An Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition

An Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition PDF Author: Jose Moreira
Publisher: Artech House
ISBN: 1608079864
Category : Technology & Engineering
Languages : en
Pages : 706

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Book Description
This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.

An Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition

An Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition PDF Author: Jose Moreira
Publisher: Artech House
ISBN: 1608079864
Category : Technology & Engineering
Languages : en
Pages : 706

Get Book

Book Description
This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.

An Engineer's Guide to Automated Testing of High-speed Interfaces

An Engineer's Guide to Automated Testing of High-speed Interfaces PDF Author: José Moreira
Publisher: Artech House Publishers
ISBN: 9781607839835
Category : Technology & Engineering
Languages : en
Pages : 566

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Book Description
Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.

RF Circuits and Applications for Practicing Engineers

RF Circuits and Applications for Practicing Engineers PDF Author: Mouqun Dong
Publisher: Artech House
ISBN: 1630816337
Category : Technology & Engineering
Languages : en
Pages : 320

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Book Description
This comprehensive resource explains the theory of RF circuits and systems and the practice of designing them. The fundamentals for linear and low noise amplifier designs, including the S and noise parameters and their applications in amplifier designs and matching network designs using the Smith chart are covered. Theories of RF power amplifiers and high efficiency power amplifiers are also explained. The underpinnings of wireless communications systems as well as passive components commonly used in RF circuits and measurements are discussed. RF measurement techniques and RF switches are also presented. The book explores stability criteria and the invariant property of lossless networks and includes detailed theoretical treatments. The basic concepts and techniques covered in this book are routinely used in today's engineering practice, especially from the perspective of printed circuit board (PCB) based RF circuit design and system integration. Intended for practicing engineers and circuit designers, this book focuses on practical topics in circuit design and measurement techniques. It bridges the gap between academic materials and real circuit designs using real circuit examples and practical tips. Readers develop a numerical feel for RF problems as well as awareness of the concepts of design for cost and design for manufacturing, which is a critical skill set for today's engineers working in an environment of commercial product development.

A Signal Integrity Engineer's Companion

A Signal Integrity Engineer's Companion PDF Author: Geoff Lawday
Publisher: Pearson Education
ISBN: 0132797232
Category : Technology & Engineering
Languages : en
Pages : 650

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Book Description
A Signal Integrity Engineer’s Companion Real-Time Test and Measurement and Design Simulation Geoff Lawday David Ireland Greg Edlund Foreword by Chris Edwards, Editor, IET Electronics Systems and Software magazine Prentice Hall Modern Semiconductor Design Series Prentice Hall Signal Integrity Library Use Real-World Test and Measurement Techniques to Systematically Eliminate Signal Integrity Problems This is the industry’s most comprehensive, authoritative, and practical guide to modern Signal Integrity (SI) test and measurement for high-speed digital designs. Three of the field’s leading experts guide you through systematically detecting, observing, analyzing, and rectifying both modern logic signal defects and embedded system malfunctions. The authors cover the entire life cycle of embedded system design from specification and simulation onward, illuminating key techniques and concepts with easy-to-understand illustrations. Writing for all electrical engineers, signal integrity engineers, and chip designers, the authors show how to use real-time test and measurement to address today’s increasingly difficult interoperability and compliance requirements. They also present detailed, start-to-finish case studies that walk you through commonly encountered design challenges, including ensuring that interfaces consistently operate with positive timing margins without incurring excessive cost; calculating total jitter budgets; and managing complex tradeoffs in high-speed serial interface design. Coverage includes Understanding the complex signal integrity issues that arise in today’s high-speed designs Learning how eye diagrams, automated compliance tests, and signal analysis measurements can help you identify and solve SI problems Reviewing the electrical characteristics of today’s most widely used CMOS IO circuits Performing signal path analyses based on intuitive Time-Domain Reflectometry (TDR) techniques Achieving more accurate real-time signal measurements and avoiding probe problems and artifacts Utilizing digital oscilloscopes and logic analyzers to make accurate measurements in high-frequency environments Simulating real-world signals that stress digital circuits and expose SI faults Accurately measuring jitter and other RF parameters in wireless applications About the Authors: Dr. Geoff Lawday is Tektronix Professor in Measurement at Buckinghamshire New University, England. He delivers courses in signal integrity engineering and high performance bus systems at the University Tektronix laboratory, and presents signal integrity seminars throughout Europe on behalf of Tektronix. David Ireland, European and Asian design and manufacturing marketing manager for Tektronix, has more than 30 years of experience in test and measurement. He writes regularly on signal integrity for leading technical journals. Greg Edlund, Senior Engineer, IBM Global Engineering Solutions division, has participated in development and testing for ten high-performance computing platforms. He authored Timing Analysis and Simulation for Signal Integrity Engineers (Prentice Hall).

Test System Design

Test System Design PDF Author: Christine Tursky
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 344

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Book Description
Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractional-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.

Guide to NIST

Guide to NIST PDF Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Science and state
Languages : en
Pages : 178

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Book Description


Guide to NIST (National Institute of Standards and Technology)

Guide to NIST (National Institute of Standards and Technology) PDF Author: DIANE Publishing Company
Publisher: DIANE Publishing
ISBN: 9780788146237
Category :
Languages : en
Pages : 168

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Book Description
Gathers in one place descriptions of NIST's many programs, products, services, and research projects, along with contact names, phone numbers, and e-mail and World Wide Web addresses for further information. It is divided into chapters covering each of NIST's major operating units. In addition, each chapter on laboratory programs includes subheadings for NIST organizational division or subject areas. Covers: electronics and electrical engineering; manufacturing engineering; chemical science and technology; physics; materials science and engineering; building and fire research and information technology.

Publications of the National Institute of Standards and Technology ... Catalog

Publications of the National Institute of Standards and Technology ... Catalog PDF Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 424

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Book Description


Evaluation Engineering

Evaluation Engineering PDF Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 680

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Book Description


Accelerating Test, Validation and Debug of High Speed Serial Interfaces

Accelerating Test, Validation and Debug of High Speed Serial Interfaces PDF Author: Fan Yongquan
Publisher: Springer
ISBN: 9789048193974
Category : Technology & Engineering
Languages : en
Pages : 100

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Book Description
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces. Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.