Author: William Primak
Publisher: Gordon & Breach Publishing Group
ISBN:
Category : Nature
Languages : en
Pages : 212
Book Description
The Compacted States of Vitreous Silica
Author: William Primak
Publisher: Gordon & Breach Publishing Group
ISBN:
Category : Nature
Languages : en
Pages : 212
Book Description
Publisher: Gordon & Breach Publishing Group
ISBN:
Category : Nature
Languages : en
Pages : 212
Book Description
Technical Books and Monographs
Author: U.S. Atomic Energy Commission
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 158
Book Description
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 158
Book Description
Technical Books & Monographs
Author: United States. Department of Energy
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 144
Book Description
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 144
Book Description
Technical Books & Monographs Sponsored by the U.S. Atomic Energy Commission
Author: U.S. Atomic Energy Commission
Publisher:
ISBN:
Category : Nuclear engineering
Languages : en
Pages : 164
Book Description
Publisher:
ISBN:
Category : Nuclear engineering
Languages : en
Pages : 164
Book Description
Technical Books & Monographs
Author: United States. Energy Research and Development Administration
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 144
Book Description
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 144
Book Description
Technical Books and Monographs Sponsored by the U.S. Atomic Energy Commission
Author: U.S. Atomic Energy Commission
Publisher:
ISBN:
Category : Nuclear engineering
Languages : en
Pages : 654
Book Description
Publisher:
ISBN:
Category : Nuclear engineering
Languages : en
Pages : 654
Book Description
Structure, Dynamics, and Properties of Silicate Melts
Author: Jonathan F. Stebbins
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 1501509381
Category : Science
Languages : en
Pages : 632
Book Description
Volume 32 of Reviews in Mineralogy introduces the basic concepts of melt physics and relaxation theory as applied to silicate melts, then to describe the current state of experimental and computer simulation techniques for exploring the detailed atomic structure and dynamic processes which occur at high temperature, and finally to consider the relationships between melt structure, thermodynamic properties and rheology within these liquids. These fundamental relations serve to bridge the extrapolation from often highly simplified melt compositions studied in the laboratory to the multicomponent systems found in nature. This volume focuses on the properties of simple model silicate systems, which are usually volatile-free. The behavior of natural magmas has been summarized in a previous Short Course volume (Nicholls and Russell, editors, 1990: Reviews in Mineralogy, Vol. 24), and the effect of volatiles on magmatic properties in yet another (Carroll and Holloway, editors, 1994: Vol. 30). The Mineralogical Society of America sponsored a short course for which this was the text at Stanford University December 9 and 10, 1995, preceding the Fall Meeting of the American Geophysical Union and MSA in San Fransisco, with about 100 professionals and graduate students in attendance.
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 1501509381
Category : Science
Languages : en
Pages : 632
Book Description
Volume 32 of Reviews in Mineralogy introduces the basic concepts of melt physics and relaxation theory as applied to silicate melts, then to describe the current state of experimental and computer simulation techniques for exploring the detailed atomic structure and dynamic processes which occur at high temperature, and finally to consider the relationships between melt structure, thermodynamic properties and rheology within these liquids. These fundamental relations serve to bridge the extrapolation from often highly simplified melt compositions studied in the laboratory to the multicomponent systems found in nature. This volume focuses on the properties of simple model silicate systems, which are usually volatile-free. The behavior of natural magmas has been summarized in a previous Short Course volume (Nicholls and Russell, editors, 1990: Reviews in Mineralogy, Vol. 24), and the effect of volatiles on magmatic properties in yet another (Carroll and Holloway, editors, 1994: Vol. 30). The Mineralogical Society of America sponsored a short course for which this was the text at Stanford University December 9 and 10, 1995, preceding the Fall Meeting of the American Geophysical Union and MSA in San Fransisco, with about 100 professionals and graduate students in attendance.
The Physics of SiO2 and Its Interfaces
Author: Sokrates T. Pantelides
Publisher: Elsevier
ISBN: 148313900X
Category : Science
Languages : en
Pages : 501
Book Description
The Physics of SiO2 and Its Interfaces covers the proceedings of the International Topical Conference on the Physics of SiO2 and its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York on March 22-24, 1978. The book focuses on the properties, reactions, transformations, and structures of silicon dioxide (SiO2). The selection first discusses the electronic properties of vitreous SiO2 and small polaron formation and motion of holes in a-SiO2. Discussions focus on mobility edges and polarons, deep states in the gap, and excitons. The text also ponders on field-dependent hole and exciton transport in SiO2 and electron emission from SiO2 into vacuum. The publication takes a look at the electronic structures of crystalline and amorphous SiO2; band structures and electronic properties of SiO2; and optical absorption spectrum of SiO2. The text also tackles chemical bond and related properties of SiO2; topological effects on the band structure of silica; and properties of localized SiO2 clusters in layers of disordered silicon on silver. The selection is a good reference for physicists and readers interested in the physics of silicon dioxide.
Publisher: Elsevier
ISBN: 148313900X
Category : Science
Languages : en
Pages : 501
Book Description
The Physics of SiO2 and Its Interfaces covers the proceedings of the International Topical Conference on the Physics of SiO2 and its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York on March 22-24, 1978. The book focuses on the properties, reactions, transformations, and structures of silicon dioxide (SiO2). The selection first discusses the electronic properties of vitreous SiO2 and small polaron formation and motion of holes in a-SiO2. Discussions focus on mobility edges and polarons, deep states in the gap, and excitons. The text also ponders on field-dependent hole and exciton transport in SiO2 and electron emission from SiO2 into vacuum. The publication takes a look at the electronic structures of crystalline and amorphous SiO2; band structures and electronic properties of SiO2; and optical absorption spectrum of SiO2. The text also tackles chemical bond and related properties of SiO2; topological effects on the band structure of silica; and properties of localized SiO2 clusters in layers of disordered silicon on silver. The selection is a good reference for physicists and readers interested in the physics of silicon dioxide.
Defects in SiO2 and Related Dielectrics: Science and Technology
Author: Gianfranco Pacchioni
Publisher: Springer Science & Business Media
ISBN: 9401009449
Category : Technology & Engineering
Languages : en
Pages : 619
Book Description
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
Publisher: Springer Science & Business Media
ISBN: 9401009449
Category : Technology & Engineering
Languages : en
Pages : 619
Book Description
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1508
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1508
Book Description