Special Issue on Reliability Performance, Analysis, and Evaluation of Programmable Electronic Systems, with Emphasis on Chemical Process Applications PDF Download
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Author: H. M. Paula
Publisher:
ISBN:
Category :
Languages : en
Pages : 84
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Book Description
Author: H. M. Paula
Publisher:
ISBN:
Category :
Languages : en
Pages : 84
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Book Description
Author: H.M. Paula
Publisher:
ISBN:
Category :
Languages : en
Pages : 81
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Book Description
Author: Lance Fiondella
Publisher: Springer
ISBN: 3319305999
Category : Technology & Engineering
Languages : en
Pages : 659
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Book Description
This book presents the latest key research into the performance and reliability aspects of dependable fault-tolerant systems and features commentary on the fields studied by Prof. Kishor S. Trivedi during his distinguished career. Analyzing system evaluation as a fundamental tenet in the design of modern systems, this book uses performance and dependability as common measures and covers novel ideas, methods, algorithms, techniques, and tools for the in-depth study of the performance and reliability aspects of dependable fault-tolerant systems. It identifies the current challenges that designers and practitioners must face in order to ensure the reliability, availability, and performance of systems, with special focus on their dynamic behaviors and dependencies, and provides system researchers, performance analysts, and practitioners with the tools to address these challenges in their work. With contributions from Prof. Trivedi's former PhD students and collaborators, many of whom are internationally recognized experts, to honor him on the occasion of his 70th birthday, this book serves as a valuable resource for all engineering disciplines, including electrical, computer, civil, mechanical, and industrial engineering as well as production and manufacturing.
Author:
Publisher: Elsevier
ISBN: 1782422250
Category : Technology & Engineering
Languages : en
Pages : 274
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Book Description
This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation
Author: B.K. Daniels
Publisher: Springer Science & Business Media
ISBN: 9400934610
Category : Technology & Engineering
Languages : en
Pages : 306
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Book Description
The safe operation of computer systems, in both their software and hardware continues to be a key issue in many real time applications, when people, environment, investment or goodwill can be at risk. Such applications include the monitoring and control of high energy processes, of nuclear and chemical plants, of factory automation, of transportation systems, or funds transfer and of communication and information systems. This book represents the proceedings of the 1987 Safety and Reliability Society Symposium held in Altrincham, UK, 11-12 November 1987. It is thus part of the series of proceedings for Society Events, which in previous years have not addressed the topic of the Safety and Reliability of Computer Systems. The book is also part of another series of reports, and is closely related to the Elsevier Book "Safety and Reliability of Programmable Electronic Systems" which I edited in 1986, and the series of workshops known as SAFECOMP held in 1979, 1982, 1983, 1985, 1986 which are referenced in some of the papers. The structure of the book represents the structure of the Symposium itself. The session titles, and the papers as selected represent the current practice in many industries. The trend is towards more industrial usage of Formal Methods, and tools to support these methods, whilst continuing to make best use of Software Engineering, Safety and Reliability Assessment, and accumulated experience.
Author: Marius Bazu
Publisher: John Wiley & Sons
ISBN: 1119990009
Category : Technology & Engineering
Languages : en
Pages : 372
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Book Description
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
Author: Lacombe
Publisher: CRC Press
ISBN: 9780824799588
Category : Technology & Engineering
Languages : en
Pages : 352
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Book Description
Demonstrates how electronic products manufacturers can improve the effectiveness and longevity of their finished products, building in reliability at the design state and more efficiently monitoring and controlling it throughout practice. The text addresses management personnel in small- and medium-sized electronics manufacturing concerns.
Author: Kirk A. Gray
Publisher: John Wiley & Sons
ISBN: 1118700201
Category : Technology & Engineering
Languages : en
Pages : 296
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Book Description
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly mis-application of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by illustrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight to the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: * Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. * Challenges existing failure prediction methodologies by highlighting their limitations using real field data. * Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. * Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. * Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. * Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 113
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Book Description
Author: J. E. Arsenault
Publisher: Computer Science Press, Incorporated
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 618
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Book Description
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
