Author: Saccha Ellen Johnson
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Atmospheric Pressure Chemical Vapour Deposition of Titanium Nitride from Titanium Tetrachloride and Ammonia
Author: Saccha Ellen Johnson
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Atmospheric Pressure Chemical Vapor Deposition of Titanium Nitride
Author: Joshua N. Musher
Publisher:
ISBN:
Category : Chemical vapor deposition
Languages : en
Pages : 308
Book Description
Publisher:
ISBN:
Category : Chemical vapor deposition
Languages : en
Pages : 308
Book Description
Atmospheric Pressure Chemical Vapor Deposition of Hydrogenated Amorphous Silicon, Titanium Nitride, and Titanium Dioxide Thin Films
Author: Sarah R. Kurtz
Publisher:
ISBN:
Category : Vapor-plating
Languages : en
Pages : 254
Book Description
Publisher:
ISBN:
Category : Vapor-plating
Languages : en
Pages : 254
Book Description
Low Pressure Chemical Vapor Deposition (LPCVD) of Titanium Nitride
Author: Sameer Narsinha Dharmadhikari
Publisher:
ISBN:
Category : Chemical vapor deposition
Languages : en
Pages : 110
Book Description
Titanium tetrachioride and ammonia were used as precursors in a Jow pressure chemical vapor deposition process to deposit titanium nitride films on silicon wafers. The process was carried out at temperatures from 450 to 850°C and the activation energy for the reaction was determined. The order of the reaction, with respect to the partial pressures of the reactant gases, was determined by carrying out the reaction at varying partial pressures of the reactant gases. The following rate equation was established for the reaction: rate = 4.35*10-5exp( -5150/T)*(PNH3)1.37(PTicl4)-0.42 The titanium nitride thin films deposited were characterized for properties like resistivity, stress, hardness, and density. The effects of varying the process parameters (temperature, flow ratio, etc.) on these film properties were studied.
Publisher:
ISBN:
Category : Chemical vapor deposition
Languages : en
Pages : 110
Book Description
Titanium tetrachioride and ammonia were used as precursors in a Jow pressure chemical vapor deposition process to deposit titanium nitride films on silicon wafers. The process was carried out at temperatures from 450 to 850°C and the activation energy for the reaction was determined. The order of the reaction, with respect to the partial pressures of the reactant gases, was determined by carrying out the reaction at varying partial pressures of the reactant gases. The following rate equation was established for the reaction: rate = 4.35*10-5exp( -5150/T)*(PNH3)1.37(PTicl4)-0.42 The titanium nitride thin films deposited were characterized for properties like resistivity, stress, hardness, and density. The effects of varying the process parameters (temperature, flow ratio, etc.) on these film properties were studied.
Titanium Nitride
Author: N. T. Wakelyn
Publisher:
ISBN:
Category : Graphite
Languages : en
Pages : 22
Book Description
Publisher:
ISBN:
Category : Graphite
Languages : en
Pages : 22
Book Description
The Atmospheric Chemical Vapor Deposition of Titanium Nitride on Polyimide Substrates
Author: Dawn Lee Rymer
Publisher:
ISBN:
Category : Analytical chemistry
Languages : en
Pages : 0
Book Description
Publisher:
ISBN:
Category : Analytical chemistry
Languages : en
Pages : 0
Book Description
Atmospheric Pressure Chemical Vapour Deposition of the Nitrides and Oxynitrides of Vandium, Titanium and Chromium
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 416
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 416
Book Description
Proceedings of the Tenth European Conference on Chemical Vapour Deposition, Venice, Italy, September 10-15, 1995
Author: Giovanni A Battison
Publisher:
ISBN:
Category : Vapor-plating
Languages : en
Pages : 702
Book Description
Publisher:
ISBN:
Category : Vapor-plating
Languages : en
Pages : 702
Book Description
Atmospheric Pressure Chemical Vapour Deposition of the Nitrides and Oxynitrides of Vanadium, Titanium and Chromium
Author: Gareth Steven Elwin
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Proceedings of the Symposium Om Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing
Author: M. Meyyappan
Publisher: The Electrochemical Society
ISBN: 9781566770965
Category : Technology & Engineering
Languages : en
Pages : 644
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566770965
Category : Technology & Engineering
Languages : en
Pages : 644
Book Description