Author: IEEE Staff
Publisher:
ISBN: 9781467382601
Category :
Languages : en
Pages :
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Book Description
IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 438
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Author:
Publisher:
ISBN:
Category : Circuits
Languages : en
Pages :
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Author: Souvik Mahapatra
Publisher: IEEE Computer Society Press
ISBN: 9781424410149
Category : Technology & Engineering
Languages : en
Pages : 309
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Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 378
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Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages :
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Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages :
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Author:
Publisher: ASM International
ISBN: 1627082735
Category : Technology & Engineering
Languages : en
Pages : 540
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Book Description
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Author: ASM International
Publisher: ASM International
ISBN: 1627080996
Category : Technology & Engineering
Languages : en
Pages : 593
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Book Description
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Author: Institute of Electrical and Electronics Engineers (New York, NY)
Publisher:
ISBN: 9781479939114
Category :
Languages : en
Pages : 389
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