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Author: Kylie Peppler
Publisher: MIT Press
ISBN: 0262320053
Category : Education
Languages : en
Pages : 407
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Book Description
Introducing students to the world of wearable technology. Soft Circuits introduces students to the world of wearable technology. Using Modkit, an accessible DIY electronics toolkit, students learn to create e-textile cuffs, “electrici-tee” shirts, and solar-powered backpacks. Students also learn the importance of one component to the whole—how, for example, changing the structure of LED connections immediately affects the number of LEDs that light up.
Author: Kylie Peppler
Publisher: MIT Press
ISBN: 0262320053
Category : Education
Languages : en
Pages : 407
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Book Description
Introducing students to the world of wearable technology. Soft Circuits introduces students to the world of wearable technology. Using Modkit, an accessible DIY electronics toolkit, students learn to create e-textile cuffs, “electrici-tee” shirts, and solar-powered backpacks. Students also learn the importance of one component to the whole—how, for example, changing the structure of LED connections immediately affects the number of LEDs that light up.
Author: Jean-Luc Autran
Publisher: CRC Press
ISBN: 146659084X
Category : Technology & Engineering
Languages : en
Pages : 432
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Book Description
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
Author: Behnam Ghavami
Publisher: Springer Nature
ISBN: 3030516105
Category : Technology & Engineering
Languages : en
Pages : 119
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Book Description
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Author: Sibel Deren Guler
Publisher: Apress
ISBN: 1484218086
Category : Computers
Languages : en
Pages : 229
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Book Description
Enter the exciting intersection of technology and fashion known as wearable computing. Learn about the future of electronics in clothing and textiles, and be a part of creating that future! Crafting Wearables begins with the history of the field, then covers current practices and future trends. You will gain deeper insight into the strategy behind the design of wearable devices while learning about the tools and materials needed to start your own wearables toolbox. In a time when consumer electronics are becoming smaller and seamlessly integrated into our lives, it is important to understand how technology can improve and augment your lifestyle. Wearables are in a sense the most organic and natural interface we can design, yet there is still doubt about how quickly wearable technologies will become the cultural norm. Furthermore, skills that have become less valuable over the years, such as sewing, are making a return with the wearables movement. Gives a better understanding of wearable technology and how it has evolved Teaches basic skills and techniques to familiarize you with the tools and materials Showcases breakthrough designs and discoveries that impact our everyday interactions What You'll Learn Learn the history of how technology in fashion has evolved over time Discover interesting materials and fabrics for use in wearable technology Glimpse new tools for designing wearable technology and fashion Rediscover sewing and related skills that every wearables enthusiast should learn Learn how new techniques in textile manufacturing could disrupt the fashion industry Understand and respond to the cultural and societal developments around wearables Who This Book Is For The curious designer, engineer, or creative who is looking for insight into the world of fashion technology. It is for someone who wants to start exploring wearables with basic projects and dig deeper into the methods and tools of an expert. Crafting Wearables is intended to impart comprehensive general knowledge of the state of wearables in different industries while providing a well-curated list of example projects and resources by which to begin your personal journey into e-textiles. It is a wonderful read for those who are looking to expand their understanding of fashion and technology from both a hands-on and research-based perspective.
Author: USA Patent Office
Publisher:
ISBN:
Category :
Languages : en
Pages : 2318
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Book Description
Author: Rajesh Garg
Publisher: Springer
ISBN: 9781441909329
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Author: Michael Nicolaidis
Publisher: Springer Science & Business Media
ISBN: 1441969934
Category : Technology & Engineering
Languages : en
Pages : 331
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Book Description
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 736
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Book Description
Author: Canada. Patent Office
Publisher:
ISBN:
Category : Copyright
Languages : en
Pages : 1550
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Book Description
Author:
Publisher:
ISBN:
Category : Copyright
Languages : en
Pages : 1550
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Book Description
