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Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 972
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Book Description
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 972
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Book Description
Author: Dr. M. Maheswaran
Publisher: RK Publication
ISBN: 8197398348
Category : Technology & Engineering
Languages : en
Pages : 247
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Book Description
VLSI and Chip Design exploration of Very Large-Scale Integration (VLSI) technology and the intricacies of modern chip design. It fundamental principles, advanced methodologies, and the latest innovations in circuit design, fabrication, and testing. With a focus on digital and analog systems, this integrates theoretical concepts with practical applications, catering to both beginners and professionals. It emphasizes design optimization, power efficiency, and scalability, making it an essential resource for engineers, researchers, and students aspiring to excel in semiconductor technology and integrated circuit design.
Author: Rasit Onur Topaloglu
Publisher: Bentham Science Publishers
ISBN: 1608050742
Category : Technology & Engineering
Languages : en
Pages : 200
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Book Description
"The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transisto"
Author: Laung-Terng Wang
Publisher: Elsevier
ISBN: 0080474799
Category : Technology & Engineering
Languages : en
Pages : 809
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Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author:
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 776
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Book Description
Author: Sandeep K. Goel
Publisher: CRC Press
ISBN: 143982942X
Category : Technology & Engineering
Languages : en
Pages : 259
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Book Description
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
Author: Hans-Joachim Wunderlich
Publisher: Springer Science & Business Media
ISBN: 9048132827
Category : Computers
Languages : en
Pages : 263
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Book Description
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
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Book Description
Author: Rolf Drechsler
Publisher: Springer Science & Business Media
ISBN: 1475728662
Category : Technology & Engineering
Languages : en
Pages : 184
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Book Description
In VLSI CAD, difficult optimization problems have to be solved on a constant basis. Various optimization techniques have been proposed in the past. While some of these methods have been shown to work well in applications and have become somewhat established over the years, other techniques have been ignored. Recently, there has been a growing interest in optimization algorithms based on principles observed in nature, termed Evolutionary Algorithms (EAs). Evolutionary Algorithms in VLSI CAD presents the basic concepts of EAs, and considers the application of EAs in VLSI CAD. It is the first book to show how EAs could be used to improve IC design tools and processes. Several successful applications from different areas of circuit design, like logic synthesis, mapping and testing, are described in detail. Evolutionary Algorithms in VLSI CAD consists of two parts. The first part discusses basic principles of EAs and provides some easy-to-understand examples. Furthermore, a theoretical model for multi-objective optimization is presented. In the second part a software implementation of EAs is supplied together with detailed descriptions of several EA applications. These applications cover a wide range of VLSI CAD, and different methods for using EAs are described. Evolutionary Algorithms in VLSI CAD is intended for CAD developers and researchers as well as those working in evolutionary algorithms and techniques supporting modern design tools and processes.
Author: Giovanni De Micheli
Publisher: Springer
ISBN: 0387749098
Category : Computers
Languages : en
Pages : 397
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Book Description
This book contains extended and revised versions of the best papers presented during the fourteenth IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration. This conference provides a forum to exchange ideas and show industrial and academic research results in microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels.
