Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
Get Book Here
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: Burkhard Beckhoff
Publisher: Springer
ISBN: 9783540286035
Category : Science
Languages : en
Pages : 863
Get Book Here
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: Victor E. Buhrke
Publisher: Wiley-VCH
ISBN: 9780471194583
Category : Science
Languages : en
Pages : 0
Get Book Here
Book Description
The first hands-on guide to XRD and XRF sampling and specimen preparation Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume. This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips. With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort. Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials * Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more * Features special chapters on specimen preparation equipment and XRF standards * Contains useful bibliography and helpful references.
Author: Rene Van Grieken
Publisher: CRC Press
ISBN: 9780203908709
Category : Science
Languages : en
Pages : 1016
Get Book Here
Book Description
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Author: Günter H. Zschornack
Publisher: Springer Science & Business Media
ISBN: 3540286187
Category : Technology & Engineering
Languages : en
Pages : 969
Get Book Here
Book Description
This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.
Author: E.P. Bertin
Publisher: Springer Science & Business Media
ISBN: 1461344166
Category : Science
Languages : en
Pages : 1098
Get Book Here
Book Description
Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.
Author: P.J. Potts
Publisher: Springer Science & Business Media
ISBN: 940153988X
Category : Science
Languages : en
Pages : 633
Get Book Here
Book Description
without an appreciation of what happens in between. The techniques available for the chemical analysis of silicate rocks have undergone a revolution over the last 30 years. However, to use an analytical technique most effectively, No longer is the analytical balance the only instrument used it is essential to understand its analytical characteristics, in for quantitative measurement, as it was in the days of classi particular the excitation mechanism and the response of the cal gravimetric procedures. A wide variety of instrumental signal detection system. In this book, these characteristics techniques is now commonly used for silicate rock analysis, have been described within a framework of practical ana lytical aplications, especially for the routine multi-element including some that incorporate excitation sources and detec tion systems that have been developed only in the last few analysis of silicate rocks. All analytical techniques available years. These instrumental developments now permit a wide for routine silicate rock analysis are discussed, including range of trace elements to be determined on a routine basis. some more specialized procedures. Sufficient detail is In parallel with these exciting advances, users have tended included to provide practitioners of geochemistry with a firm to become more remote from the data production process. base from which to assess current performance, and in some This is, in part, an inevitable result of the widespread intro cases, future developments.
Author: Aniko Bezur
Publisher:
ISBN: 9781937433628
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author: James W. Robinson
Publisher: CRC Press
ISBN: 9780849337086
Category : Science
Languages : en
Pages : 958
Get Book Here
Book Description
A convenient single volume handbook featuring the most important topics in spectroscopy This valuable handbook is based on topics presented in the CRC Handbook of Spectroscopy, Volumes I and II, published in 1974, and Volume III, published in 1981. The information has been condensed (by the original contributor, when possible) so that only the most important information from the original three volumes has been retained and updated. The topics covered include ESCA flame photometry; atomic absorption and emission spectroscopy, including plasma emission; infrared spectroscopy; Raman spectroscopy; ultraviolet absorption spectroscopy; electron spin resonance, X-ray spectroscopy, mass photoelectric absorption coefficients, appearance potential spectroscopy, thermal neutron cross sections and resonance integrals for activation analysis, tables of experimental values of X-ray fluorescence and Coster-Kronig yields for the K-, L-, and M-shells. Other topics include 14 MeV neutron activation cross sections; wavelength standards in visible, ultraviolet, and near-infrared spectroscopy; electron affinities, wavelength-dependent and electronic system oscillator strengths for free diatomic molecules of astrophysical importance; electron spin resonance applicaton to the study of minerals and glasses; experimental lifetimes, Franck-Condon factors; and vibrational and rotational oscillator strengths. The concise format and wealth of information ensures that no spectroscopist will want to be without the updated and revised Practical Handbook of Spectroscopy.
Author: M. Steven Shackley
Publisher: Springer Science & Business Media
ISBN: 1441968865
Category : Social Science
Languages : en
Pages : 244
Get Book Here
Book Description
Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come. Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide. The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems. It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.
