Author: Anirban Sengupta
Publisher: Springer
ISBN: 9813297670
Category : Computers
Languages : en
Pages : 782
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Book Description
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Author:
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 638
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Book Description
Author: Brajesh Kumar Kaushik
Publisher: Springer
ISBN: 9811074704
Category : Computers
Languages : en
Pages : 820
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Book Description
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Author: Manoj Singh Gaur
Publisher: Springer
ISBN: 3642420249
Category : Computers
Languages : en
Pages : 403
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Book Description
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Author: Stephen W. Director
Publisher: Springer Science & Business Media
ISBN: 1461315212
Category : Technology & Engineering
Languages : en
Pages : 299
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Book Description
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
Author: Laung-Terng Wang
Publisher: Elsevier
ISBN: 0080474799
Category : Technology & Engineering
Languages : en
Pages : 809
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Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author: Bashir M. Al-Hashimi
Publisher: IET
ISBN: 0863415520
Category : Technology & Engineering
Languages : en
Pages : 940
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Book Description
This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.
Author: Shubhakar Kalya
Publisher: Springer Nature
ISBN: 9811604436
Category : Technology & Engineering
Languages : en
Pages : 457
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Book Description
This book comprises select peer-reviewed papers from the International Conference on VLSI, Signal Processing, Power Electronics, IoT, Communication and Embedded Systems (VSPICE-2020). The book provides insights into various aspects of the emerging fields in the areas Electronics and Communication Engineering as a holistic approach. The various topics covered in this book include VLSI, embedded systems, signal processing, communication, power electronics and internet of things. This book mainly focuses on the most recent innovations, trends, concerns and practical challenges and their solutions. This book will be useful for academicians, professionals and researchers in the area of electronics and communications and electrical engineering.
Author: Subhransu Sekhar Dash
Publisher: Springer
ISBN: 9811055203
Category : Technology & Engineering
Languages : en
Pages : 662
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Book Description
The book is a collection of best papers presented in International Conference on Intelligent Computing and Applications (ICICA 2016) organized by Department of Computer Engineering, D.Y. Patil College of Engineering, Pune, India during 20-22 December 2016. The book presents original work, information, techniques and applications in the field of computational intelligence, power and computing technology. This volume also talks about image language processing, computer vision and pattern recognition, machine learning, data mining and computational life sciences, management of data including Big Data and analytics, distributed and mobile systems including grid and cloud infrastructure.
Author: Saraju P. Mohanty
Publisher: Springer Science & Business Media
ISBN: 0387764747
Category : Technology & Engineering
Languages : en
Pages : 325
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Book Description
This self-contained book addresses the need for analysis, characterization, estimation, and optimization of the various forms of power dissipation in the presence of process variations of nano-CMOS technologies. The authors show very large-scale integration (VLSI) researchers and engineers how to minimize the different types of power consumption of digital circuits. The material deals primarily with high-level (architectural or behavioral) energy dissipation.
