Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704
Book Description
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704
Book Description
Sci-tech Book Profiles
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 856
Book Description
Includes title page, table of contents, list of contributors, preface and all indexes of each book.
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 856
Book Description
Includes title page, table of contents, list of contributors, preface and all indexes of each book.
Papers
Author:
Publisher:
ISBN:
Category : Guided missiles
Languages : en
Pages : 504
Book Description
Publisher:
ISBN:
Category : Guided missiles
Languages : en
Pages : 504
Book Description
NASA SP-7500
Author: United States. National Aeronautics and Space Administration
Publisher:
ISBN:
Category :
Languages : en
Pages : 752
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 752
Book Description
1966 Aerospace Systems Conference
Author:
Publisher:
ISBN:
Category : Astrionics
Languages : en
Pages : 844
Book Description
Publisher:
ISBN:
Category : Astrionics
Languages : en
Pages : 844
Book Description
Astronautics, 1960-1966
Author: United States Air Force Academy. Library
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 54
Book Description
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 54
Book Description
Failure Data Handbook for Nuclear Power Facilities: Failure data and applications technology
Author:
Publisher:
ISBN:
Category : Liquid metal cooled reactors
Languages : en
Pages : 856
Book Description
Publisher:
ISBN:
Category : Liquid metal cooled reactors
Languages : en
Pages : 856
Book Description
A Summary of Research 1995
Author: United States. Naval Postgraduate School, Monterey, CA.
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 588
Book Description
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 588
Book Description
Preindications of Failure in Electronic Components
Author: J. W. Klapheke
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 68
Book Description
This report discusses state-of-the-art information and techniques concerned with indications of potential degradation and catastrophic failure in electronic components. The objective of this survey is to present a comprehensive description of past, present, and future planned work on preindicators of failure for certain electronic components. This study is intended to provide basic information for future development in automatic checkout equipment. The following electronic parts were covered in the survey: semiconductors (transistors, diodes, and microcircuits), resistors, capacitors, inductors, computer cores, other items used in a computer, and vacuum tubes. Such items as wire, insulation, lamps, relays, and rotary devices were not considered. Precursors of failure have been investigated for electronic components but few have been identified at the present time. Most of these investigations were undertaken as part of programs directed at physics of failure, screening, or accelerated testing. The results of this study show that predictors of failure for semiconductors (transistors, diodes, and microcircuits) have received more attention than other types of parts. Current noise (l/f noise) and infrared emission profiles show promise as precursors that would apply to all types of semiconductors. Apparently computer cores and inductors are the least considered. (Author).
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 68
Book Description
This report discusses state-of-the-art information and techniques concerned with indications of potential degradation and catastrophic failure in electronic components. The objective of this survey is to present a comprehensive description of past, present, and future planned work on preindicators of failure for certain electronic components. This study is intended to provide basic information for future development in automatic checkout equipment. The following electronic parts were covered in the survey: semiconductors (transistors, diodes, and microcircuits), resistors, capacitors, inductors, computer cores, other items used in a computer, and vacuum tubes. Such items as wire, insulation, lamps, relays, and rotary devices were not considered. Precursors of failure have been investigated for electronic components but few have been identified at the present time. Most of these investigations were undertaken as part of programs directed at physics of failure, screening, or accelerated testing. The results of this study show that predictors of failure for semiconductors (transistors, diodes, and microcircuits) have received more attention than other types of parts. Current noise (l/f noise) and infrared emission profiles show promise as precursors that would apply to all types of semiconductors. Apparently computer cores and inductors are the least considered. (Author).
British Communications & Electronics
Author:
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 656
Book Description
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 656
Book Description