Some Studies in Atom-probe Time-of-flight Mass Spectrometry PDF Download
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Author: R. J. Lewis
Publisher:
ISBN:
Category : Atom-probe field ion microscopy
Languages : en
Pages : 0
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Book Description
Author: R. J. Lewis
Publisher:
ISBN:
Category : Atom-probe field ion microscopy
Languages : en
Pages : 0
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Book Description
Author: Williams Lefebvre
Publisher: Academic Press
ISBN: 0128047453
Category : Science
Languages : en
Pages : 418
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Book Description
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Author: Michael K. Miller
Publisher: Springer Science & Business Media
ISBN: 1461542812
Category : Technology & Engineering
Languages : en
Pages : 247
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Book Description
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Author: Roland Scheer
Publisher: John Wiley & Sons
ISBN: 3527633723
Category : Technology & Engineering
Languages : en
Pages : 398
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Book Description
This first comprehensive description of the most important material properties and device aspects closes the gap between general books on solar cells and journal articles on chalcogenide-based photovoltaics. Written by two very renowned authors with years of practical experience in the field, the book covers II-VI and I-III-VI2 materials as well as energy conversion at heterojunctions. It also discusses the latest semiconductor heterojunction models and presents modern analysis concepts. Thin film technology is explained with an emphasis on current and future techniques for mass production, and the book closes with a compendium of failure analysis in photovoltaic thin film modules. With its overview of the semiconductor physics and technology needed, this practical book is ideal for students, researchers, and manufacturers, as well as for the growing number of engineers and researchers working in companies and institutes on chalcogenide photovoltaics.
Author: D. Price
Publisher: Elsevier
ISBN: 1483151190
Category : Science
Languages : en
Pages : 313
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Book Description
Time-of-Flight Mass Spectrometry contains the proceedings of the First European Symposium on Time-of-flight Mass Spectrometry held at the University of Salford in the UK on July 3-5, 1967. The papers focus on time-of-flight mass spectrometry and its chemical applications, from flash photolysis and pyrolysis reactions to shock wave reactions and high-temperature studies of inorganic solids. This book is comprised of nine chapters and opens with an introduction to the MA-1 and other time-of-flight mass spectrometers, followed by their applications to studies of chemical reactions such as flash photolysis and pyrolysis reactions, reactions involving shock waves, and high-temperature studies of inorganic solids. Subsequent chapters explore fast recording techniques for time-resolved mass spectrometry; detection of the NH2 free radical and other ammoniacal complexes in the electrical discharge decomposition of ammonia gas; and reactions of ions with molecules in the gas phase and the sputtering of solid surfaces by ion bombardment. The use of a time-of-flight mass spectrometer in experimental investigations of negative ions is also described. This monograph will be a valuable resource for users of a time-of-flight mass spectrometer and allow non-users to become acquainted with its applications and advantages.
Author: E.W. Schlag
Publisher: Newnes
ISBN: 0444596186
Category : Science
Languages : en
Pages : 424
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Book Description
The resurgence of time-of-flight mass spectrometry (TOF-MS) has had its origin in the simplicity of construction and application of such instruments together with the high transmission and the great increase in resolution that has been achieved. The instrument lends itself naturally to a coupling with pulsed laser sources, though this is not a prerequisite. It also affords a time resolution far beyond that traditionally achieved with mass spectrometric rapid scan techniques - a recent example being the real-time analysis of a multi-component mixture from an automobile exhaust. Furthermore, the mass range appears to be extremely large: mass up to 500 kDa and beyond what is being readily measured in the laboratory today. The present set of contributions attempts to give a survey of current applications from many of the active groups in the field. A variety of new applications are considered which are no doubt just the beginning of large new areas of application. By presenting this work in book form it is hoped that it will be of help to the many groups intending to initiate work in this rapidly expanding new area of mass spectrometry.
Author: Baptiste Gault
Publisher: Springer Science & Business Media
ISBN: 146143436X
Category : Technology & Engineering
Languages : en
Pages : 411
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Book Description
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Author: Robert A. Walter
Publisher:
ISBN:
Category : Mass spectrometry
Languages : en
Pages : 28
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Book Description
Author: Sheldon Datz
Publisher: Academic Press
ISBN: 1483218694
Category : Science
Languages : en
Pages : 647
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Book Description
Applied Atomic Collision Physics, Volume 4: Condensed Matter deals with the fundamental knowledge of collision processes in condensed media. The book focuses on the range of applications of atomic collisions in condensed matter, extending from effects on biological systems to the characterization and modification of solids. This volume begins with the description of some aspects of the physics involved in the production of ion beams. The radiation effects in biological and chemical systems, ion scattering and atomic diffraction, x-ray fluorescence analysis, and photoelectron and Auger spectroscopy are discussed in detail. The final two chapters in the text cover two areas of ion beam materials modification: ion implantation in semiconductors and microfabrication. This text is a good reference material for physics graduate students, experimental and theoretical physicists, and chemists.
Author: T. Marshall
Publisher:
ISBN:
Category :
Languages : en
Pages : 10
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Book Description
The results obtained from bringing up to operation of a Bendix Special Model 111-S/N 6002 Time-of-Flight Mass Spectrometer are summarized. (Author).
