Infrared Ellipsometry on Semiconductor Layer Structures PDF Download
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Author: Mathias Schubert
Publisher: Springer Science & Business Media
ISBN: 9783540232490
Category : Science
Languages : en
Pages : 216
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Book Description
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
Author: Mathias Schubert
Publisher: Springer Science & Business Media
ISBN: 9783540232490
Category : Science
Languages : en
Pages : 216
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Book Description
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
Author: Arnulf Röseler
Publisher: VCH
ISBN:
Category : Ellipsometry
Languages : en
Pages : 168
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Book Description
Author: Harland G. Tompkins
Publisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 138
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Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
ISBN: 9780470060186
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Author: Maria Losurdo
Publisher: Springer Science & Business Media
ISBN: 3642339565
Category : Technology & Engineering
Languages : en
Pages : 740
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Book Description
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Author: Mitsuo Tasumi
Publisher: John Wiley & Sons
ISBN: 047066567X
Category : Science
Languages : en
Pages : 403
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Book Description
Infrared spectroscopy is generally understood to mean the science of spectra relating to infrared radiation, namely electromagnetic waves, in the wavelength region occurring intermediately between visible light and microwaves. Measurements of infrared spectra have been providing useful information, for a variety of scientific research and industrial studies, for over half a century; this is set to continue in the foreseeable future. Introduction to Experimental Infrared Spectroscopy is intended to be a handy guide for those who have no, or limited, experience in infrared spectroscopic measurements but are utilising infrared-related methods for their research or in practical applications. Written by leading researchers and experienced practitioners, this work consists of 22 chapters and presents the basic theory, methodology and practical measurement methods, including ATR, photoacoustic, IR imaging, NIR, 2D-COS, and VCD. The six Appendices will aid readers in understanding the concepts presented in the main text. Written in an easy-to-understand way this book is suitable for students, researchers and technicians working with infrared spectroscopy and related methods.
Author: Pierre-Richard Dahoo
Publisher: John Wiley & Sons
ISBN: 1786306522
Category : Science
Languages : en
Pages : 322
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Book Description
This book, Volume 4 in the series, is dedicated to the relationship between laboratory spectroscopy, recording ever-more-complex spectra using increasingly powerful instruments benefiting from the latest technology, and the development of observation using instruments that are embedded in mobile probes or nanosatellites. The theoretical models described in Volumes 1, 2 and 3 are used in this volume, applying the cumulant theorem in the mean-field theory framework to interpret the near and mid-infrared spectra of symmetric top molecules, such as ammonia (NH3) and spherical molecules, such as methane (CH4). These molecules can be isolated in their gaseous form or subjected to the environmental constraints of a nano-cage (a substitution site, clathrate, fullerene or zeolite) or surfaces. These methods are not only valuable in the fields of environmental sciences, planetology and astrophysics, but also fit into the framework of data processing and the concept of Big Data.
Author: Karsten Hinrichs
Publisher: Springer Science & Business Media
ISBN: 3642401287
Category : Science
Languages : en
Pages : 369
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Book Description
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Author: H. Ishida
Publisher: Springer Science & Business Media
ISBN: 1468477765
Category : Science
Languages : en
Pages : 447
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Book Description
This book contains the proceedings of the Symposium on FT-IR Characterization of Polymers, which was held under the auspices of the Division of Polymer Chemistry, American Chemical Society (ACS) during the annual ACS meeting in Philadelphia, August, 1984. The content of each paper has been substantially extended from the papers presented during the conference. Due to the accidental, irrecoverable loss of the entire contents of the book by the computer system used for editorial purposes, the publication of this book has been delayed more than one year over the initial scheduled date. It has been a continuous, frustrating experience for the editor as well as for the authors. An extended Murphy's law, -anything can go wrong goes multiply wrong- has been demonstrated in editor's office. It necessitated, otherwise unnecessary, repeated proof reading during which time the editor had valuable experience ~n familiarizing himself with each paper much more than usual. The papers in this book are state-of-the-art even after such a delay. It is the authors pride and integrity toward the quality of each paper that makes the value of this book long lasting, while responsibility of the loss of any timeliness rests at the editor's hand. For the purpose of official records, submission and acceptance dates must be stated. All papers had been submitted by September, 1984, and had been accepted for publication by November, 1984, after the critical review processes.
Author: Karsten Hinrichs
Publisher: Springer
ISBN: 3319758950
Category : Science
Languages : en
Pages : 549
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Book Description
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
