Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 29
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Book Description
Several third generation synchrotron radiation facilities are now operational and the high brightness of these photon sources offers new opportunities for x-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than one micron. There are two aspects to this. One is to further the field of surface science by exploring the effects of spatial variations across a surface on a scale not previously accessible to x-ray measurements. The other is to open up new analytical techniques in materials science using x-rays, on a spatial scale comparable to that of the processes or devices to be studied. The development of the spectromicroscopy program at the Advanced Light Source will employ a variety of instruments, some are already operational. Their development and use will be discussed, and recent results will be presented to illustrate their capabilities.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 20
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Book Description
Third generation synchrotron sources of soft x-rays provide an excellent opportunity to apply established x-ray spectroscopic materials analysis techniques to surface imaging on a sub-micron scale. This paper describes an effort underway at the Advanced Light Source (ALS) to pursue this development using Fresnel zone plate lenses. These are used to produce a sub-micron spot of x-rays for use in scanning microscopy. Several groups have developed microscopes using this technique. A specimen is rastered in the focused x-ray spot and a detector signal is acquired as a function of position to generate an image. Spectroscopic capability is added by holding the small spot on a feature of interest and scanning through the spectrum. The authors are pursuing two spectroscopic techniques: Near Edge X-ray Absorption Spectroscopy (NEXAFS), X-ray Photoelectron Spectroscopy (XPS) which together provide a powerful capability for light element analysis in materials science.
Author: David Attwood
Publisher: Cambridge University Press
ISBN: 9780521652148
Category : Technology & Engineering
Languages : en
Pages : 504
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Book Description
This comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the ...
Author: Chunhai Fan
Publisher: John Wiley & Sons
ISBN: 3527339868
Category : Technology & Engineering
Languages : en
Pages : 846
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Book Description
Meeting the long-felt need for in-depth information on one of the most advanced material characterization methods, a top team of editors and authors from highly prestigious facilities and institutions covers a range of synchrotron techniques that have proven useful for materials research. Following an introduction to synchrotron radiation and its sources, the second part goes on to describe the various techniques that benefit from this especially bright light, including X-ray absorption, diffraction, scattering, imaging, and lithography. The thrid and final part provides an overview of the applications of synchrotron radiation in materials science. bridging the gap between specialists in synchrotron research and material scientists, this is a unique and indispensable resource for academic and industrial researchers alike.
Author: Jinghua Guo
Publisher: John Wiley & Sons
ISBN: 3527632301
Category : Science
Languages : en
Pages : 279
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Book Description
An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging. The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 5
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Book Description
The brightness of the Advanced Light Source will be exploited by several new instruments for materials science spectromicroscopy over the next year or so. The first of these to become operational is a scanning transmission x-ray microscope with which near edge x-ray absorption spectra (NEXAFS) can be measured on spatial features of sub-micron size. Here the authors describe the instrument as it is presently implemented, its capabilities, some studies made to date and the developments to come. The Scanning Transmission X-ray Microscope makes use of a zone plate lens to produce a small x-ray spot with which to perform absorption spectroscopy through thin samples. The x-ray beam from ALS undulator beamline 7.0 emerges into the microscope vessel through a silicon nitride vacuum window 160nm thick and 300[mu]m square. The vessel is filled with helium at atmospheric pressure. The zone plate lens is illuminated 1mm downstream from the vacuum window and forms an image in first order of a pinhole which is 3m upstream in the beamline. An order sorting aperture passes the first order converging light and blocks the unfocused zero order. The sample is at the focus a few mm downstream of the zone plate and mounted from a scanning piezo stage which rasters in x and y so that an image is formed, pixel by pixel, by an intensity detector behind the sample. Absorption spectra are measured point-by-point as the photon energy is scanned by rotating the diffraction grating in the monochromator and changing the undulator gap.
Author: Yasuhiro Iwasawa
Publisher: Springer
ISBN: 3319438662
Category : Science
Languages : en
Pages : 545
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Book Description
This book is a comprehensive, theoretical, practical, and thorough guide to XAFS spectroscopy. The book addresses XAFS fundamentals such as experiments, theory and data analysis, advanced XAFS methods such as operando XAFS, time-resolved XAFS, spatially resolved XAFS, total-reflection XAFS, high energy resolution XAFS, and practical applications to a variety of catalysts, nanomaterials and surfaces. This book is accessible to a broad audience in academia and industry, and will be a useful guide for researchers entering the subject and graduate students in a wide variety of disciplines.
Author: Iain May
Publisher: Royal Society of Chemistry
ISBN: 1847555365
Category : Science
Languages : en
Pages : 831
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Book Description
Actinide elements and their chemistry have a significant number of applications. Bringing together contributions from the leading experts in the field, Recent Advances in Actinide Science covers six main topics: * Analysis, the environment and biotransformations * Coordination and organometallic chemistry * Heavy elements * Nuclear fuels, materials and waste forms * Separations and solution chemistry * Spectroscopy, magnetism and superconductivity Covering a wide range of research from pure academic studies to applied industrial science and technology, this book distils the knowledge and achievements gained in actinide science over the last four years. This high level book is aimed at researchers, both industrial and academic, and provides a comprehensive overview of the current status of actinide science.
Author: John Evans
Publisher: John Wiley & Sons
ISBN: 1118676173
Category : Technology & Engineering
Languages : en
Pages : 226
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Book Description
A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage — providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.
Author: Iwao Matsuda
Publisher: Springer
ISBN: 9789819967131
Category : Science
Languages : en
Pages : 0
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Book Description
X-ray experiments have been used widely in materials science, and conventional spectroscopy has been based on linear responses in light–matter interactions. Recent development of ultrafast light sources of tabletop lasers and X-ray free electron lasers reveals nonlinear optical phenomena in the X-ray region, and the measurement signals have been found to carry a further wealth of information on materials. This book overviews such nonlinear X-ray spectroscopy and its related issues for materials science. Each chapter is written by pioneers in the field and skillfully reviews the topics of nonlinear spectroscopy including X-ray multi-photon absorption and X-ray second harmonic generation. The chapters are divided depending on photon wavelength, ranging from extreme ultraviolet to (soft) X-ray. To facilitate readers’ comprehensive understanding, some of the chapters cover the conventional linear X-ray spectroscopy and basic principles of the non-linear responses. The book is mainly accessible as a primer for junior/senior- or graduate-level readers, and it also serves as a useful reference or guide even for established researchers in optical spectroscopy. The book offers readers opportunities to benefit from cutting-edge research in this new area of nonlinear X-ray spectroscopy.
