Author: Timothy Learmonth
Publisher:
ISBN: 9780549433453
Category :
Languages : en
Pages : 266
Book Description
Abstract: The electronic properties of quasi-low dimensional correlated transition metal compounds were investigated using x-ray absorption spectroscopy (XAS), x-ray emission spectroscopy (XES), and resonant inelastic x-ray scattering (RIXS). XAS and XES can be used to probe the element specific partial density of electronic states, and XAS and RIXS to probe the band structure and low energy electronic excitations. These spectroscopies are photon based, rather than electron based, which allows for charge neutral measurements. Photon spectroscopies, and RIXS in particular, show promise as complementary spectroscopies to the more common angle-resolved photoemission as probes of correlated materials, and offer a means to investigate previously inaccessible insulators. A selection of quasi-low dimensional correlated systems have been studied for the first time using this combination of spectroscopic techniques. MoO 3 is a quasi-two dimensional insulator in which the effects of reduced dimensionality has not been well explored. X-ray spectroscopy was used to measure the band structure, and revealed the predicted quasi-two dimensionality in the electronic structure. When an alkali metal is incorporated, MoO 3 can be altered into a range of quasi-low dimensional materials, one of which being the prototypical quasi-one dimensional conductor K 0.3 MoO 3 . Spectroscopic results from K 0.3 MoO 3 are compared to calculated predictions of the electronic structure and results from MoO 3 . Strong similarities are observed, despite their vastly different bulk properties. From another large class of strongly correlated quasi-low dimensional materials, Li 2 CuO 2 is a quasi-one dimensional insulator with crystallographic building blocks in common with high transition temperature superconductors. Polarization dependent RIXS measurements of Li 2 CuO 2 show the presence of a novel two-hole electronic excitation which is interpreted in light of the Cu-Cu magnetic coupling. Lastly, BaVS 3 is a quasi-one dimensional correlated metal with a metal-to-insulator transition (MIT) that involves many competing interactions. RIXS as a function of sample temperature of Ti substituted BaTi 0.02 V 0.98 S 3 was measured, and evidence of a localizing electronic transition with similar temperature dependence as the MIT in BaVS 3 was detected. This is evidence that the Ti sites do not mix electronically with the V sites strongly enough to upset the balance of competing interactions that lead to the MIT in BaVS 3.
Soft X-ray Spectroscopic Studies of Quasi-low Dimensional and Strongly Correlated Materials
Author: Timothy Learmonth
Publisher:
ISBN: 9780549433453
Category :
Languages : en
Pages : 266
Book Description
Abstract: The electronic properties of quasi-low dimensional correlated transition metal compounds were investigated using x-ray absorption spectroscopy (XAS), x-ray emission spectroscopy (XES), and resonant inelastic x-ray scattering (RIXS). XAS and XES can be used to probe the element specific partial density of electronic states, and XAS and RIXS to probe the band structure and low energy electronic excitations. These spectroscopies are photon based, rather than electron based, which allows for charge neutral measurements. Photon spectroscopies, and RIXS in particular, show promise as complementary spectroscopies to the more common angle-resolved photoemission as probes of correlated materials, and offer a means to investigate previously inaccessible insulators. A selection of quasi-low dimensional correlated systems have been studied for the first time using this combination of spectroscopic techniques. MoO 3 is a quasi-two dimensional insulator in which the effects of reduced dimensionality has not been well explored. X-ray spectroscopy was used to measure the band structure, and revealed the predicted quasi-two dimensionality in the electronic structure. When an alkali metal is incorporated, MoO 3 can be altered into a range of quasi-low dimensional materials, one of which being the prototypical quasi-one dimensional conductor K 0.3 MoO 3 . Spectroscopic results from K 0.3 MoO 3 are compared to calculated predictions of the electronic structure and results from MoO 3 . Strong similarities are observed, despite their vastly different bulk properties. From another large class of strongly correlated quasi-low dimensional materials, Li 2 CuO 2 is a quasi-one dimensional insulator with crystallographic building blocks in common with high transition temperature superconductors. Polarization dependent RIXS measurements of Li 2 CuO 2 show the presence of a novel two-hole electronic excitation which is interpreted in light of the Cu-Cu magnetic coupling. Lastly, BaVS 3 is a quasi-one dimensional correlated metal with a metal-to-insulator transition (MIT) that involves many competing interactions. RIXS as a function of sample temperature of Ti substituted BaTi 0.02 V 0.98 S 3 was measured, and evidence of a localizing electronic transition with similar temperature dependence as the MIT in BaVS 3 was detected. This is evidence that the Ti sites do not mix electronically with the V sites strongly enough to upset the balance of competing interactions that lead to the MIT in BaVS 3.
Publisher:
ISBN: 9780549433453
Category :
Languages : en
Pages : 266
Book Description
Abstract: The electronic properties of quasi-low dimensional correlated transition metal compounds were investigated using x-ray absorption spectroscopy (XAS), x-ray emission spectroscopy (XES), and resonant inelastic x-ray scattering (RIXS). XAS and XES can be used to probe the element specific partial density of electronic states, and XAS and RIXS to probe the band structure and low energy electronic excitations. These spectroscopies are photon based, rather than electron based, which allows for charge neutral measurements. Photon spectroscopies, and RIXS in particular, show promise as complementary spectroscopies to the more common angle-resolved photoemission as probes of correlated materials, and offer a means to investigate previously inaccessible insulators. A selection of quasi-low dimensional correlated systems have been studied for the first time using this combination of spectroscopic techniques. MoO 3 is a quasi-two dimensional insulator in which the effects of reduced dimensionality has not been well explored. X-ray spectroscopy was used to measure the band structure, and revealed the predicted quasi-two dimensionality in the electronic structure. When an alkali metal is incorporated, MoO 3 can be altered into a range of quasi-low dimensional materials, one of which being the prototypical quasi-one dimensional conductor K 0.3 MoO 3 . Spectroscopic results from K 0.3 MoO 3 are compared to calculated predictions of the electronic structure and results from MoO 3 . Strong similarities are observed, despite their vastly different bulk properties. From another large class of strongly correlated quasi-low dimensional materials, Li 2 CuO 2 is a quasi-one dimensional insulator with crystallographic building blocks in common with high transition temperature superconductors. Polarization dependent RIXS measurements of Li 2 CuO 2 show the presence of a novel two-hole electronic excitation which is interpreted in light of the Cu-Cu magnetic coupling. Lastly, BaVS 3 is a quasi-one dimensional correlated metal with a metal-to-insulator transition (MIT) that involves many competing interactions. RIXS as a function of sample temperature of Ti substituted BaTi 0.02 V 0.98 S 3 was measured, and evidence of a localizing electronic transition with similar temperature dependence as the MIT in BaVS 3 was detected. This is evidence that the Ti sites do not mix electronically with the V sites strongly enough to upset the balance of competing interactions that lead to the MIT in BaVS 3.
Dissertation Abstracts International
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 1006
Book Description
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 1006
Book Description
Resonant Soft X-ray Spectroscopic Studies of C60 and Related Materials
Author: Tanel Käämbre
Publisher:
ISBN: 9789155452223
Category : Science
Languages : en
Pages : 52
Book Description
Publisher:
ISBN: 9789155452223
Category : Science
Languages : en
Pages : 52
Book Description
X-Ray Scattering from Soft-Matter Thin Films
Author: Metin Tolan
Publisher: Springer
ISBN: 9783662142172
Category : Technology & Engineering
Languages : en
Pages : 198
Book Description
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
Publisher: Springer
ISBN: 9783662142172
Category : Technology & Engineering
Languages : en
Pages : 198
Book Description
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 556
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 556
Book Description
Introduction to Spectroscopic Ellipsometry of Thin Film Materials
Author: Andrew T. S. Wee
Publisher: John Wiley & Sons
ISBN: 3527833951
Category : Technology & Engineering
Languages : en
Pages : 213
Book Description
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.
Publisher: John Wiley & Sons
ISBN: 3527833951
Category : Technology & Engineering
Languages : en
Pages : 213
Book Description
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.
Chemical Abstracts
Author:
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 2540
Book Description
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 2540
Book Description
Directory of Graduate Research
Author: American Chemical Society. Committee on Professional Training
Publisher:
ISBN:
Category : Biochemistry
Languages : en
Pages : 1932
Book Description
Faculties, publications and doctoral theses in departments or divisions of chemistry, chemical engineering, biochemistry and pharmaceutical and/or medicinal chemistry at universities in the United States and Canada.
Publisher:
ISBN:
Category : Biochemistry
Languages : en
Pages : 1932
Book Description
Faculties, publications and doctoral theses in departments or divisions of chemistry, chemical engineering, biochemistry and pharmaceutical and/or medicinal chemistry at universities in the United States and Canada.
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 2194
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 2194
Book Description
Chemical Imaging Analysis
Author: Freddy Adams
Publisher: Elsevier
ISBN: 0444634509
Category : Science
Languages : en
Pages : 493
Book Description
Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed – or adapted from existing techniques – and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques. - Provides comprehensive coverage of analytical techniques used in chemical imaging analysis - Explores a variety of specialized techniques - Provides a general overview of imaging techniques in diverse fields
Publisher: Elsevier
ISBN: 0444634509
Category : Science
Languages : en
Pages : 493
Book Description
Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed – or adapted from existing techniques – and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques. - Provides comprehensive coverage of analytical techniques used in chemical imaging analysis - Explores a variety of specialized techniques - Provides a general overview of imaging techniques in diverse fields