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Author: Hiroyuki Fujiwara
Publisher: Springer
ISBN: 3319753770
Category : Science
Languages : en
Pages : 602
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Book Description
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Author: Hiroyuki Fujiwara
Publisher: Springer
ISBN: 3319753770
Category : Science
Languages : en
Pages : 602
Get Book Here
Book Description
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
ISBN: 9780470060186
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Author: Hiroyuki Fujiwara
Publisher: Springer
ISBN: 3319951386
Category : Science
Languages : en
Pages : 628
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Book Description
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.
Author: Harland G. Tompkins
Publisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 138
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Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Author: Daniel Abou-Ras
Publisher: John Wiley & Sons
ISBN: 3527699015
Category : Science
Languages : de
Pages : 760
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Book Description
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
Author: Hiroyuki Fujiwara
Publisher:
ISBN: 9783319753768
Category : Ellipsometry
Languages : en
Pages : 594
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Book Description
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
ISBN: 3527347291
Category : Technology & Engineering
Languages : en
Pages : 612
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Book Description
Unparalleled coverage of the most vibrant research field in photovoltaics! Hybrid perovskites, revolutionary game-changing semiconductor materials, have every favorable optoelectronic characteristic necessary for realizing high efficiency solar cells. The remarkable features of hybrid perovskite photovoltaics, such as superior material properties, easy material fabrication by solution-based processing, large-area device fabrication by an inkjet technology, and simple solar cell structures, have brought enormous attentions, leading to a rapid development of the solar cell technology at a pace never before seen in solar cell history. Hybrid Perovskite Solar Cells: Characteristics and Operation covers extensive topics of hybrid perovskite solar cells, providing easy-to-read descriptions for the fundamental characteristics of unique hybrid perovskite materials (Part I) as well as the principles and applications of hybrid perovskite solar cells (Part II). Both basic and advanced concepts of hybrid perovskite devices are treated thoroughly in this book; in particular, explanatory descriptions for general physical and chemical aspects of hybrid perovskite photovoltaics are included to provide fundamental understanding. This comprehensive book is highly suitable for graduate school students and researchers who are not familiar with hybrid perovskite materials and devices, allowing the accumulation of the accurate knowledge from the basic to the advanced levels.
Author: Hiroyuki Fujiwara
Publisher:
ISBN: 9783319951393
Category : Ellipsometry
Languages : en
Pages : 616
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Book Description
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.
Author: Soteris Kalogirou
Publisher: Academic Press
ISBN: 0128103973
Category : Technology & Engineering
Languages : en
Pages : 1341
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Book Description
Practical Handbook of Photovoltaics, Third Edition, is a 'benchmark' publication for those involved in the design, manufacture and use of these devices. This fully revised handbook includes brand new sections on smart grids, net metering and the modeling of photovoltaic systems, as well as fully revised content on developments in photovoltaic applications, the economics of PV manufacturing and updated chapters on solar cell function, raw materials, photovoltaic standards, calibration and testing, all with new examples and case studies. The editor has assembled internationally-respected contributors from industry and academia around the world to make this a truly global reference. It is essential reading for electrical engineers, designers of systems, installers, architects, policymakers and physicists working with photovoltaics. - Presents a cast of international experts from industry and academia to ensure the highest quality information from multiple stakeholder perspectives - Covers all things photovoltaics, from the principles of solar cell function and their raw materials, to the installation and design of full photovoltaic systems - Includes case studies, practical examples, and reports on the latest advances and worldwide applications
Author: Augustin McEvoy
Publisher: Academic Press
ISBN: 0123859344
Category : Science
Languages : en
Pages : 1269
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Book Description
This handbook opens with an overview of solar radiation and how its energy can be tapped using photovoltaic cells. Other chapters cover the technology, manufacture and application of PV cells in real situations. The book ends by exploring the economic and business aspects of PV systems.
