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Author: National Science and Technology Council (U.S.). Interagency Working Group on Manufacturing Research and Development
Publisher:
ISBN:
Category : Metrology
Languages : en
Pages : 131
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Book Description
Author: National Science and Technology Council (U.S.). Interagency Working Group on Manufacturing Research and Development
Publisher:
ISBN:
Category : Metrology
Languages : en
Pages : 131
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Book Description
Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819487155
Category : Microfabrication
Languages : en
Pages : 132
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Book Description
Includes Proceedings Vol. 7821
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Michael T. Postek
Publisher:
ISBN: 9780819491831
Category : Microfabrication
Languages : en
Pages : 194
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Book Description
Includes Proceedings Vol. 7821
Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819482631
Category : Microfabrication
Languages : en
Pages : 178
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Book Description
Includes Proceedings Vol. 7821
Author: Michael T. Postek
Publisher: Society of Photo Optical
ISBN: 9780819472625
Category : Technology & Engineering
Languages : en
Pages : 200
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Book Description
Includes Proceedings Vol. 7821
Author: Michael T. Postek
Publisher:
ISBN: 9780819496690
Category : Technology & Engineering
Languages : en
Pages : 110
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Book Description
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Author: Waldemar Nawrocki
Publisher: Springer
ISBN: 3030196771
Category : Technology & Engineering
Languages : en
Pages : 326
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Book Description
This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency. The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia. This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices – atomic clocks – serve wide population of users.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Günter Wilkening
Publisher: John Wiley & Sons
ISBN: 3527606874
Category : Technology & Engineering
Languages : en
Pages : 541
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Book Description
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
