Principles of Electron Optics PDF Download
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Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0080984169
Category : Science
Languages : en
Pages : 755
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Book Description
The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0080984169
Category : Science
Languages : en
Pages : 755
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Book Description
The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128189800
Category : Technology & Engineering
Languages : en
Pages : 562
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Book Description
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. - Includes authoritative coverage of the fundamental theory behind electron beams - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Category : Technology & Engineering
Languages : en
Pages : 224
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Book Description
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author: Max Born
Publisher: Elsevier
ISBN: 148310320X
Category : Science
Languages : en
Pages : 871
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Book Description
Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, Sixth Edition covers optical phenomenon that can be treated with Maxwell's phenomenological theory. The book is comprised of 14 chapters that discuss various topics about optics, such as geometrical theories, image forming instruments, and optics of metals and crystals. The text covers the elements of the theories of interference, interferometers, and diffraction. The book tackles several behaviors of light, including its diffraction when exposed to ultrasonic waves. The selection will be most useful to researchers whose work involves understanding the behavior of light.
Author: OpenStax
Publisher:
ISBN: 9781680920451
Category : Science
Languages : en
Pages : 622
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Book Description
University Physics is a three-volume collection that meets the scope and sequence requirements for two- and three-semester calculus-based physics courses. Volume 1 covers mechanics, sound, oscillations, and waves. Volume 2 covers thermodynamics, electricity and magnetism, and Volume 3 covers optics and modern physics. This textbook emphasizes connections between between theory and application, making physics concepts interesting and accessible to students while maintaining the mathematical rigor inherent in the subject. Frequent, strong examples focus on how to approach a problem, how to work with the equations, and how to check and generalize the result. The text and images in this textbook are grayscale.
Author: Poul Dahl
Publisher: Elsevier
ISBN: 0323160905
Category : Science
Languages : en
Pages : 156
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Book Description
Introduction to Electron and Ion Optics provides the theoretical background needed to understand the subject matter and even be helpful in laboratory works. Seven major parts comprise the book where each focuses on a certain aspect or field. The book begins with an introduction to the general principles about electron and ion optics, specifically as basis for the design of the optical components used in particle analyzers and accelerators. The following parts tackle different aspects such as geometrical optics; scaling rules and dispersion coefficients; fields (paraxial, sector, fringing, quadrupole); lenses (electrostatic, immersion, unipotential, etc.); analyzers (electrostatic, spherical, etc.); and space charge and beam production. Towards the last part of the book, there is an exercises section where various problems are given for the reader to answer. This book caters to students specifically in the field of physics.
Author: Max Born
Publisher: Cambridge University Press
ISBN: 1108477437
Category : Science
Languages : en
Pages : 993
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Book Description
The 60th anniversary edition of this classic and unrivalled optics reference work includes a special foreword by Sir Peter Knight.
Author: Harry J. Levinson
Publisher: SPIE Press
ISBN: 9780819456601
Category : Technology & Engineering
Languages : en
Pages : 446
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Book Description
Lithography is a field in which advances proceed at a swift pace. This book was written to address several needs, and the revisions for the second edition were made with those original objectives in mind. Many new topics have been included in this text commensurate with the progress that has taken place during the past few years, and several subjects are discussed in more detail. This book is intended to serve as an introduction to the science of microlithography for people who are unfamiliar with the subject. Topics directly related to the tools used to manufacture integrated circuits are addressed in depth, including such topics as overlay, the stages of exposure, tools, and light sources. This text also contains numerous references for students who want to investigate particular topics in more detail, and they provide the experienced lithographer with lists of references by topic as well. It is expected that the reader of this book will have a foundation in basic physics and chemistry. No topics will require knowledge of mathematics beyond elementary calculus.
Author: Peter Schmüser
Publisher: Springer
ISBN: 3319040812
Category : Science
Languages : en
Pages : 240
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Book Description
The main goal of the book is to provide a systematic and didactic approach to the physics and technology of free-electron lasers. Numerous figures are used for illustrating the underlying ideas and concepts and links to other fields of physics are provided. After an introduction to undulator radiation and the low-gain FEL, the one-dimensional theory of the high-gain FEL is developed in a systematic way. Particular emphasis is put on explaining and justifying the various assumptions and approximations that are needed to obtain the differential and integral equations governing the FEL dynamics. Analytical and numerical solutions are presented and important FEL parameters are defined, such as gain length, FEL bandwidth and saturation power. One of the most important features of a high-gain FEL, the formation of microbunches, is studied at length. The increase of gain length due to beam energy spread, space charge forces, and three-dimensional effects such as betatron oscillations and optical diffraction is analyzed. The mechanism of Self-Amplified Spontaneous Emission is described theoretically and illustrated with numerous experimental results. Various methods of FEL seeding by coherent external radiation are introduced, together with experimental results. The world’s first soft X-ray FEL, the user facility FLASH at DESY, is described in some detail to give an impression of the complexity of such an accelerator-based light source. The last chapter is devoted to the new hard X-ray FELs which generate extremely intense radiation in the Angstrøm regime. The appendices contain supplementary material and more involved calculations.
Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662135531
Category : Science
Languages : en
Pages : 532
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Book Description
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
