Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse PDF Download
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Author: Gottfried Möllenstedt
Publisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : de
Pages : 624
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Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Author: Gottfried Möllenstedt
Publisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : de
Pages : 624
Get Book Here
Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Author: Abrams H.
Publisher: ASTM International
ISBN: 9780803105102
Category : Technology & Engineering
Languages : en
Pages : 244
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Category : Physical instruments
Languages : en
Pages : 136
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Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages :
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First multi-year cumulation covers six years: 1965-70.
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ISBN:
Category : Weights and measures
Languages : en
Pages : 726
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Author: Jan W. Gooch
Publisher: Springer Science & Business Media
ISBN: 0306469081
Category : Technology & Engineering
Languages : en
Pages : 346
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Book Description
This practical resource provides chemists, formulators, forensic scientists, teachers, and students with the latest information on the composition of polymeric materials. After a discussion of principles, chapters cover formulations, materials, and analysis of paint, plastic, and adhesives and describe reformulation methods to test analysis results. A detailed table of contents and extensive index with listings of relevant materials allows readers easy access to topics. Other features include various materials listed according to their trivial, trade, and scientific names cross-referenced for easy identification.
Author: Philip F. Kane
Publisher: Springer Science & Business Media
ISBN: 1461344905
Category : Technology & Engineering
Languages : en
Pages : 675
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Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
Author: R. Good
Publisher: Springer Science & Business Media
ISBN: 1461579694
Category : Science
Languages : en
Pages : 354
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Surface science and colloid science are preeminently experimental subjects. They constitute complementary aspects of a field which has been notably active since World War II; there is every reason to expect that the level of activity will continue to rise in the coming decades, so it is timely to review certain experimental methods of surface and colloid science as they exist, and to evaluate and refine those methods. This volume, and others that will follow, are principally concerned with experimental methods. The working scientist needs access to the latest techniques, of course. He also needs to learn of the potentialities of recently developed techniques which he may not have been aware of. Equally important, or perhaps even more so, he needs to learn of the pitfalls of existing methods. One might say, wistfully, that it would be nice to be able to pick up somebody's description of a new piece of apparatus, to go into the laboratory, to build it, and to have it work, the first time! There is, however, a serious problem of the interaction between the experiment per se and the theory for which the experiment is designed. Very often, this interaction renders problematic the interpretation of "direct" observations. An example, from experience of the senior editor of this volume, is the question of contact angle hysteresis. (See Chapters 1 and 2.
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Category : Bioengineering
Languages : en
Pages : 248
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Author: United States. National Bureau of Standards
Publisher:
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Category : Weights and measures
Languages : en
Pages : 264
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