Standards, Methods and Solutions of Metrology PDF Download
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Author: Luigi Cocco
Publisher: BoD – Books on Demand
ISBN: 1789844622
Category : Technology & Engineering
Languages : en
Pages : 108
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Book Description
The goal of acceptable quality, cost, and time is a decisive challenge in every engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control a project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies.
Author: Luigi Cocco
Publisher: BoD – Books on Demand
ISBN: 1789844622
Category : Technology & Engineering
Languages : en
Pages : 108
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Book Description
The goal of acceptable quality, cost, and time is a decisive challenge in every engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control a project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies.
Author: Luigi Cocco
Publisher:
ISBN: 9781839622564
Category :
Languages : en
Pages : 106
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Book Description
The goal of acceptable quality, cost, and time is a decisive challenge in every engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control a project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies.
Author: Raghavendra,
Publisher: OUP India
ISBN: 9780198085492
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Author: Semyon G. Rabinovich
Publisher: Springer Science & Business Media
ISBN: 1441914560
Category : Technology & Engineering
Languages : en
Pages : 278
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Book Description
"Evaluating Measurement Accuracy" is intended for anyone who is concerned with measurements in any field of science or technology. It reflects the latest developments in metrology and offers new results, but is designed to be accessible to readers at different levels: meteorologists, engineers and experimental scientists who use measurements as tools in their professions, graduate and undergraduate students in the natural sciences and engineering, and technicians performing complex measurements in industry, quality control, and trade. The material of the book is presented from the practical perspective and offers solutions and recommendations for problems that arise in conducting real-life measurements. This inclusion is a notable and unique aspect of this title as complex measurements done in industry and trade are often neglected in metrological literature, leaving the practitioners of these measurements to devise their own ad-hoc techniques.
Author: Franco Pavese
Publisher: Springer Science & Business Media
ISBN: 0817648046
Category : Mathematics
Languages : en
Pages : 499
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Book Description
This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.
Author: French College of Metrology
Publisher: John Wiley & Sons
ISBN: 1118614941
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
Metrology is an integral part of the structure of today’s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data. Moreover, international trade practices increasingly require institutions to display demonstrated conformity to written standards and specifications. As such, having relevant and reliable results of measurements and tests in compliance with mutually recognised standards can be a technical, commercial and statutory necessity for a company. This book, the results of a working group from the French College of Metrology and featuring chapters written by a range of experts from a variety of European countries, gives a comprehensive and international treatment of the subject. Academics involved in metrology as well as people involved in the metrology capacities of companies and institutions will find this book of great interest.
Author: Ernst O. Göbel
Publisher: John Wiley & Sons
ISBN: 3527412654
Category : Science
Languages : en
Pages : 243
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Book Description
The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.
Author: Semyon G Rabinovich
Publisher: Springer Science & Business Media
ISBN: 1461467179
Category : Technology & Engineering
Languages : en
Pages : 324
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Book Description
“Evaluating Measurement Accuracy, 2nd Edition” is intended for those who are concerned with measurements in any field of science or technology. It reflects the latest developments in metrology and offers new results, but is designed to be accessible to readers at different levels: scientists who advance the field of metrology, engineers and experimental scientists who use measurements as tool in their professions, students and graduate students in natural sciences and engineering, and, in parts describing practical recommendations, technicians performing mass measurements in industry, quality control, and trade. This book presents material from the practical perspective and offers solutions and recommendations for problems that arise in conducting real-life measurements. This new edition adds a method for estimating accuracy of indirect measurements with independent arguments, whose development Dr. Rabinovich was able to complete very recently. This method, which is called the Method of Enumeration, produces estimates that are no longer approximate, similar to the way the method of reduction described in the first edition removed approximation in estimating uncertainty of indirect measurements with dependent arguments. The method of enumeration completes addressing the range of problems whose solutions signify the emergence of the new theory of accuracy of measurements. A new method is added for building a composition of histograms, and this method forms a theoretical basis for the method of enumeration.Additionally, as a companion to this book, a concise practical guide that assembles simple step-by-step procedures for typical tasks the practitioners are likely to encounter in measurement accuracy estimation is available at SpringerLink.
Author: Günter Wilkening
Publisher: John Wiley & Sons
ISBN: 9783527405022
Category : Technology & Engineering
Languages : en
Pages : 554
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Book Description
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author: K. B. Jaeger
Publisher:
ISBN:
Category : Mass (Physics)
Languages : en
Pages : 96
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Book Description
