Mechanics

Proceedings of the Tenth International Symposium on Applied Electromagnetic and Mechanics PDF Author: T. Takagi
Publisher: IOS Press
ISBN: 9781586033279
Category : Electromagnetic fields
Languages : en
Pages : 480

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Book Description
This publication covers topics in the area of applied electromagnetics and mechanics. Since starting in Japan in 1988, the ISEM has become a well-known international forum on applied electromagnetics.

Electromagnetic Fields in Electrical Engineering

Electromagnetic Fields in Electrical Engineering PDF Author: Andrzej Krawczyk
Publisher: IOS Press
ISBN: 9781586032326
Category : Science
Languages : en
Pages : 588

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Book Description
This volume includes contributions on: field theory and advanced computational electromagnetics; electrical machines and transformers; optimization and interactive design; electromagnetics in materials; coupled field and electromagnetic components in mechatronics; induction heating systems; bioelectromagnetics; and electromagnetics in education.

Electromagnetic Nondestructive Evaluation

Electromagnetic Nondestructive Evaluation PDF Author: Toshiyuki Takagi
Publisher: IOS Press
ISBN: 9789051993257
Category : Science
Languages : en
Pages : 334

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Book Description
Eddy current testing is a key technology among electromagnetic non-destructive testings at present and this situation was motivated by a stringent need to detect small cracks in tubing of a steam generator of nuclear power plants. In these five years the ECT technology has been enhanced very much, demonstrating that high performanced sensors for ECT are now ready to be applied to the annual inspection of steam generator tubing with use of arrayed micro sensors for ECT. In addition to the innovative technology, an inversion technique is being theoretically developed to make reconstruction of defects possible with use of data from the arrayed sensors. Rapid growth of interest in electromagnetic nondestructive evaluation have brought together experts from different parts of the world, as reflected in this work. The book is intended for engineers, researchers and practitioners working in the area of electromagnetism.

Electromagnetic Nondestructive Evaluation (VII)

Electromagnetic Nondestructive Evaluation (VII) PDF Author: Gerd Dobmann
Publisher: IOS Press
ISBN: 9781586035945
Category : Computers
Languages : en
Pages : 348

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Book Description
The aim of this selection of papers is to bring together researchers working very deep in the basics of electromagnetic NDT on one hand and industrialist discussing their practical problems on the other hand. The papers cover topics as; Microwave applications and Material Characterization; General Eddy Current Inspection Tasks; Novel Techniques and Sensors; Magnetic Flux leakage Inspection; Steam Generator Eddy Current Inspection Tasks; and Material Characterization. Especially Novel Techniques and Sensors and Material Characterization are discussed on multiple papers. This publication gives a good overview of the many scientific problems in this area, but also explains the actual challenges for the scientific-technical community, like problems with in-line inspection of pipelines or the enhancing of the inspection performance in steam generator tubes inspection in the nuclear field. The material is important for scientists and engineers working in the field of electromagnetic non-destructive testing, in defect detection and sizing, as well as in material characterization.

Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports PDF Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 892

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Book Description


Southeastcon '94

Southeastcon '94 PDF Author:
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 520

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Book Description


 PDF Author:
Publisher: IOS Press
ISBN:
Category :
Languages : en
Pages : 7289

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Book Description


Technology for Large Space Systems

Technology for Large Space Systems PDF Author:
Publisher:
ISBN:
Category : Large space structures (Astronautics)
Languages : en
Pages : 722

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Book Description


Nanoelectronic Coupled Problems Solutions

Nanoelectronic Coupled Problems Solutions PDF Author: E. Jan W. ter Maten
Publisher: Springer Nature
ISBN: 3030307263
Category : Mathematics
Languages : en
Pages : 587

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Book Description
Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers: (1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms’ industrial applicability.