Author: Wendong Zhang
Publisher:
ISBN: 9781118717974
Category : TECHNOLOGY & ENGINEERING
Languages : en
Pages :
Book Description
Measurement Technology for Micro-nanometer Devices
Author: Wendong Zhang
Publisher:
ISBN: 9781118717974
Category : TECHNOLOGY & ENGINEERING
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9781118717974
Category : TECHNOLOGY & ENGINEERING
Languages : en
Pages :
Book Description
Measurement Technology for Micro-Nanometer Devices
Author: Wendong Zhang
Publisher: John Wiley & Sons
ISBN: 1118717961
Category : Technology & Engineering
Languages : en
Pages : 341
Book Description
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Publisher: John Wiley & Sons
ISBN: 1118717961
Category : Technology & Engineering
Languages : en
Pages : 341
Book Description
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Measurement Technology for Micro-Nanometer Devices
Author: Daniel Anthony
Publisher: Createspace Independent Publishing Platform
ISBN: 9781548115760
Category :
Languages : en
Pages : 334
Book Description
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale - Highlights the advanced research work from industry and academia in micro-nano devices test technology - Written at both introductory and advanced levels, provides the fundamentals and theories - Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Publisher: Createspace Independent Publishing Platform
ISBN: 9781548115760
Category :
Languages : en
Pages : 334
Book Description
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale - Highlights the advanced research work from industry and academia in micro-nano devices test technology - Written at both introductory and advanced levels, provides the fundamentals and theories - Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Measurement Technology and Intelligent Instruments VIII
Author: Wei Gao
Publisher: Trans Tech Publications Ltd
ISBN: 3038131830
Category : Technology & Engineering
Languages : en
Pages : 674
Book Description
Volume is indexed by Thomson Reuters BCI (WoS). Measurement, rigorously defined as ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering. This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology,precision measurements,online and in-process measurements,surface metrology,optical metrology and image processing,bio-measurement, sensor technology,intelligent measurement and instrumentation,uncertainty, traceability and calibration and signal-processing algorithms.
Publisher: Trans Tech Publications Ltd
ISBN: 3038131830
Category : Technology & Engineering
Languages : en
Pages : 674
Book Description
Volume is indexed by Thomson Reuters BCI (WoS). Measurement, rigorously defined as ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering. This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology,precision measurements,online and in-process measurements,surface metrology,optical metrology and image processing,bio-measurement, sensor technology,intelligent measurement and instrumentation,uncertainty, traceability and calibration and signal-processing algorithms.
Nanoscale Calibration Standards and Methods
Author: Günter Wilkening
Publisher: John Wiley & Sons
ISBN: 3527606874
Category : Technology & Engineering
Languages : en
Pages : 541
Book Description
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Publisher: John Wiley & Sons
ISBN: 3527606874
Category : Technology & Engineering
Languages : en
Pages : 541
Book Description
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Optical Test and Measurement Technology and Equipment
Author:
Publisher:
ISBN:
Category : Measurement
Languages : en
Pages : 576
Book Description
Publisher:
ISBN:
Category : Measurement
Languages : en
Pages : 576
Book Description
Measurement Technology and Intelligent Instruments IX
Author: Yuri Chugui
Publisher: Trans Tech Publications
ISBN: 9780878492732
Category : Engineering instruments
Languages : en
Pages : 0
Book Description
A collection that focuses on measurement science and metrology: micro- and nano-measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, and terahertz technologies for science, industry and biomedicine.
Publisher: Trans Tech Publications
ISBN: 9780878492732
Category : Engineering instruments
Languages : en
Pages : 0
Book Description
A collection that focuses on measurement science and metrology: micro- and nano-measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, and terahertz technologies for science, industry and biomedicine.
Semiconductor Measurement Technology. 35
Author: J. R. Devaney
Publisher:
ISBN:
Category :
Languages : en
Pages : 48
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 48
Book Description
Second International Symposium on Measurement Technology and Intelligent Instruments
Author: Zhu Li
Publisher:
ISBN:
Category : Detectors
Languages : en
Pages : 730
Book Description
Publisher:
ISBN:
Category : Detectors
Languages : en
Pages : 730
Book Description
Micro-nano Technology Xvii-xviii - Proceedings Of The 17th-18th Annual Conference And 6th-7th International Conference Of The Chinese Society Of Micro/nano Technology
Author: Zheng You
Publisher: World Scientific
ISBN: 9813232811
Category : Technology & Engineering
Languages : en
Pages : 392
Book Description
This book collects selected papers from the 17th and 18th Annual Conference of the Chinese Society of Micro/Nano Technology (CSMNT2015 and CSMNT2016).The papers cover various fields, like Micro/Nano Transducer/Robot, Microfluidic Devices and Systems, Micro/Nano Fabrication & Measurement Technologies, Microfluidics and Nano Fluids, Nano Material Research/Nanotube/Nanowire Devices, MEMS/NENS and Applications, Nanometer Biological/Nano Medicine, Packaging Technology. All the papers are written by Chinese researchers. From this book, you can have an overview of research of MEMS and nano technology in China. The reader can be researchers, graduate students, and engineers who are working in the field of MEMS and nano technology.
Publisher: World Scientific
ISBN: 9813232811
Category : Technology & Engineering
Languages : en
Pages : 392
Book Description
This book collects selected papers from the 17th and 18th Annual Conference of the Chinese Society of Micro/Nano Technology (CSMNT2015 and CSMNT2016).The papers cover various fields, like Micro/Nano Transducer/Robot, Microfluidic Devices and Systems, Micro/Nano Fabrication & Measurement Technologies, Microfluidics and Nano Fluids, Nano Material Research/Nanotube/Nanowire Devices, MEMS/NENS and Applications, Nanometer Biological/Nano Medicine, Packaging Technology. All the papers are written by Chinese researchers. From this book, you can have an overview of research of MEMS and nano technology in China. The reader can be researchers, graduate students, and engineers who are working in the field of MEMS and nano technology.