Author: Michael Nicolaidis
Publisher:
ISBN:
Category :
Languages : en
Pages : 205
Book Description
Special Issue on the 16th IEEE VLSI Test Symposium (VTS 98)
Author: Michael Nicolaidis
Publisher:
ISBN:
Category :
Languages : en
Pages : 205
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 205
Book Description
Special Issue on 16th IEEE VLSI Test Symposium (VTS 98)
Author: VLSI Test Symposium
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Special Issue on the 16th IEEE VLSI Test Symposium (VTS 98)
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 205
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 205
Book Description
VLSI Test Symposium (VTS, `98), 16th IEEE.
Author: IEEE, Society Staff
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Proceedings
Author: VLSI Test Symposium
Publisher: I E E E
ISBN: 9780818684364
Category : Computers
Languages : en
Pages : 472
Book Description
This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.
Publisher: I E E E
ISBN: 9780818684364
Category : Computers
Languages : en
Pages : 472
Book Description
This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.
19th IEEE VLSI Test Symposium
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
16th IEEE VLSI Test Symposium
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 528
Book Description
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 528
Book Description
Special Issue on the 1998 Symposium on VLSI Circuits
Author: William Bidermann
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 160
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 160
Book Description
Les Coustumes générales de toute la conté d'Artois
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
IEEE VLSI Test Symposium
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Book Description
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Book Description