Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 562
Book Description
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 562
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 562
Book Description
Government Reports Announcements & Index
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1736
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1736
Book Description
Government Reports Annual Index
Author:
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 1220
Book Description
Sections 1-2. Keyword Index.--Section 3. Personal author index.--Section 4. Corporate author index.-- Section 5. Contract/grant number index, NTIS order/report number index 1-E.--Section 6. NTIS order/report number index F-Z.
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 1220
Book Description
Sections 1-2. Keyword Index.--Section 3. Personal author index.--Section 4. Corporate author index.-- Section 5. Contract/grant number index, NTIS order/report number index 1-E.--Section 6. NTIS order/report number index F-Z.
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Author: Patrick Echlin
Publisher: Springer Science & Business Media
ISBN: 0387857311
Category : Technology & Engineering
Languages : en
Pages : 329
Book Description
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Publisher: Springer Science & Business Media
ISBN: 0387857311
Category : Technology & Engineering
Languages : en
Pages : 329
Book Description
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Routledge French Technical Dictionary Dictionnaire technique anglais
Author: Yves Arden
Publisher: Routledge
ISBN: 1134831633
Category : Reference
Languages : en
Pages : 866
Book Description
The French-English volume of this highly acclaimed set consists of some 100,000 keywords in both French and English, drawn from the whole range of modern applied science and technical terminology. Covers over 70 subject areas, from engineering and chemistry to packaging, transportation, data processing and much more.
Publisher: Routledge
ISBN: 1134831633
Category : Reference
Languages : en
Pages : 866
Book Description
The French-English volume of this highly acclaimed set consists of some 100,000 keywords in both French and English, drawn from the whole range of modern applied science and technical terminology. Covers over 70 subject areas, from engineering and chemistry to packaging, transportation, data processing and much more.
Winter Waterfront : Year-round Use in Metropolitan Toronto
Author: Xenia Klinger
Publisher:
ISBN: 9780662191384
Category : City planning
Languages : en
Pages : 79
Book Description
Publisher:
ISBN: 9780662191384
Category : City planning
Languages : en
Pages : 79
Book Description
INIS Atomindex
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1394
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1394
Book Description
Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM)
Author: Debbie Stokes
Publisher: John Wiley & Sons
ISBN: 0470065400
Category : Science
Languages : en
Pages : 247
Book Description
Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk
Publisher: John Wiley & Sons
ISBN: 0470065400
Category : Science
Languages : en
Pages : 247
Book Description
Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk
The Canadian Journal of Cardiology
Author:
Publisher:
ISBN:
Category : Cardiology
Languages : en
Pages : 566
Book Description
Publisher:
ISBN:
Category : Cardiology
Languages : en
Pages : 566
Book Description
Bulletin de Minéralogie
Author:
Publisher:
ISBN:
Category : Crystallography
Languages : fr
Pages : 658
Book Description
Publisher:
ISBN:
Category : Crystallography
Languages : fr
Pages : 658
Book Description