Computer Simulation and Electron Microscopy of Crystalline Interfaces PDF Download
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Author: James Edward Angelo
Publisher:
ISBN:
Category :
Languages : en
Pages : 390
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Book Description
Author: James Edward Angelo
Publisher:
ISBN:
Category :
Languages : en
Pages : 390
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Book Description
Author: L.M Clarebrough
Publisher: Routledge
ISBN: 135145319X
Category : Science
Languages : en
Pages : 446
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Book Description
Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 700
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Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: Argonne National Laboratory. Division of Educational Programs
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 116
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Book Description
Author: Earl J. Kirkland
Publisher: Springer Nature
ISBN: 3030332608
Category : Science
Languages : en
Pages : 357
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Book Description
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 840
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Book Description
Author: A.W. Vere
Publisher: Springer Science & Business Media
ISBN: 1475798970
Category : Science
Languages : en
Pages : 267
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Book Description
This book is the second in a series of scientific textbooks designed to cover advances in selected research fields from a basic and general viewpoint, so that only limited knowledge is required to understand the significance of recent developments. Further assistance for the non-specialist is provided by the summary of abstracts in Part 2, which includes many of the major papers published in the research field. Crystal Growth of Semiconductor Materials has been the subject of numerous books and reviews and the fundamental principles are now well-established. We are concerned chiefly with the deposition of atoms onto a suitable surface - crystal growth - and the generation of faults in the atomic structure during growth and subsequent cooling to room temperature - crystal defect structure. In this book I have attempted to show that whilst the fundamentals of these processes are relatively simple, the complexities of the interactions involved and the individuality of different materials systems and growth processes have ensured that experimentally verifiable predictions from scientific principles have met with only limited success - good crystal growth remains an art. However, recent advances, which include the reduction of growth temperatures, the reduction or elimination of reactant transport variables and the use of better-controlled energy sources to promote specific reactions, are leading to simplified growth systems.
Author: D. Wolf
Publisher: Springer Science & Business Media
ISBN: 9780412412707
Category : Technology & Engineering
Languages : en
Pages : 748
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Book Description
Many of the most important properties of materials in high-technology applications are strongly influenced or even controlled by the presence of solid interfaces. In this work, leading international authorities review the broad range of subjects in this field focusing on the atomic level properties of solid interfaces.
Author: Electron Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 1168
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Book Description
Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 0387765018
Category : Technology & Engineering
Languages : en
Pages : 805
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Book Description
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.
