Silicon Dioxide and the Luminescence of Related Materials PDF Download
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Author: Anatoly Trukhin
Publisher: Cambridge Scholars Publishing
ISBN: 1527571947
Category : Science
Languages : en
Pages : 539
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Book Description
This book is devoted to the study of the properties of materials that can be in a crystalline and glassy state. Its central focus is the physics of solids, whose structure is disordered, since the existing theories of solids are based on crystal structures. The approach adopted here is based on the comparison of data for crystals and glasses formed by the same atoms, paying particular attention to the under-explored glass-forming crystals. The book will be of interest to graduate students, solid states researchers, glass technologists, and young scientists beginning research in the field of experimental physics.
Author: Anatoly Trukhin
Publisher: Cambridge Scholars Publishing
ISBN: 1527571947
Category : Science
Languages : en
Pages : 539
Get Book Here
Book Description
This book is devoted to the study of the properties of materials that can be in a crystalline and glassy state. Its central focus is the physics of solids, whose structure is disordered, since the existing theories of solids are based on crystal structures. The approach adopted here is based on the comparison of data for crystals and glasses formed by the same atoms, paying particular attention to the under-explored glass-forming crystals. The book will be of interest to graduate students, solid states researchers, glass technologists, and young scientists beginning research in the field of experimental physics.
Author: Gianfranco Pacchioni
Publisher: Springer Science & Business Media
ISBN: 9401009449
Category : Technology & Engineering
Languages : en
Pages : 619
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Book Description
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
Author: P. Schmuki
Publisher: The Electrochemical Society
ISBN: 9781566771344
Category : Science
Languages : en
Pages : 556
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Book Description
Author: Sukumar Basu
Publisher: BoD – Books on Demand
ISBN: 9533075872
Category : Science
Languages : en
Pages : 360
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Book Description
The exciting world of crystalline silicon is the source of the spectacular advancement of discrete electronic devices and solar cells. The exploitation of ever changing properties of crystalline silicon with dimensional transformation may indicate more innovative silicon based technologies in near future. For example, the discovery of nanocrystalline silicon has largely overcome the obstacles of using silicon as optoelectronic material. The further research and development is necessary to find out the treasures hidden within this material. The book presents different forms of silicon material, their preparation and properties. The modern techniques to study the surface and interface defect states, dislocations, and so on, in different crystalline forms have been highlighted in this book. This book presents basic and applied aspects of different crystalline forms of silicon in wide range of information from materials to devices.
Author: Gianfranco Pacchioni
Publisher: Springer Science & Business Media
ISBN: 9780792366850
Category : Medical
Languages : en
Pages : 636
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Book Description
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
Author: United States. Energy Research and Development Administration
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 806
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Book Description
Author: United States. Energy Research and Development Administration. Technical Information Center
Publisher:
ISBN:
Category : Force and energy
Languages : en
Pages : 982
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Book Description
Author: M. Cahay
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 682
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Book Description
Author: Arash Darafsheh
Publisher: CRC Press
ISBN: 1351005375
Category : Medical
Languages : en
Pages : 505
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Book Description
This comprehensive book covers the everyday use and underlying principles of radiation dosimeters used in radiation oncology clinics. It provides an up-to-date reference spanning the full range of current modalities with emphasis on practical know-how. The main audience is medical physicists, radiation oncology physics residents, and medical physics graduate students. The reader gains the necessary tools for determining which detector is best for a given application. Dosimetry of cutting edge techniques from radiosurgery to MRI-guided systems to small fields and proton therapy are all addressed. Main topics include fundamentals of radiation dosimeters, brachytherapy and external beam radiation therapy dosimetry, and dosimetry of imaging modalities. Comprised of 30 chapters authored by leading experts in the medical physics community, the book: Covers the basic principles and practical use of radiation dosimeters in radiation oncology clinics across the full range of current modalities. Focuses on providing practical guidance for those using these detectors in the clinic. Explains which detector is more suitable for a particular application. Discusses the state of the art in radiotherapy approaches, from radiosurgery and MR-guided systems to advanced range verification techniques in proton therapy. Gives critical comparisons of dosimeters for photon, electron, and proton therapies.
Author: Ram Ekwal Sah
Publisher: The Electrochemical Society
ISBN: 1566775523
Category : Dielectric films
Languages : en
Pages : 863
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Book Description
This issue of ECS Transactions contains the papers presented in the symposium on Silicon Nitride, Silicon Dioxide Thin Insulating Films, and Emerging Dielectics held May 6-11, 2007 in Chicago. Papers were presented on deposition, characterization and applications of the dielectrics including high- and low-k dielectrics, as well as interface states, device characterization, reliabiliy and modeling.
