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Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 9783540405191
Category : Science
Languages : en
Pages : 588
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 9783540405191
Category : Science
Languages : en
Pages : 588
Get Book Here
Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517
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Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Author: Robert L. Snyder
Publisher: International Union of Crystal
ISBN: 9780198501893
Category : Science
Languages : en
Pages : 785
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Book Description
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Author: Gubicza, Jen?
Publisher: IGI Global
ISBN: 1466658533
Category : Technology & Engineering
Languages : en
Pages : 359
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Book Description
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author: E. J. Mittemeijer
Publisher: John Wiley & Sons
ISBN: 3527649905
Category : Science
Languages : en
Pages : 563
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Book Description
The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).
Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 1475732058
Category : Technology & Engineering
Languages : en
Pages : 352
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Book Description
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Author: Eric J. Mittemeijer
Publisher: Springer Nature
ISBN: 3030600564
Category : Technology & Engineering
Languages : en
Pages : 754
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Book Description
This textbook offers a strong introduction to the fundamental concepts of materials science. It conveys the quintessence of this interdisciplinary field, distinguishing it from merely solid-state physics and solid-state chemistry, using metals as model systems to elucidate the relation between microstructure and materials properties. Mittemeijer's Fundamentals of Materials Science provides a consistent treatment of the subject matter with a special focus on the microstructure-property relationship. Richly illustrated and thoroughly referenced, it is the ideal adoption for an entire undergraduate, and even graduate, course of study in materials science and engineering. It delivers a solid background against which more specialized texts can be studied, covering the necessary breadth of key topics such as crystallography, structure defects, phase equilibria and transformations, diffusion and kinetics, and mechanical properties. The success of the first edition has led to this updated and extended second edition, featuring detailed discussion of electron microscopy, supermicroscopy and diffraction methods, an extended treatment of diffusion in solids, and a separate chapter on phase transformation kinetics. “In a lucid and masterly manner, the ways in which the microstructure can affect a host of basic phenomena in metals are described.... By consistently staying with the postulated topic of the microstructure - property relationship, this book occupies a singular position within the broad spectrum of comparable materials science literature .... it will also be of permanent value as a reference book for background refreshing, not least because of its unique annotated intermezzi; an ambitious, remarkable work.” G. Petzow in International Journal of Materials Research. “The biggest strength of the book is the discussion of the structure-property relationships, which the author has accomplished admirably.... In a nutshell, the book should not be looked at as a quick ‘cook book’ type text, but as a serious, critical treatise for some significant time to come.” G.S. Upadhyaya in Science of Sintering. “The role of lattice defects in deformation processes is clearly illustrated using excellent diagrams . Included are many footnotes, ‘Intermezzos’, ‘Epilogues’ and asides within the text from the author’s experience. This ..... soon becomes valued for the interesting insights into the subject and shows the human side of its history. Overall this book provides a refreshing treatment of this important subject and should prove a useful addition to the existing text books available to undergraduate and graduate students and researchers in the field of materials science.” M. Davies in Materials World.
Author: Karen Scrivener
Publisher: CRC Press
ISBN: 1498738672
Category : Technology & Engineering
Languages : en
Pages : 531
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Book Description
A Practical Guide from Top-Level Industry Scientists As advanced teaching and training in the development of cementitious materials increase, the need has emerged for an up-to-date practical guide to the field suitable for graduate students and junior and general practitioners. Get the Best Use of Different Techniques and Interpretations of the Results This edited volume provides the cement science community with a state-of-the-art overview of analytical techniques used in cement chemistry to study the hydration and microstructure of cements. Each chapter focuses on a specific technique, not only describing the basic principles behind the technique, but also providing essential, practical details on its application to the study of cement hydration. Each chapter sets out present best practice, and draws attention to the limitations and potential experimental pitfalls of the technique. Databases that supply examples and that support the analysis and interpretation of the experimental results strengthen a very valuable ready reference. Utilizing the day-to-day experience of practical experts in the field, this book: Covers sample preparation issues Discusses commonly used techniques for identifying and quantifying the phases making up cementitious materials (X-ray diffraction and thermogravimetric analysis) Presents good practice oncalorimetry and chemical shrinkage methods for studying cement hydration kinetics Examines two different applications of nuclear magnetic resonance (solid state NMR and proton relaxometry) Takes a look at electron microscopy, the preeminent microstructural characterization technique for cementitious materials Explains how to use and interpret mercury intrusion porosimetry Details techniques for powder characterization of cementitious materials Outlines the practical application of phase diagrams for hydrated cements Avoid common pitfalls by using A Practical Guide to Microstructural Analysis of Cementitious Materials. A one-of-a-kind reference providing the do’s and don’ts of cement chemistry, the book presents the latest research and development of characterisation techniques for cementitious materials, and serves as an invaluable resource for practicing professionals specializing in cement and concrete materials and other areas of cement and concrete technology.
Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
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Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Author: René Guinebretière
Publisher: John Wiley & Sons
ISBN: 1118613953
Category : Technology & Engineering
Languages : en
Pages : 290
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Book Description
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
