Author: 楊舜凱
Publisher:
ISBN:
Category :
Languages : en
Pages : 104
Book Description
AlGaN/GaN Metal-Oxide-Semiconductor High Electron Mobility Transistors with Atomic Layer Deposited HfAlO Gate Dielectric and Nitrogen Plasma Treatment
Author: 楊舜凱
Publisher:
ISBN:
Category :
Languages : en
Pages : 104
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 104
Book Description
AlGaN/GaN Metal-Oxide-Semiconductor High Electron Mobility Transistors Using Liquid-phase Deposited High-k Gate Dielectrics
Author: 吳祖儀
Publisher:
ISBN:
Category :
Languages : en
Pages : 91
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 91
Book Description
Properties of AlGaN/GaN High Electron Mobility Transistors with Atomic Layer Deposited Gate Dielectric Using Structural Engineering
Author: 吳展誥
Publisher:
ISBN:
Category :
Languages : en
Pages : 128
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 128
Book Description
AlGaN/GaN Metal-Oxide-Semiconductor High Electron Mobility Transistors Performance with Al2O3/ZrO2 Stacked Gate Dielectric Layers
Author: 黃晟瑜
Publisher:
ISBN:
Category :
Languages : en
Pages : 84
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 84
Book Description
Investigation and Fabrication of AlGaN/GaN Metal-oxide-semiconductor High-electron Mobility Transistors with Surface Treatment and the I-ZnO Gate Dielectric Layer
Author: 邱雅蘭
Publisher:
ISBN:
Category :
Languages : en
Pages : 109
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 109
Book Description
Enhancement-Mode AlGaN/GaN Metal-Oxide-Semiconductor High Electron Mobility Transistors by Fluorine Plasma Treatment
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 93
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 93
Book Description
High-performance Enhancement-mode AlGaN/GaN MOS-HEMTs with Fluorinated Stack Gate Dielectrics and Thin Barrier Layer*Project Supported by the National Natural Science Foundation of China (Nos. 61504125, 61474101, 61106130 61076120, 61505181), and the Natural Science Foundation of Jiangsu Province of China (Nos. BK20131072, BE2012007, BK2012516).
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Abstract: We present high-performance enhancement-mode AlGaN/GaN metal—oxide—semiconductor high-electron mobility transistors (MOS-HEMTs) by a fluorinated gate dielectric technique. A nanolaminate of an Al2 O3 /La x Al1− x O3 /Al2 O3 stack ( x ≈0.33) grown by atomic layer deposition is employed to avoid fluorine ions implantation into the scaled barrier layer. Fabricated enhancement-mode MOS-HEMTs exhibit an excellent performance as compared to those with the conventional dielectric-last technique, delivering a large maximum drain current of 916 mA/mm and simultaneously a high peak transconductance of 342 mS/mm. The balanced DC characteristics indicate that advanced gate stack dielectrics combined with buffered fluorine ions implantation have a great potential for high speed GaN E/D-mode integrated circuit applications.
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Abstract: We present high-performance enhancement-mode AlGaN/GaN metal—oxide—semiconductor high-electron mobility transistors (MOS-HEMTs) by a fluorinated gate dielectric technique. A nanolaminate of an Al2 O3 /La x Al1− x O3 /Al2 O3 stack ( x ≈0.33) grown by atomic layer deposition is employed to avoid fluorine ions implantation into the scaled barrier layer. Fabricated enhancement-mode MOS-HEMTs exhibit an excellent performance as compared to those with the conventional dielectric-last technique, delivering a large maximum drain current of 916 mA/mm and simultaneously a high peak transconductance of 342 mS/mm. The balanced DC characteristics indicate that advanced gate stack dielectrics combined with buffered fluorine ions implantation have a great potential for high speed GaN E/D-mode integrated circuit applications.
Enhancement-Mode AlGaN/GaN Metal-Oxide-Semiconductor High Electron Mobility Transistors with Liquid Phase Deposited Zirconium Oxide
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 76
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 76
Book Description
Enhancement Mode AlGaN/GaN Metal-Oxide-Semiconductor High Electron Mobility Transistors Using Self-Aligned Gate-Recessed Process
Author: 徐健軒
Publisher:
ISBN:
Category :
Languages : en
Pages : 70
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 70
Book Description
Development of High-performance GaN-based Power Transistors
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description