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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 66
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Book Description
This thesis presents an in-depth empirical research to understand the impact of process variations in RF Circuits. We present a hierarchical two phase approach to study the impact of process based variations on device characteristics and circuit-level performance as well. The simulations based on Monte-Carlo techniques have been conducted extensively at different levels to gauge the impact of process variations. Such sensitivity analysis helps to identify the critical components for various RF Cores at both layout/fabrication level, as well as circuit-level, which affect the performance of the system in the face of process based variations. This knowledge helps designers make necessary changes in the design phase to improve yield at the production stage. Thus, the hierarchical defect mapping based on device/component performance and sensitivity helps in optimizing circuit design by suitable consideration of component topologies for robust design. From a testing perspective, the defect analysis can help identify realistic faults which are bound to occur in RF Circuits. This helps to reduce the test signal generation effort to detect different types of faults in these circuits, which in turn results in cost savings in the testing process. This work also focuses on exploratory investigations to find alternative techniques to Monte-Carlo simulation based approach. Further, new ideas based on extending fault equivalence concepts between catastrophic and parametric faults for ease of test generation in RF Circuits have also been presented. (Abstract shortened by UMI.).
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 66
Get Book Here
Book Description
This thesis presents an in-depth empirical research to understand the impact of process variations in RF Circuits. We present a hierarchical two phase approach to study the impact of process based variations on device characteristics and circuit-level performance as well. The simulations based on Monte-Carlo techniques have been conducted extensively at different levels to gauge the impact of process variations. Such sensitivity analysis helps to identify the critical components for various RF Cores at both layout/fabrication level, as well as circuit-level, which affect the performance of the system in the face of process based variations. This knowledge helps designers make necessary changes in the design phase to improve yield at the production stage. Thus, the hierarchical defect mapping based on device/component performance and sensitivity helps in optimizing circuit design by suitable consideration of component topologies for robust design. From a testing perspective, the defect analysis can help identify realistic faults which are bound to occur in RF Circuits. This helps to reduce the test signal generation effort to detect different types of faults in these circuits, which in turn results in cost savings in the testing process. This work also focuses on exploratory investigations to find alternative techniques to Monte-Carlo simulation based approach. Further, new ideas based on extending fault equivalence concepts between catastrophic and parametric faults for ease of test generation in RF Circuits have also been presented. (Abstract shortened by UMI.).
Author: Pooyan Sakian
Publisher: Springer Science & Business Media
ISBN: 1461421217
Category : Technology & Engineering
Languages : en
Pages : 181
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Book Description
This book discusses wireless receiver design challenges, given the shrinking of circuitry into ever-smaller sizes and resulting complications on manufacturability, production yield and end price of the products. Includes countermeasures for RF designers.
Author: Jiann-Shiun Yuan
Publisher: Springer
ISBN: 9811008841
Category : Technology & Engineering
Languages : en
Pages : 108
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Book Description
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
Author: Manfred Dietrich
Publisher: Springer Science & Business Media
ISBN: 1441966218
Category : Technology & Engineering
Languages : en
Pages : 261
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Book Description
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Author: Inder Bahl
Publisher: John Wiley & Sons
ISBN: 9780470462317
Category : Technology & Engineering
Languages : en
Pages : 696
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Book Description
A Comprehensive and Up-to-Date Treatment of RF and Microwave Transistor Amplifiers This book provides state-of-the-art coverage of RF and microwave transistor amplifiers, including low-noise, narrowband, broadband, linear, high-power, high-efficiency, and high-voltage. Topics covered include modeling, analysis, design, packaging, and thermal and fabrication considerations. Through a unique integration of theory and practice, readers will learn to solve amplifier-related design problems ranging from matching networks to biasing and stability. More than 240 problems are included to help readers test their basic amplifier and circuit design skills-and more than half of the problems feature fully worked-out solutions. With an emphasis on theory, design, and everyday applications, this book is geared toward students, teachers, scientists, and practicing engineers who are interested in broadening their knowledge of RF and microwave transistor amplifier circuit design.
Author: Fakhfakh, Mourad
Publisher: IGI Global
ISBN: 1466666285
Category : Technology & Engineering
Languages : en
Pages : 488
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Book Description
Improving the performance of existing technologies has always been a focal practice in the development of computational systems. However, as circuitry is becoming more complex, conventional techniques are becoming outdated and new research methodologies are being implemented by designers. Performance Optimization Techniques in Analog, Mix-Signal, and Radio-Frequency Circuit Design features recent advances in the engineering of integrated systems with prominence placed on methods for maximizing the functionality of these systems. This book emphasizes prospective trends in the field and is an essential reference source for researchers, practitioners, engineers, and technology designers interested in emerging research and techniques in the performance optimization of different circuit designs.
Author: Ekavut Kritchanchai
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
CMOS devices are scaled down and beyond pose significant process variability and reliability issues. Negative biased temperature instability (NBTI) and hot carrier injection (HCI) are well-known aging phenomena that degrade transistor and circuit performance. Yield analysis and optimization, which takes into account the manufacturing tolerances, model uncertainties, variations in the process parameters, and aging factors are known as indispensable components of the circuit design procedure. Process variability issues become more predominant as the feature size decreases. With these insights provided, reliability and variability evaluations on typical RF circuits and possible compensation techniques are highly desirable. In this work, a class F power amplifier was designed and evaluated using TSMC 0.18 [micrometer] RF technology. The PA’s output power and power-added efficiency were evaluated using the ADS simulation. Physical insight of transistor operation in the RF circuit environment was examined using the Sentaurus mixed-mode device and circuit simulation. The hot electron effect and device self-heating degraded the output power and power-added efficiency of the power amplifier, especially when both the input transistor and output transistor suffered high impact ionization rates and lattice heating.
Author: Sourabh Khandelwal
Publisher: Springer Nature
ISBN: 3030777308
Category : Technology & Engineering
Languages : en
Pages : 194
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Book Description
This book discusses in detail the Advanced SPICE Model for GaN HEMTs (ASM-HEMT), a new industry standard model for GaN-based power and RF circuit design. The author describes this new, standard model in detail, covering the different components of the ASM GaN model from fundamental derivations to the implementation in circuit simulation tools. The book also includes a detailed description of parameter extraction steps and model quality tests, which are critically important for effective use of this standard model in circuit simulation and product design. Coverage includes both radio-frequency (RF), and power electronics applications of this model. Practical issues related to measurement data and parameter extraction flow are also discussed, enabling readers easily to adopt this new model for design flow and simulation tools. Describes in detail a new industry standard for GaN-based power and RF circuit design; Includes discussion of practical problems and their solutions in GaN device modeling; Covers both radio-frequency (RF) and power electronics application of GaN technology; Describes modeling of both GaN RF and power devices.
Author: P. K. Giri
Publisher: Springer Science & Business Media
ISBN: 3642342167
Category : Technology & Engineering
Languages : en
Pages : 588
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Book Description
Nanoscale science and technology have occupied centre stage globally in modern scientific research and discourses in the early twenty first century. The enabling nature of the technology makes it important in modern electronics, computing, materials, healthcare, energy and the environment. This volume contains selected articles presented (as Invited/Oral/Poster presentations) at the 2nd international conference on advanced materials and nanotechnology (ICANN-2011) held recently at the Indian Institute of Technology Guwahati, during Dec 8-10, 2011. The list of topics covered in this proceedings include: Synthesis and self assembly of nanomaterials Nanoscale characterisation Nanophotonics & Nanoelectronics Nanobiotechnology Nanocomposites F Nanomagnetism Nanomaterials for Energy Computational Nanotechnology Commercialization of Nanotechnology The conference was represented by around 400 participants from several countries including delegates invited from USA, Germany, Japan, UK, Taiwan, Italy, Singapore, India etc.
Author: Fornarelli, Girolamo
Publisher: IGI Global
ISBN: 1466626976
Category : Technology & Engineering
Languages : en
Pages : 420
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Book Description
With growing developments in artificial intelligence and focus on swarm behaviors; algorithms have been utilized in solving a variety of problems in the field of engineering. This approach has been specifically suited to face the challenges in electric and electronic engineering. Swarm Intelligence for Electric and Electronic Engineering provides an exchange of knowledge on the advances, discoveries, and improvements of swarm intelligence in electric and electronic engineering. This comprehensive collection aims to bring together new swarm-based algorithms as well as approaches to complex problems and various real-world applications.
