Author: Michael T. PostekPublisher: SPIE-International Society for Optical Engineering
ISBN: 9780819487155
Category : Microfabrication
Languages : en
Pages : 132
Book Description
Includes Proceedings Vol. 7821
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
Author: Michael T. PostekPublisher: SPIE-International Society for Optical Engineering
ISBN: 9780819487155
Category : Microfabrication
Languages : en
Pages : 132
Book Description
Includes Proceedings Vol. 7821
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI
Author: Michael T. PostekPublisher:
ISBN: 9780819491831
Category : Microfabrication
Languages : en
Pages : 194
Book Description
Includes Proceedings Vol. 7821
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
Author: Michael T. PostekPublisher:
ISBN: 9780819496690
Category : Technology & Engineering
Languages : en
Pages : 110
Book Description
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Author: Michael T. PostekPublisher:
ISBN: 9781628412000
Category : Microfabrication
Languages : en
Pages : 277
Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Nanomanufacturing and Nanomaterials Design
Author: Subhash SinghPublisher: CRC Press
ISBN: 1000804208
Category : Technology & Engineering
Languages : en
Pages : 293
Book Description
Nanomanufacturing includes bottom-up or top-down techniques, each of which gives an advanced, reliable, scaled-up, and economical methods in the production of nanomaterials. The text discusses fundamental concepts, advanced topics, and applications of nanomanufacturing in a comprehensive manner. Features Discussion of the design and fabrication of nano- and micro-devices in a comprehensive manner. Covers nanofabrication techniques for photovoltaics applications. Lists constitutive modelling and simulation of multifunctional nanomaterials. Introduces nanomanufacturing of nanorobots and their industrial applications. Presents nanomanufacturing of a high-performance piezoelectric nanogenerator for energy harvesting. Important topics include nanomanufacturing of high-performance piezoelectric nanogenerators for energy harvesting, nanosensor, nanorobots, nanomedicine, nano diagnostic tools, 3D nano printing, additive nanomanufacturing of functional materials for human‐integrated smart wearables, and nanofabrication techniques. Nanomanufacturing and Nanomaterials Design covers the latest applications of nanomanufacturing for a better understanding of the concepts. The text provides scientific and technological insights on novel routes of design and fabrication of few-layered nanostructures and their heterostructures based on a variety of advanced materials. It will be a valuable resource for senior undergraduate, graduate students and researchers in the fields of mechanical, manufacturing, industrial, production engineering and materials science.
Instrumentation, Metrology, and Standards for Nanomanufacturing II
Author: Michael T. PostekPublisher: Society of Photo Optical
ISBN: 9780819472625
Category : Technology & Engineering
Languages : en
Pages : 200
Book Description
Includes Proceedings Vol. 7821
Metrology and Diagnostic Techniques for Nanoelectronics
Author: Zhiyong MaPublisher: CRC Press
ISBN: 135173394X
Category : Science
Languages : en
Pages : 843
Book Description
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Instrumentation, Metrology, and Standards for Nanomanufacturing IV
Author: Michael T. PostekPublisher: SPIE-International Society for Optical Engineering
ISBN: 9780819482631
Category : Microfabrication
Languages : en
Pages : 178
Book Description
Includes Proceedings Vol. 7821
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