Design and Performance of an Infrared Spectroscopic Ellipsometer/reflectometer for Thin-film Characterization PDF Download
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Author: Michael Scott Thomas
Publisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 188
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Book Description
Author: Michael Scott Thomas
Publisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 188
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Book Description
Author: Andrew T. S. Wee
Publisher: John Wiley & Sons
ISBN: 3527833951
Category : Technology & Engineering
Languages : en
Pages : 213
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Book Description
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.
Author: JB. Stubbs
Publisher:
ISBN:
Category : Ellipsometer
Languages : en
Pages : 8
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Book Description
The University of Dayton has designed and built an Infrared Ellipsometer/ Reflectometer (E/R) to characterize curved surfaces in support of the ALPHA Laser Program. The instrument is tunable in wavelength and angle of incidence, is remotely controlled by a dedicated microcomputer, is positioned and scanned by a six-degree-of-freedom translation stage, and makes simultaneous measurements of Rp, Rs, ?, and ?.
Author: Francisco Torrens
Publisher: CRC Press
ISBN: 1351741373
Category : Science
Languages : en
Pages : 404
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Book Description
This volume brings together innovative research, new concepts, and novel developments in the application of new tools for chemical and materials engineers. It contains significant research, reporting new methodologies and important applications in the fields of chemical engineering as well as the latest coverage of chemical databases and the development of new methods and efficient approaches for chemists. This authoritative reference source provides the latest scholarly research on the use of applied concepts to enhance the current trends and productivity in chemical engineering. Highlighting theoretical foundations, real-world cases, and future directions, this book is ideally designed for researchers, practitioners, professionals, and students of materials chemistry and chemical engineering. The volume explains and discusses new theories and presents case studies concerning material and chemical engineering. The book is divided into several sections, covering: Advanced Materials Chemoinformatics, Computational Chemistry, and Smart Technologies Analytical and Experimental Techniques
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 27
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Book Description
Spectroscopic ellipsometry is a very powerful technique for optical characterization of thin-film and bulk materials, but the technique measures functions of complex reflection coefficients, which are usually not of interest per se. The interesting characteristics such as film thickness, surface roughness thickness, and optical functions can be determined only by modeling the near-surface region of the sample. However, the measured quantities are not equivalent to those determined from the modeling. Ellipsometry measurements determine elements of the sample Mueller matrix, but the usual result of modeling calculations are elements of the sample. Often this difference is academic, but if the sample depolarizes the light, it is not. Ellipsometry calculations also include methods for determining the optical functions of materials. Data for bulk materials are usually accurate for substrates, but are not appropriate for most thin films. Therefore, reasonable parameterizations are quite useful in performing spectroscopic ellipsometry data analysis. Recently, there has been an increased interest in anisotropic materials, both in thin-film and bulk form. A generalized procedure will be presented for calculating the elements of the Jones matrix for any number of layers, any one of which may or may not be uniaxial.
Author: KG. Harding
Publisher:
ISBN:
Category : Diode laser
Languages : en
Pages : 11
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Book Description
The University of Dayton Research Institute (UDRI) has designed and is building three infrared ellipsometers in support of the Air Force high-energy laser program. One of these instruments is a conventional null type elliposmeter for operation in the 3.39 to 4.00 ?m wavelength range. Ellipsometric parameters are determined with a precision of 0.01° at any angle of incidence from 20° to 85°. Repeatability and absolute accuracy also approach 0.01° which yields optical constants accurate to 0.1 percent in some cases. All components are mounted on removable carriers for easy interchange, although operation is normally in the PCSA (Polarizer, Compensator, Sample, Analyzer) configuration.
Author: Harland G. Tompkins
Publisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 138
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Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Author:
Publisher:
ISBN:
Category : Laser materials
Languages : en
Pages : 424
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Book Description
Author:
Publisher:
ISBN:
Category : Measurement
Languages : en
Pages : 518
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Book Description
Measurement, control, automation.
Author: Harland G. Tompkins
Publisher: Wiley-Interscience
ISBN: 9780471181729
Category : Science
Languages : en
Pages : 0
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Book Description
While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.
