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Author: British Standards Institute Staff
Publisher:
ISBN: 9780580613180
Category :
Languages : en
Pages :
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Book Description
Nanotechnology, Nanomaterials, Nanoparticles, Particle size distribution, Particle size measurement, Surface chemistry, Chemical analysis and testing, Instrumental methods of analysis, Spectroscopy, Microscopic analysis, Test equipment
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580613180
Category :
Languages : en
Pages :
Get Book Here
Book Description
Nanotechnology, Nanomaterials, Nanoparticles, Particle size distribution, Particle size measurement, Surface chemistry, Chemical analysis and testing, Instrumental methods of analysis, Spectroscopy, Microscopic analysis, Test equipment
Author: Ichiko Misumi
Publisher:
ISBN: 9780750331906
Category :
Languages : en
Pages :
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Book Description
Author: Ichiko Misumi
Publisher:
ISBN: 9780750331913
Category : Nanotechnology
Languages : en
Pages : 0
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Book Description
The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications.
Author: Samir Mekid
Publisher: John Wiley & Sons
ISBN: 1119721717
Category : Technology & Engineering
Languages : en
Pages : 404
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Book Description
Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances, while a chapter on digital measurements connects metrology to newer, Industry 4.0 applications.
Author: A. Di Giuseppe
Publisher: IOS Press
ISBN: 1614993262
Category : Science
Languages : en
Pages : 567
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Book Description
The reliability and accuracy of systems of measurement continue to advance. We are about to enter a period of the most stable measurement system we can imagine with the anticipated new definitions of the SI units of measurement; a direct link between fundamental physics and metrology which will eliminate the current definition of the kilogram, until now based upon an artifact. This book presents selected papers from Course 185 of the Enrico Fermi International School of Physics, held in Varenna, Italy, in July 2012 and jointly organized with the Bureau International des Poids et Mesures (BIPM). The papers delivered at the school covered some of the most advanced topics in the discipline of metrology, including nano-technologies; quantum information and quantum devices; biology and medicine; food; surface quality; ionising radiation for health, environment, art and archaeology; and climate. The continuous and striking advances in basic research concerning atomic frequency standards operating both in the visible range and at microwave levels and the applications to satellite systems are also considered, in the framework of a historical review of the international organization of metrology, as are the problems inherent in uncertainty statements and definitions. This book will be of interest to all those whose work involves scientific measurement at the highest levels of accuracy.
Author: Gerald Gerlach
Publisher: Springer Science & Business Media
ISBN: 3642285228
Category : Technology & Engineering
Languages : en
Pages : 619
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Book Description
This book discusses future trends and developments in electron device packaging and the opportunities of nano and bio techniques as future solutions. It describes the effect of nano-sized particles and cell-based approaches for packaging solutions with their diverse requirements. It offers a comprehensive overview of nano particles and nano composites and their application as packaging functions in electron devices. The importance and challenges of three-dimensional design and computer modeling in nano packaging is discussed; also ways for implementation are described. Solutions for unconventional packaging solutions for metallizations and functionalized surfaces as well as new packaging technologies with high potential for industrial applications are discussed. The book brings together a comprehensive overview of nano scale components and systems comprising electronic, mechanical and optical structures and serves as important reference for industrial and academic researchers.
Author: Günter Wilkening
Publisher: Wiley-VCH
ISBN:
Category : Science
Languages : en
Pages : 552
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Book Description
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author: Vladimir Murashov
Publisher: Springer Science & Business Media
ISBN: 1441978534
Category : Technology & Engineering
Languages : en
Pages : 269
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Book Description
Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK
Author: Alan S. Morris
Publisher: Academic Press
ISBN: 0128171421
Category : Technology & Engineering
Languages : en
Pages : 737
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Book Description
Measurement and Instrumentation: Theory and Application, Third Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. Providing the most balanced coverage of measurement theory/technologies and instrumentation, this clearly and comprehensively written text arms students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application. - Provides early coverage of measurement system design to facilitate a better framework for understanding the importance of studying measurement and instrumentation - Covers the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays and interfaces - Includes significant material on data acquisition and signal processing with LabVIEW - New sections in this updated edition include an expansion of sections on MEMS and electrical safety, new illustrations, including more photos of real devices, and more worked examples and end-of-chapter problems
Author: John G. Webster
Publisher: CRC Press
ISBN: 1439863261
Category : Medical
Languages : en
Pages : 1639
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Book Description
This new edition of the bestselling Measurement, Instrumentation, and Sensors Handbook brings together all aspects of the design and implementation of measurement, instrumentation, and sensors. Reflecting the current state of the art, it describes the use of instruments and techniques for performing practical measurements in engineering, physics, chemistry, and the life sciences; explains sensors and the associated hardware and software; and discusses processing systems, automatic data acquisition, reduction and analysis, operation characteristics, accuracy, errors, calibrations, and the incorporation of standards for control purposes. Organized according to measurement problem, the Second Edition: Consists of 2 volumes Features contributions from 240+ field experts Contains 53 new chapters, plus updates to all 194 existing chapters Addresses different ways of making measurements for given variables Emphasizes modern intelligent instruments and techniques, human factors, modern display methods, instrument networks, and virtual instruments Explains modern wireless techniques, sensors, measurements, and applications A concise and useful reference for engineers, scientists, academic faculty, students, designers, managers, and industry professionals involved in instrumentation and measurement research and development, Measurement, Instrumentation, and Sensors Handbook, Second Edition provides readers with a greater understanding of advanced applications.
