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Author: Kirk A. Gray
Publisher: John Wiley & Sons
ISBN: 1118700236
Category : Technology & Engineering
Languages : en
Pages : 298
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Book Description
NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware–software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. Challenges existing failure prediction methodologies by highlighting their limitations using real field data. Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Author: Kirk A. Gray
Publisher: John Wiley & Sons
ISBN: 1118700236
Category : Technology & Engineering
Languages : en
Pages : 298
Get Book Here
Book Description
NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware–software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. Challenges existing failure prediction methodologies by highlighting their limitations using real field data. Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Author: Kirk Gray
Publisher:
ISBN: 9781118700228
Category : TECHNOLOGY & ENGINEERING
Languages : en
Pages :
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Book Description
Author: Stein Haugen
Publisher: CRC Press
ISBN: 1351174649
Category : Technology & Engineering
Languages : en
Pages : 4379
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Book Description
Safety and Reliability – Safe Societies in a Changing World collects the papers presented at the 28th European Safety and Reliability Conference, ESREL 2018 in Trondheim, Norway, June 17-21, 2018. The contributions cover a wide range of methodologies and application areas for safety and reliability that contribute to safe societies in a changing world. These methodologies and applications include: - foundations of risk and reliability assessment and management - mathematical methods in reliability and safety - risk assessment - risk management - system reliability - uncertainty analysis - digitalization and big data - prognostics and system health management - occupational safety - accident and incident modeling - maintenance modeling and applications - simulation for safety and reliability analysis - dynamic risk and barrier management - organizational factors and safety culture - human factors and human reliability - resilience engineering - structural reliability - natural hazards - security - economic analysis in risk management Safety and Reliability – Safe Societies in a Changing World will be invaluable to academics and professionals working in a wide range of industrial and governmental sectors: offshore oil and gas, nuclear engineering, aeronautics and aerospace, marine transport and engineering, railways, road transport, automotive engineering, civil engineering, critical infrastructures, electrical and electronic engineering, energy production and distribution, environmental engineering, information technology and telecommunications, insurance and finance, manufacturing, marine transport, mechanical engineering, security and protection, and policy making.
Author: Kirk A. Gray
Publisher: John Wiley & Sons
ISBN: 111870021X
Category : Technology & Engineering
Languages : en
Pages : 296
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Book Description
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly mis-application of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by illustrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight to the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: * Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. * Challenges existing failure prediction methodologies by highlighting their limitations using real field data. * Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. * Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. * Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. * Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Author: Robert Herrick
Publisher: Woodhead Publishing
ISBN: 0128192550
Category : Technology & Engineering
Languages : en
Pages : 336
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Book Description
Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D. - Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry - Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products - Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more
Author: Elsayed A. Elsayed
Publisher: John Wiley & Sons
ISBN: 1119665892
Category : Technology & Engineering
Languages : en
Pages : 931
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Book Description
Get a firm handle on the engineering reliability process with this insightful and complete resource Named one of the Best Industrial Management eBooks of All Time by BookAuthority As featured on CNN, Forbes and Inc – BookAuthority identifies and rates the best books in the world, based on recommendations by thought leaders and experts The newly and thoroughly revised 3rd Edition of Reliability Engineering delivers a comprehensive and insightful analysis of this crucial field. Accomplished author, professor, and engineer, Elsayed. A. Elsayed includes new examples and end-of-chapter problems to illustrate concepts, new chapters on resilience and the physics of failure, revised chapters on reliability and hazard functions, and more case studies illustrating the approaches and methodologies described within. The book combines analyses of system reliability estimation for time independent and time dependent models with the construction of the likelihood function and its use in estimating the parameters of failure time distribution. It concludes by addressing the physics of failures, mechanical reliability, and system resilience, along with an explanation of how to ensure reliability objectives by providing preventive and scheduled maintenance and warranty policies. This new edition of Reliability Engineering covers a wide range of topics, including: Reliability and hazard functions, like the Weibull Model, the Exponential Model, the Gamma Model, and the Log-Logistic Model, among others System reliability evaluations, including parallel-series, series-parallel, and mixed parallel systems The concepts of time- and failure-dependent reliability within both repairable and non-repairable systems Parametric reliability models, including types of censoring, and the Exponential, Weibull, Lognormal, Gamma, Extreme Value, Half-Logistic, and Rayleigh Distributions Perfect for first-year graduate students in industrial and systems engineering, Reliability Engineering, 3rd Edition also belongs on the bookshelves of practicing professionals in research laboratories and defense industries. The book offers a practical and approachable treatment of a complex area, combining the most crucial foundational knowledge with necessary and advanced topics.
Author: Abdulkerim Gok
Publisher: BoD – Books on Demand
ISBN: 1789848229
Category : Technology & Engineering
Languages : en
Pages : 171
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Book Description
Photovoltaic (PV) solar energy is expected to be the world's largest source of electricity in the future. To enhance the long-term reliability of PV modules, a thorough understanding of failure mechanisms is of vital importance. In addition, it is important to address the potential downsides to this technology. These include the hazardous chemicals needed for manufacturing solar cells, especially for thin-film technologies, and the large number of PV modules disposed of at the end of their lifecycles. This book discusses the reliability and environmental aspects of PV modules.
Author: Hoang Pham
Publisher: Springer Nature
ISBN: 1447175034
Category : Technology & Engineering
Languages : en
Pages : 1136
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Book Description
In today’s global and highly competitive environment, continuous improvement in the processes and products of any field of engineering is essential for survival. This book gathers together the full range of statistical techniques required by engineers from all fields. It will assist them to gain sensible statistical feedback on how their processes or products are functioning and to give them realistic predictions of how these could be improved. The handbook will be essential reading for all engineers and engineering-connected managers who are serious about keeping their methods and products at the cutting edge of quality and competitiveness.
Author: Jasbir Bath
Publisher: John Wiley & Sons
ISBN: 1119482046
Category : Technology & Engineering
Languages : en
Pages : 515
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Book Description
Covering the major topics in lead-free soldering Lead-free Soldering Process Development and Reliability provides a comprehensive discussion of all modern topics in lead-free soldering. Perfect for process, quality, failure analysis and reliability engineers in production industries, this reference will help practitioners address issues in research, development and production. Among other topics, the book addresses: · Developments in process engineering (SMT, Wave, Rework, Paste Technology) · Low temperature, high temperature and high reliability alloys · Intermetallic compounds · PCB surface finishes and laminates · Underfills, encapsulants and conformal coatings · Reliability assessments In a regulatory environment that includes the adoption of mandatory lead-free requirements in a variety of countries, the book’s explanations of high-temperature, low-temperature, and high-reliability lead-free alloys in terms of process and reliability implications are invaluable to working engineers. Lead-free Soldering takes a forward-looking approach, with an eye towards developments likely to impact the industry in the coming years. These will include the introduction of lead-free requirements in high-reliability electronics products in the medical, automotive, and defense industries. The book provides practitioners in these and other segments of the industry with guidelines and information to help comply with these requirements.
Author: Yan Liu
Publisher: John Wiley & Sons
ISBN: 1119287987
Category : Technology & Engineering
Languages : en
Pages : 284
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Book Description
Demonstrates how to solve reliability problems using practical applications of Bayesian models This self-contained reference provides fundamental knowledge of Bayesian reliability and utilizes numerous examples to show how Bayesian models can solve real life reliability problems. It teaches engineers and scientists exactly what Bayesian analysis is, what its benefits are, and how they can apply the methods to solve their own problems. To help readers get started quickly, the book presents many Bayesian models that use JAGS and which require fewer than 10 lines of command. It also offers a number of short R scripts consisting of simple functions to help them become familiar with R coding. Practical Applications of Bayesian Reliability starts by introducing basic concepts of reliability engineering, including random variables, discrete and continuous probability distributions, hazard function, and censored data. Basic concepts of Bayesian statistics, models, reasons, and theory are presented in the following chapter. Coverage of Bayesian computation, Metropolis-Hastings algorithm, and Gibbs Sampling comes next. The book then goes on to teach the concepts of design capability and design for reliability; introduce Bayesian models for estimating system reliability; discuss Bayesian Hierarchical Models and their applications; present linear and logistic regression models in Bayesian Perspective; and more. Provides a step-by-step approach for developing advanced reliability models to solve complex problems, and does not require in-depth understanding of statistical methodology Educates managers on the potential of Bayesian reliability models and associated impact Introduces commonly used predictive reliability models and advanced Bayesian models based on real life applications Includes practical guidelines to construct Bayesian reliability models along with computer codes for all of the case studies JAGS and R codes are provided on an accompanying website to enable practitioners to easily copy them and tailor them to their own applications Practical Applications of Bayesian Reliability is a helpful book for industry practitioners such as reliability engineers, mechanical engineers, electrical engineers, product engineers, system engineers, and materials scientists whose work includes predicting design or product performance.
