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Author: Anshuman Chandra
Publisher:
ISBN:
Category : Plug and play (Computer architecture)
Languages : en
Pages : 370
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Book Description
Author: Anshuman Chandra
Publisher:
ISBN:
Category : Plug and play (Computer architecture)
Languages : en
Pages : 370
Get Book Here
Book Description
Author: Vikram Iyengar
Publisher: Springer Science & Business Media
ISBN: 1461511135
Category : Technology & Engineering
Languages : en
Pages : 234
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Book Description
Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.
Author: Ricardo Reis
Publisher: Springer
ISBN: 0387895582
Category : Computers
Languages : en
Pages : 315
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Book Description
This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5 and by the IEEE Council on Electronic Design Automation (CEDA), is to provide a forum to exchange ideas and show industrial and academic research results in the field of microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SoC conferences aim to address these exciting new issues.
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 550
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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author: Patrick Girard
Publisher: Springer Science & Business Media
ISBN: 1441909281
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Author: Mario Dal Cin
Publisher: Springer Science & Business Media
ISBN: 3540257233
Category : Computers
Languages : en
Pages : 488
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Book Description
This book constitutes the refereed proceedings of the 5th European Dependable Computing Conference, EDCC 2005, held in Budapest, Hungary in April 2005. The 21 revised full papers, 5 revised practical experience reports, and 4 prototype description papers presented together with the abstract of a keynote and 2 fast-track papers were carefully reviewed and selected from 90 submissions. The papers are organized in topical sections on distributed algorithms, fault-tolerant design and procotols, practical experience reports and tools, assessment and analysis, measurement, hardware verification, dependable networking, and reliability engineering and testing.
Author: Bashir M. Al-Hashimi
Publisher: IET
ISBN: 0863415520
Category : Technology & Engineering
Languages : en
Pages : 940
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Book Description
This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.
Author: Xiaohui Yuan
Publisher: Springer Nature
ISBN: 3030450996
Category : Computers
Languages : en
Pages : 248
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Book Description
This volume presents selected papers from the International Conference on Urban Intelligence and Applications (ICUIA), which took place on May 10-12, 2019 in Wuhan, China. The goal of the conference was to bring together researchers, industry leaders, policy makers, and administrators to discuss emerging technologies and their applications to advance the design and implementation of intelligent utilization and management of urban assets, and thus contributing to the autonomous, reliable, and efficient operation of modern, smart cities. The papers are collated to address major themes of urban sustainability, urban infrastructure and management, smart city applications, image and signal processing, natural language processing, and machine learning for monitoring and communications applications. The book will be of interest to researchers and industrial practitioners working on geospatial theories and tools, smart city applications, urban mobility and transportation, and community well-being and management.
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080556809
Category : Technology & Engineering
Languages : en
Pages : 893
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Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Author: Jia Luo
Publisher: Springer Science & Business Media
ISBN: 3642278663
Category : Technology & Engineering
Languages : en
Pages : 914
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Book Description
2012 International Conference on Affective Computing and Intelligent Interaction (ICACII 2012) was the most comprehensive conference focused on the various aspects of advances in Affective Computing and Intelligent Interaction. The conference provided a rare opportunity to bring together worldwide academic researchers and practitioners for exchanging the latest developments and applications in this field such as Intelligent Computing, Affective Computing, Machine Learning, Business Intelligence and HCI. This volume is a collection of 119 papers selected from 410 submissions from universities and industries all over the world, based on their quality and relevancy to the conference. All of the papers have been peer-reviewed by selected experts.
