Series on Emission Scenario Documents Complementing Guideline for Writing ESDs: The Life-Cycle Step "service-life" PDF Download
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Author: OECD
Publisher: OECD Publishing
ISBN: 9264500650
Category :
Languages : en
Pages : 40
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Book Description
This document is a complement to the Guidance Document on Emission Scenario Documents (ESDs) and aims to help writers of ESDs to identify whether emissions during service-life may be of importance and therefore need to be included. It will also give an orientation on key aspects connected to such releases that need to be considered in an exposure assessment.
Author: OECD
Publisher: OECD Publishing
ISBN: 9264500650
Category :
Languages : en
Pages : 40
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Book Description
This document is a complement to the Guidance Document on Emission Scenario Documents (ESDs) and aims to help writers of ESDs to identify whether emissions during service-life may be of importance and therefore need to be included. It will also give an orientation on key aspects connected to such releases that need to be considered in an exposure assessment.
Author: Organisation for Economic Co-operation and Development
Publisher: Organisation for Economic Co-operation and Development ; [Montréal : Renouf]
ISBN: 9789264122215
Category : Chemical industry
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category : Chemicals
Languages : en
Pages : 32
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Book Description
Author: U.S. Nuclear Regulatory Commission
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 140
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Book Description
Author: Peter Suber
Publisher: MIT Press
ISBN: 0262517639
Category : Language Arts & Disciplines
Languages : en
Pages : 255
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Book Description
A concise introduction to the basics of open access, describing what it is (and isn't) and showing that it is easy, fast, inexpensive, legal, and beneficial. The Internet lets us share perfect copies of our work with a worldwide audience at virtually no cost. We take advantage of this revolutionary opportunity when we make our work “open access”: digital, online, free of charge, and free of most copyright and licensing restrictions. Open access is made possible by the Internet and copyright-holder consent, and many authors, musicians, filmmakers, and other creators who depend on royalties are understandably unwilling to give their consent. But for 350 years, scholars have written peer-reviewed journal articles for impact, not for money, and are free to consent to open access without losing revenue. In this concise introduction, Peter Suber tells us what open access is and isn't, how it benefits authors and readers of research, how we pay for it, how it avoids copyright problems, how it has moved from the periphery to the mainstream, and what its future may hold. Distilling a decade of Suber's influential writing and thinking about open access, this is the indispensable book on the subject for researchers, librarians, administrators, funders, publishers, and policy makers.
Author: Gerd Wolfram
Publisher: Springer Science & Business Media
ISBN: 3540710191
Category : Technology & Engineering
Languages : en
Pages : 219
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Book Description
RFID is a key technology for Europe. Today there is a noticeable shift away from the days of RFID pilot projects, and towards a time where organisations are looking to RFID to drive efficiency and innovation. Although Europe is a leading player in the world of RFID technology, several challenges which are preventing RFID from reaching its full potential need to be addressed. To further the advancement of this technology, coordinated European efforts need to be promoted, specifically in the areas of standardisation, user guidelines, legislation, technology development, and research and development. These themes have been analysed, and clear recommendations have been derived, stating what the different RFID stakeholders can do to support the technology. This book is aimed at decision makers in all fields of society, e.g. in companies, politics, business associations, etc. The publication is a summary of the results of the coordination action CE RFID - "Coordinating European Efforts in the RFID Value Chain" - and is a network of European RFID technology providers, vendors and end users. It aims at promoting the use of RFID technology and supporting further development. The project was funded by the European Commission under the 6th Framework Programme.
Author: Steven H. Voldman
Publisher: John Wiley & Sons
ISBN: 1118703332
Category : Technology & Engineering
Languages : en
Pages : 368
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Book Description
Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.
Author: Jakob Vlietstra
Publisher: Springer Science & Business Media
ISBN: 1447102630
Category : Computers
Languages : en
Pages : 703
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Book Description
This Dictionary covers information and communication technology (ICT), including hardware and software; information networks, including the Internet and the World Wide Web; automatic control; and ICT-related computer-aided fields. The Dictionary also lists abbreviated names of relevant organizations, conferences, symposia and workshops. This reference is important for all practitioners and users in the areas mentioned above, and those who consult or write technical material. This Second Edition contains 10,000 new entries, for a total of 33,000.
Author: International Assessment of Agricultural Knowledge, Science, and Technology for Development (Project)
Publisher: Iaastd
ISBN:
Category : Business & Economics
Languages : en
Pages : 612
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Book Description
"In addition to assessing existing conditions and knowledge, the IAASTD uses a simple set of model projections to look at the future, based on knowledge from past events and existing trends such as population growth, rural/urban food and poverty dynamics, loss of agricultural land, water availability, and climate change effects. This set of volumes comprises the findings of the IAASTD. It consists of a Global Report, a brief Synthesis Report, and 5 subglobal reports. Taken as a whole, the IAASTD reports are an indispensable reference for anyone working in the field of agriculture and rural development, whether at the level of basic research, policy, or practice."--BOOK JACKET.
Author: Phil Wakelin
Publisher: IBM Redbooks
ISBN: 0738437441
Category : Computers
Languages : en
Pages : 266
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Book Description
IBM® CICS® Transaction Server (CICS TS) has been available in various guises for over 40 years, and continues to be one of the most widely used pieces of commercial software. This IBM Redbooks® publication helps application architects discover the value of CICS Transaction Server to their business. This book can help architects understand the value and capabilities of CICS Transaction Server and the CICS tools portfolio. The book also provides detailed guidance on the leading practices for designing and integrating CICS applications within an enterprise, and the patterns and techniques you can use to create CICS systems that provide the qualities of service that your business requires.
