Development of an Ultrafast Low-Energy Electron Diffraction Setup PDF Download
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Author: Max Gulde
Publisher: Springer
ISBN: 3319185616
Category : Science
Languages : en
Pages : 149
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Book Description
This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. The achievable temporal resolution in the low-energy regime is improved by several orders of magnitude and has enabled the melting of a highly-sensitive, molecularly thin layer of a polymer crystal to be resolved for the first time. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films. It will be of fundamental importance for understanding the properties of nanomaterials so as to tailor their properties.
Author: Max Gulde
Publisher: Springer
ISBN: 3319185616
Category : Science
Languages : en
Pages : 149
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Book Description
This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. The achievable temporal resolution in the low-energy regime is improved by several orders of magnitude and has enabled the melting of a highly-sensitive, molecularly thin layer of a polymer crystal to be resolved for the first time. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films. It will be of fundamental importance for understanding the properties of nanomaterials so as to tailor their properties.
Author:
Publisher: Academic Press
ISBN: 0128025190
Category : Computers
Languages : en
Pages : 342
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Book Description
Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on all the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing
Author: E. L. Kern
Publisher:
ISBN:
Category : Electrons
Languages : en
Pages : 0
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Book Description
A low energy electron diffraction apparatus has been designed, developed, and constructed and will be used to study the surface condition and structure of single crystal metals and semicon ductors. The electron gun is adapted from a design by Farnsworth, uses a nickel matrix cath ode, and is capable of producing electrons with energies of 20 to several hundred electron volts with currents from 0.1 to 10 microamperes. The electrons diffracted from a surface can be scanned over a majority of an octant (0-75 degree colatitude 0-90 degree azimuth) using the general approach of Farnsworth, and currents as low as 1 times 10 to the -13th power amperes can be measured at the collector. An angle pro grammer has been developed to precisely program the angles to be swept, and the angular motion is transferred through a glass chamber wall by a pair of magnetic couplers. The apparatus and some of its characteristics are described. (Author).
Author: J. B. Pendry
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 424
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Book Description
Author: Michael A. Van Hove
Publisher: Springer
ISBN:
Category : Science
Languages : en
Pages : 632
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Book Description
Author: Ayahiko Ichimiya
Publisher: Cambridge University Press
ISBN: 9780521453738
Category : Science
Languages : en
Pages : 370
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Book Description
Publisher Description
Author: L.-M. Peng
Publisher: Oxford University Press, USA
ISBN: 9780198500742
Category : Science
Languages : en
Pages : 580
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Book Description
This book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.
Author: Paul Pukite
Publisher: Paul Pukite
ISBN: 0964474123
Category :
Languages : en
Pages : 195
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Book Description
Author: Masashi Arita
Publisher: BoD – Books on Demand
ISBN: 1838818820
Category : Science
Languages : en
Pages : 102
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Book Description
TEM and SEM have contributed greatly to the progress of various research fields, which has been accelerated in the last few decades by highly functional electron microscopes and microscopy. In this tide of microscopy, various microscopic methods have been developed to make clear many unsolved problems, e.g. pulse beam TEM, environmental microscopy, correlative microscopy, etc. In this book, a number of reviews have been collected concerning these subjects. We think that the content in each chapter is impressive, and we hope this book will contribute to future advances in electron microscopy, materials science, and biomedicine.
Author: J. B. Pendry
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
