Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices PDF Download

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Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices PDF Author: Ronald Donald Schrimpf
Publisher: World Scientific
ISBN: 9812389407
Category : Technology & Engineering
Languages : en
Pages : 349

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Book Description
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.