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Author: Pierre Convert
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 460
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Book Description
Author: Pierre Convert
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 460
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Book Description
Author: M.T. Hutchings
Publisher: CRC Press
ISBN: 1134389809
Category : Science
Languages : en
Pages : 445
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Book Description
Over the past 25 years the field of neutron diffraction for residual stress characterization has grown tremendously, and has matured from the stage of trial demonstrations to provide a practical tool with widespread applications in materials science and engineering. While the literature on the subject has grown commensurately, it has also remained
Author: Redouane Borsali
Publisher: Springer Science & Business Media
ISBN: 140204464X
Category : Science
Languages : en
Pages : 1490
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Book Description
This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.
Author: J. M. Carpenter
Publisher: Cambridge University Press
ISBN: 0521857813
Category : Science
Languages : en
Pages : 539
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Book Description
This book provides a comprehensive and up-to-date introduction to the fundamental theory and applications of slow-neutron scattering.
Author: Yacouba Diawara
Publisher: Springer Nature
ISBN: 3031365461
Category : Science
Languages : en
Pages : 257
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Book Description
This book covers the most common neutron detectors used in neutron scattering facilities and all of those in use at Oak Ridge National Lab. It starts describing the facilities, instruments and the critical detector parameters needed by various instruments. Then the key components of the 3He-based linear position-sensitive detectors as well as on their electronics, which require particular attention to signal processing and noise reduction, are introduced. One chapter is dedicated to the 3He alternatives where scintillators play a critical role. It also covers emerging neutron detection technologies including semiconductors, vacuum-based devices and their associated readouts, which will be required in the future for high rate and high-resolution neutron detectors. The authors explain the logic behind the choice of materials as well as the various constraints that neutron detectors must respect to be useful. Some of these constraints, such as efficiency and gamma-ray sensitivity are common to all neutron counters while others, like timing resolution, dynamic range, and peak counting rate, depend on the applications. The book guides experts, the nuclear science community, and young scholars through the physical processes and the required electronics in a way that is accessible for those not professionally involved in designing detector’s components and electronic circuits.
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 938
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 614
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Book Description
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 332
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Book Description
Author: Surender Kumar Sharma
Publisher: Springer
ISBN: 3319929550
Category : Technology & Engineering
Languages : en
Pages : 612
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Book Description
This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.
Author: United States Department of Energy. Environmental Impacts Division
Publisher:
ISBN:
Category :
Languages : en
Pages : 1224
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Book Description
