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Author: Ernst Ruska
Publisher:
ISBN:
Category : Electromagnetic lenses
Languages : en
Pages : 162
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Book Description
Author: Ernst Ruska
Publisher:
ISBN:
Category : Electromagnetic lenses
Languages : en
Pages : 162
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Book Description
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 1483284654
Category : Science
Languages : en
Pages : 654
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Book Description
The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0323989209
Category : Technology & Engineering
Languages : en
Pages : 546
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Book Description
The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917–1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in Advances in Imaging and Electron Physics series
Author: GÜNTER
Publisher: Birkhäuser
ISBN: 3034872038
Category : Science
Languages : en
Pages : 210
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Book Description
I. Instrumentation.- The Instrumental Contribution of Switzerland to the Development of Electron Microscopy; A Historical Review.- The Swiss STEM Project.- II. The Pioneers.- The Beginning of Electron Microscopy in Zürich.- Chemical Electron Microscopy in Berne.- Early Times of Electron Microscopy in Geneva (1944-1964).- The 'Bernese Connection' of Early Pioneers in Biological Electron Microscopy.- III. Materials Science.- Electron Microscopy at the Batteile Laboratories in Geneva.- IV. Biology and Medicine.- The Contribution of Switzerland to the Development of Embedding Methods in Cytology.-
Author: Ladislaus Marton
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 72
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Book Description
Author:
Publisher: Academic Press
ISBN: 0080577628
Category : Science
Languages : en
Pages : 919
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Book Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0323915086
Category : Technology & Engineering
Languages : en
Pages : 452
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Book Description
The Beginnings of Electron Microscopy - Part 1, Volume 220 in the Advances in Imaging and Electron Physics series highlights new advances in the field, with this new volume presenting interesting chapters on Electron-optical Research at the AEG Forschungs-Institut 1928-1940, On the History of Scanning Electron Microscopy, of the Electron Microprobe, and of Early Contributions to Transmission Electron Microscopy, Random Recollections of the Early Days, Early History of Electron Microscopy in Czechoslovakia, Personal Reminiscences of Early Days in Electron, Megavolt Electron Microscopy, Cryo-Electron Microscopy and Ultramicrotomy: Reminiscences and Reflections, and much more. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in "Advances in Imaging and Electron Physics" series
Author: William J. Croft
Publisher: World Scientific
ISBN: 9812774904
Category : Science
Languages : en
Pages : 153
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Book Description
This is a brief history of the development of microscopy, from the use of beads and water droplets in ancient Greece, through the simple magnifying glass, to the modern compound microscope. The technology and optical theory are developed in a straightforward manner, and this leads to a description and explanation of the most modern technologies in electron microscopy, and scanning electron microscopy as well as the new scanning probe microscopies. A series of very interesting applications of the various microscopic techniques are described. The most recent pioneering techniques in near field and confocal optical microscope technologies are described and evaluated for their future importance.
Author: Ernst Bauer
Publisher: Springer
ISBN: 1493909355
Category : Technology & Engineering
Languages : en
Pages : 513
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Book Description
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Author: Robert Hooke
Publisher:
ISBN:
Category : Hair
Languages : en
Pages : 394
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Book Description
