Particles and Waves in Electron Optics and Microscopy PDF Download
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Author:
Publisher: Academic Press
ISBN: 0128052309
Category : Science
Languages : en
Pages : 364
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Author:
Publisher: Academic Press
ISBN: 0128052309
Category : Science
Languages : en
Pages : 364
Get Book Here
Book Description
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Author: OpenStax
Publisher:
ISBN: 9781680920451
Category : Science
Languages : en
Pages : 622
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Book Description
University Physics is a three-volume collection that meets the scope and sequence requirements for two- and three-semester calculus-based physics courses. Volume 1 covers mechanics, sound, oscillations, and waves. Volume 2 covers thermodynamics, electricity and magnetism, and Volume 3 covers optics and modern physics. This textbook emphasizes connections between between theory and application, making physics concepts interesting and accessible to students while maintaining the mathematical rigor inherent in the subject. Frequent, strong examples focus on how to approach a problem, how to work with the equations, and how to check and generalize the result. The text and images in this textbook are grayscale.
Author:
Publisher: Academic Press
ISBN: 9780128048146
Category : Science
Languages : en
Pages : 0
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Author: P. W. Hawkes
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 268
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Book Description
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
Author: Rodney Priestley
Publisher: Royal Society of Chemistry
ISBN: 1788014170
Category : Science
Languages : en
Pages : 442
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Book Description
Academic and industrial research around polymer-based colloids is huge. Edited by two world-renowned leaders in polymer science and engineering, this is a fundamental text for the field.
Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Category : Technology & Engineering
Languages : en
Pages : 224
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Book Description
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author: Augusto Garuccio
Publisher: Springer Science & Business Media
ISBN: 1461525500
Category : Science
Languages : en
Pages : 610
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Book Description
From September 24 through 30, 1992 the Workshop on "Waves and Parti cles in Light and Matter" was held in the Italian city of Trani in celebration of the centenary of Louis de Broglie's birth. As is well known, the relationship between quantum theory and ob jective reality was one of the main threads running through the researches of this French physicist. It was therefore in a fitting tribute to him on his 90th birthday that ten years ago an international conference on the same subject was convened in Perugia. On that occasion, physicists from all over the world interested in the problematics of wave-particle duality engaged in thoughtful debates (the proceedings of which were subsequently published) on recent theoretical and experimental developments in our understanding of the foundations of quantum mechanics. This time around, about 120 scientists, coming from 5 continents, in the warm and pleasant atmosphere of Trani's Colonna Conference Center focussed their discussions on recent results concerned with the EPR para dox, matter-interferometry, reality of de Broglie's waves, photon detection, macroscopic quantum coherence, alternative theories to usual quantum mechanics, special relativity, state reduction, and other related topics. The workshop was organized in plenary sessions, round tables, and poster sessions, and the present volume collects most-but not all-of the presented papers. A number of acknowledgements are due. We thank, first of all, the contributors, without whose constant dedication this volume could not have been published.
Author: Ahmed H. Zewail
Publisher: World Scientific
ISBN: 1848163908
Category : Science
Languages : en
Pages : 359
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Book Description
Structural phase transitions, mechanical deformations, and the embryonic stages of melting and crystallization are examples of phenomena that can now be imaged in unprecedented structural detail with high spatial resolution, and ten orders of magnitude as fast as hitherto. No monograph in existence attempts to cover the revolutionary dimensions that EM in its various modes of operation nowadays makes possible. The authors of this book chart these developments, and also compare the merits of coherent electron waves with those of synchrotron radiation. They judge it prudent to recall some important basic procedural and theoretical aspects of imaging and diffraction so that the reader may better comprehend the significance of the new vistas and applications now afoot. This book is not a vade mecum - numerous other texts are available for the practitioner for that purpose.
Author: Ernst Bauer
Publisher: Springer
ISBN: 1493909355
Category : Technology & Engineering
Languages : en
Pages : 513
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Book Description
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128189800
Category : Technology & Engineering
Languages : en
Pages : 562
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Book Description
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. - Includes authoritative coverage of the fundamental theory behind electron beams - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
