Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy PDF Download
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Author: Philip Moriarty
Publisher: Springer
ISBN: 3319174010
Category : Science
Languages : en
Pages : 169
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Book Description
Imaging and Manipulation of Adsorbates using Dynamic Force Microscopy provides an overview of the latest developments in dynamic force microscopy (DFM) of atoms, molecules, and nanoparticles adsorbed on solid surfaces. Significant advances in the capabilities of this technique have been made in the last decade and this book represents a timely snapshot of the major research themes in the field, with a particular focus on the manipulation of matter at the atomic and (sub)molecular levels. This edited volume will be of keen interest to researchers active in nanoscience and its various sub-fields including, in particular, scanning probe microscopy. This book expands on the previous volumes in the series Advances in Atom and Single Molecule Machines. DFM is an exceptionally powerful tool for the imaging and probing of adsorbates on insulators and is now a component of the type of multiprobe interconnection systems described in Vol. 1 of the series. DFM can also be used to translate atoms and molecules in the context of the fabrication of the type of logic gates described in Vol. 2. When used in conjunction with STM, DFM also enables a detailed comparison of the chemical ‘architecture’ of a molecule with the spatial distribution of its orbital density, as described in Vol. 3. In this book readers will gain key insights into the current capabilities, and future potential, of dynamic force microscopy.
Author: Philip Moriarty
Publisher: Springer
ISBN: 3319174010
Category : Science
Languages : en
Pages : 169
Get Book Here
Book Description
Imaging and Manipulation of Adsorbates using Dynamic Force Microscopy provides an overview of the latest developments in dynamic force microscopy (DFM) of atoms, molecules, and nanoparticles adsorbed on solid surfaces. Significant advances in the capabilities of this technique have been made in the last decade and this book represents a timely snapshot of the major research themes in the field, with a particular focus on the manipulation of matter at the atomic and (sub)molecular levels. This edited volume will be of keen interest to researchers active in nanoscience and its various sub-fields including, in particular, scanning probe microscopy. This book expands on the previous volumes in the series Advances in Atom and Single Molecule Machines. DFM is an exceptionally powerful tool for the imaging and probing of adsorbates on insulators and is now a component of the type of multiprobe interconnection systems described in Vol. 1 of the series. DFM can also be used to translate atoms and molecules in the context of the fabrication of the type of logic gates described in Vol. 2. When used in conjunction with STM, DFM also enables a detailed comparison of the chemical ‘architecture’ of a molecule with the spatial distribution of its orbital density, as described in Vol. 3. In this book readers will gain key insights into the current capabilities, and future potential, of dynamic force microscopy.
Author: Philip Moriarty
Publisher:
ISBN: 9783319174020
Category :
Languages : en
Pages :
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Book Description
Imaging and Manipulation of Adsorbates using Dynamic Force Microscopy provides an overview of the latest developments in dynamic force microscopy (DFM) of atoms, molecules, and nanoparticles adsorbed on solid surfaces. Significant advances in the capabilities of this technique have been made in the last decade and this book represents a timely snapshot of the major research themes in the field, with a particular focus on the manipulation of matter at the atomic and (sub)molecular levels. This edited volume will be of keen interest to researchers active in nanoscience and its various sub-fields including, in particular, scanning probe microscopy. This book expands on the previous volumes in the series Advances in Atom and Single Molecule Machines.
Author: Bharat Bhushan
Publisher: Springer
ISBN: 3662543575
Category : Technology & Engineering
Languages : en
Pages : 1704
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Book Description
This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates a number of recent new developments. It integrates nanofabrication, nanomaterials, nanodevices, nanomechanics, nanotribology, materials science, and reliability engineering knowledge in just one volume. Furthermore, it discusses various nanostructures; micro/nanofabrication; micro/nanodevices and biomicro/nanodevices, as well as scanning probe microscopy; nanotribology and nanomechanics; molecularly thick films; industrial applications and nanodevice reliability; societal, environmental, health and safety issues; and nanotechnology education. In this new edition, written by an international team of over 140 distinguished experts and put together by an experienced editor with a comprehensive understanding of the field, almost all the chapters are either new or substantially revised and expanded, with new topics of interest added. It is an essential resource for anyone working in the rapidly evolving field of key technology, including mechanical and electrical engineers, materials scientists, physicists, and chemists.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 364215283X
Category : Technology & Engineering
Languages : en
Pages : 633
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Book Description
The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
Author: Andrew J. Mayne
Publisher: Elsevier
ISBN: 0080963552
Category : Science
Languages : en
Pages : 168
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Book Description
Work with individual atoms and molecules aims to demonstrate that miniaturized electronic, optical, magnetic, and mechanical devices can operate ultimately even at the level of a single atom or molecule. As such, atomic and molecular manipulation has played an emblematic role in the development of the field of nanoscience. New methods based on the use of the scanning tunnelling microscope (STM) have been developed to characterize and manipulate all the degrees of freedom of individual atoms and molecules with an unprecedented precision. In the meantime, new concepts have emerged to design molecules and substrates having specific optical, mechanical and electronic functions, thus opening the way to the fabrication of real nano-machines. Manipulation of individual atoms and molecules has also opened up completely new areas of research and knowledge, raising fundamental questions of "Optics at the atomic scale", "Mechanics at the atomic scale", Electronics at the atomic scale", "Quantum physics at the atomic scale", and "Chemistry at the atomic scale". This book aims to illustrate the main aspects of this ongoing scientific adventure and to anticipate the major challenges for the future in "Atomic and molecular manipulation" from fundamental knowledge to the fabrication of atomic-scale devices. Provides a broad overview of the field to aid those new and entering into this research area Presents a review of the historical development and evolution of the field Offers a clear personalized view of current scanning probe microscopy research from world experts
Author: Seizo Morita
Publisher: Springer
ISBN: 3319155881
Category : Science
Languages : en
Pages : 539
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Book Description
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
Author: S. Morita
Publisher: Springer Science & Business Media
ISBN: 9783540431176
Category : Mathematics
Languages : en
Pages : 468
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Book Description
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Author: D. P. Woodruff
Publisher: Cambridge University Press
ISBN: 9780521424981
Category : Science
Languages : en
Pages : 612
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Book Description
Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.
Author: Umberto Celano
Publisher: Springer
ISBN: 3030156125
Category : Science
Languages : en
Pages : 424
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Book Description
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
Author: Jacques Jupille
Publisher: Springer
ISBN: 3319143670
Category : Science
Languages : en
Pages : 472
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Book Description
This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides. Numerical simulations of defective structures complete the picture developed. Defects on planar surfaces form the focus of much of the book, although the investigation of powder samples also form an important part. The experimental study of planar surfaces opens the possibility of applying the large armoury of techniques that have been developed over the last half-century to study surfaces in ultra-high vacuum. This enables the acquisition of atomic level data under well-controlled conditions, providing a stringent test of theoretical methods. The latter can then be more reliably applied to systems such as nanoparticles for which accurate methods of characterization of structure and electronic properties have yet to be developed. The book gives guidance to tailor oxide surfaces by controlling the nature and concentration of defects. The importance of defects in the physics and chemistry of metal oxide surfaces is presented in this book together with the prominent role of oxides in common life. The book contains contributions from leaders in the field. It serves as a reference for experts and beginners in the field.
