Ellipsometry in the Measurement of Surfaces and Thin Films PDF Download
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Author: Elio Passaglia
Publisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 366
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Book Description
Author: E. Passaglia
Publisher:
ISBN:
Category :
Languages : en
Pages : 359
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Book Description
Author: Elio Passaglia
Publisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 366
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Book Description
Author: Elio Passaglia
Publisher:
ISBN:
Category : Polarization (Light)
Languages : en
Pages : 0
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category :
Languages : en
Pages : 200
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 359
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Book Description
Author: E. Passaglia
Publisher: Forgotten Books
ISBN: 9780266786931
Category :
Languages : en
Pages : 370
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Book Description
Excerpt from Ellipsometry in the Measurement of Surfaces and Thin Films: Symposium Proceedings, Washington 1963; Symposium Held September 5-6, 1963, at the National Bureau of Standards, Washington, D. C Although the theory and equations of Drude are exact, the exact equations are cumbersome in form. 'they cannot be solved in closed form for the desired quantities (refractive index and thickness of film) in terms of the measured change in state of polarization, as represented by tan ill, the ratio of the magnitude of the reflection coefficient for light polarized in the plane of incidence to that polarized normal to the plane of incidence, and A, the relative phase difference for these two polarizations. Thus trial-and-error and iteration meth ods must be used, and before the availability of electronic computers the routine application of the exact equations was almost impossible. Thus Drude and many subsequent workers used only the first linear terms in the expansion of the equations relating tangb and A to refrac tive index and thickness, and it is these approximate equations which are (unfortunately) often referred to as the Drude equations. This limited the application of the Drude theory to films which are very thin in comparison to the wavelength of light. However, With modern electronic computers the use of the exact equations is routine, once the initial programming is complete. Most workers have some kind of computational facilities, and programs have been described by Archer [2] and mccrackin et al. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author: E. Passaglia
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Author: Harland G. Tompkins
Publisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 138
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Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Author: U.s. national bureau of standards. p
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Author: Karsten Hinrichs
Publisher: Springer
ISBN: 3319758950
Category : Science
Languages : en
Pages : 549
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Book Description
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
