Detection of Grain-boundary Segregation in Steels by SIMS PDF Download
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Languages : en
Pages : 4
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Category :
Languages : en
Pages : 4
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Author: Pavel Lejcek
Publisher: Springer Science & Business Media
ISBN: 3642125050
Category : Technology & Engineering
Languages : en
Pages : 249
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Book Description
Grain boundaries are important structural components of polycrystalline materials used in the vast majority of technical applications. Because grain boundaries form a continuous network throughout such materials, their properties may limit their practical use. One of the serious phenomena which evoke these limitations is the grain boundary segregation of impurities. It results in the loss of grain boundary cohesion and consequently, in brittle fracture of the materials. The current book deals with fundamentals of grain boundary segregation in metallic materials and its relationship to the grain boundary structure, classification and other materials properties.
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Category : Grain boundaries
Languages : en
Pages : 0
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Author: The Minerals, Metals & Materials Society (TMS)
Publisher: John Wiley & Sons
ISBN: 1118356047
Category : Technology & Engineering
Languages : en
Pages : 1046
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Contains papers relating to materials processing andinterfaces presented at various symposia at the 2012 TMSAnnual Meeting.
Author: John C. Riviere
Publisher: CRC Press
ISBN: 1420007807
Category : Science
Languages : en
Pages : 671
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Book Description
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
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Category : Aeronautics
Languages : en
Pages : 994
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Category : Engineering
Languages : en
Pages :
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Category : Power resources
Languages : en
Pages : 834
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Author: Alfred Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642827241
Category : Science
Languages : en
Pages : 578
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Book Description
This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
Author: Ulrich Gonser
Publisher: Springer Science & Business Media
ISBN: 3642465714
Category : Science
Languages : en
Pages : 470
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Book Description
Methods of scientific investigation can be divided into two categories: they are either macroscopic or microscopic in nature. The former are generally older, classical methods where the sample as a whole is studied and various local prop erties are deduced by differentiation. The microscopic methods, on the other hand, have been discovered and developed more recently, and they operate for the most part on an atomistic scale. Glancing through the shelves of books on the various scientific fields, and, in particular, on the field of physical metallurgy, we are surprised at how lit tle consideration has been given to the microscopic methods. How these tools provide new insight and information is a question which so far has not at tracted much attention. Similar observations can be made at scientific confer ences, where the presentation of papers involving microscopic methods is often pushed into a far corner. This has led users of such methods to organize their own special conferences. The aim of this book is to bridge the present gap and encourage more interaction between the various fields of study and selected microscopic meth ods, with special emphasis on their suitability for investigating metals. In each case the principles of the method are reviewed, the advantages and successes pointed out, but also the shortcomings and limitations indicated.
