Advances in Imaging and Electron Physics PDF Download
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Author:
Publisher: Academic Press
ISBN: 9780120147489
Category : Technology & Engineering
Languages : en
Pages : 353
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Book Description
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Author:
Publisher: Academic Press
ISBN: 0128025905
Category : Technology & Engineering
Languages : en
Pages : 269
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field
Author:
Publisher: Academic Press
ISBN: 9780120147489
Category : Technology & Engineering
Languages : en
Pages : 353
Get Book Here
Book Description
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Author:
Publisher: Academic Press
ISBN: 0080577474
Category : Computers
Languages : en
Pages : 357
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Book Description
Advances in Electronics and Electron Physics
Author: W. O. Saxton
Publisher: Academic Press
ISBN: 1483284646
Category : Science
Languages : en
Pages : 302
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Book Description
Computer Techniques for Image Processing in Electron Microscopy: Advances in Electronics and Electron Physics presents the sophisticated computer generated in processing the image. This book discusses the development of fast Fourier transform algorithms, which has led to the possibility of achieving a more reliable interpretation of electron micrographs by digital means. Organized into 10 chapters, this book begins with an overview of image formation in which the properties of the linear approximation are included. This text then reviews the available hardware and the basic mathematical methods of image processing in electron microscopy. Other chapters consider the constraints imposed on the image wave function by the objective lens aperture. This book discusses as well the properties of discrete Fourier transforms. The final chapter deals with a particular processing system called the Improc system. This book is a valuable resource for physicists and researcher workers who are interested in the study of image processing.
Author: Ahmed H. Zewail
Publisher: World Scientific
ISBN: 1848163908
Category : Science
Languages : en
Pages : 359
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Book Description
Structural phase transitions, mechanical deformations, and the embryonic stages of melting and crystallization are examples of phenomena that can now be imaged in unprecedented structural detail with high spatial resolution, and ten orders of magnitude as fast as hitherto. No monograph in existence attempts to cover the revolutionary dimensions that EM in its various modes of operation nowadays makes possible. The authors of this book chart these developments, and also compare the merits of coherent electron waves with those of synchrotron radiation. They judge it prudent to recall some important basic procedural and theoretical aspects of imaging and diffraction so that the reader may better comprehend the significance of the new vistas and applications now afoot. This book is not a vade mecum - numerous other texts are available for the practitioner for that purpose.
Author: E. L. Wolf
Publisher: International Monographs on Ph
ISBN: 0199589496
Category : Literary Collections
Languages : en
Pages : 617
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Book Description
Electron tunnelling spectroscopy as a research tool has strongly advanced understanding of superconductivity. This book explains the physics and instrumentation behind the advances illustrated in beautiful images of atoms, rings of atoms and exotic states in high temperature superconductors, and summarizes the state of knowledge that has resulted.
Author:
Publisher: Academic Press
ISBN: 0128209992
Category : Technology & Engineering
Languages : en
Pages : 328
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Book Description
Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.
Author: Christopher M. Collins
Publisher: Morgan & Claypool Publishers
ISBN: 1681740834
Category : Medical
Languages : en
Pages : 82
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Book Description
In the past few decades, Magnetic Resonance Imaging (MRI) has become an indispensable tool in modern medicine, with MRI systems now available at every major hospital in the developed world. But for all its utility and prevalence, it is much less commonly understood and less readily explained than other common medical imaging techniques. Unlike optical, ultrasonic, X-ray (including CT), and nuclear medicine-based imaging, MRI does not rely primarily on simple transmission and/or reflection of energy, and the highest achievable resolution in MRI is orders of magnitude smaller that the smallest wavelength involved. In this book, MRI will be explained with emphasis on the magnetic fields required, their generation, their concomitant electric fields, the various interactions of all these fields with the subject being imaged, and the implications of these interactions to image quality and patient safety. Classical electromagnetics will be used to describe aspects from the fundamental phenomenon of nuclear precession through signal detection and MRI safety. Simple explanations and Illustrations combined with pertinent equations are designed to help the reader rapidly gain a fundamental understanding and an appreciation of this technology as it is used today, as well as ongoing advances that will increase its value in the future. Numerous references are included to facilitate further study with an emphasis on areas most directly related to electromagnetics.
Author: Heide Schatten
Publisher: Cambridge University Press
ISBN: 0521195993
Category : Science
Languages : en
Pages : 275
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Book Description
A guide to modern scanning electron microscopy instrumentation, methodology and techniques, highlighting novel applications to cell and molecular biology.
Author: David C. Joy
Publisher: Oxford University Press
ISBN: 0195358465
Category : Computers
Languages : en
Pages : 225
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Book Description
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.
